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المؤلفون: E. Grigoriev, H. Seppa, J. Salmi, E. Borchi, Marko Mikuz, Salvatore Buontempo, Kevin M. Smith, M. Zavrtanik, P. Sonderegger, T. O. Niinikoski, Soumen Paul, I. Ropotar, G. Ruggiero, S. Chapuy, K. Borer, K. Pretzl, L. Casagrande, J H Koivuniemi, Z. Dimcovski, W. De Boer, S. Heising, Martti Valtonen, Nicola D'Ambrosio, Sergio Pagano, Erik H.M. Heijne, P. Berglund, W. H. Bell, C. Da Via, A. Esposito, Mara Bruzzi, S. Pirollo, V.G. Palmieri, I. Konotov, I. Suni, Vladimir Cindro, V. Granat, S. Janos, B. Dezillie, Carlos Lourenco, Zheng Li
المصدر: 1998 IEEE Nuclear Science Symposium Conference Record. 1998 IEEE Nuclear Science Symposium and Medical Imaging Conference (Cat. No.98CH36255).
مصطلحات موضوعية: Materials science, Silicon, business.industry, Annealing (metallurgy), Analytical chemistry, chemistry.chemical_element, Cryogenics, chemistry, Electrical resistivity and conductivity, Optoelectronics, Neutron, Irradiation, business, Ohmic contact, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8006bc0213d088875c79fca52cfd3862
https://doi.org/10.1109/nssmic.1998.775148