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1
المؤلفون: Th. Jung, M. Rüetschi, Peter Reimann, H.-J. Güntherodt, Dario Anselmetti, H. R. Hidber, H. Haefke, H. Rudin, Udo D. Schwarz, Ernst Meyer, R. Lüthi, Hans Peter Lang, I. Parashikov, Jane Frommer, M Dreier, T. Richmond, A. Moser, Urs Staufer, Hans J. Hug, G. Gerth, U. Dammer, J. Funfschilling, R. Sum, L. Howald
المصدر: Scanning. 15:257-264
مصطلحات موضوعية: Scanning probe microscopy, Scanning Hall probe microscope, Materials science, Microscopy, Scanning ion-conductance microscopy, Scanning confocal electron microscopy, Nanotechnology, Scanning gate microscopy, Scanning capacitance microscopy, Instrumentation, Atomic and Molecular Physics, and Optics, Vibrational analysis with scanning probe microscopy
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3f440e4a97ebb71de19cf8fb2dfa4de1
https://doi.org/10.1002/sca.4950150504 -
2
المؤلفون: A. Moser, R. C. O’Handley, B. Stiefel, Gabriel Bochi, Hans J. Hug, H.-J. Güntherodt, I. Parashikov, D. I. Paul
المصدر: Physical review letters. 75(9)
مصطلحات موضوعية: Length scale, Materials science, Nuclear magnetic resonance, Magnetic domain, Condensed matter physics, Domain (ring theory), General Physics and Astronomy, Order (ring theory), Magnetic resonance force microscopy, Magnetic force microscope, Thin film, Epitaxy
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3
المؤلفون: B. Stiefel, A. Moser, Alexis Baratoff, H.-J. Güntherodt, Hans J. Hug, Harry Thomas, Oliver Fritz, Praveen Chaudhari, I. Parashikov
المصدر: Scopus-Elsevier
مصطلحات موضوعية: Kelvin probe force microscope, Materials science, Condensed matter physics, General Physics and Astronomy, Atomic force acoustic microscopy, Magnetic resonance force microscopy, Conductive atomic force microscopy, Magnetic force microscope, Non-contact atomic force microscopy, Photoconductive atomic force microscopy, Vortex
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4
المؤلفون: I. Parashikov, A. Moser, Oliver Fritz, Hans J. Hug, B. Stiefel
المصدر: Forces in Scanning Probe Methods ISBN: 9789401040273
مصطلحات موضوعية: Scanning probe microscopy, Materials science, business.industry, Polymer characterization, Resolution (electron density), Scanning ion-conductance microscopy, Scanning confocal electron microscopy, Optoelectronics, Scanning capacitance microscopy, Conductive atomic force microscopy, Magnetic force microscope, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::18bb7f3254068e258497927e7b263845
https://doi.org/10.1007/978-94-011-0049-6_3 -
5
المؤلفون: Hans J. Hug, I. Parashikov, Harry Thomas, Oliver Fritz, B. Stiefel, Andreas Moser, H.-J. Güntherodt
المصدر: Scopus-Elsevier
مصطلحات موضوعية: Scanning Hall probe microscope, Materials science, Condensed matter physics, business.industry, Demagnetizing field, Nucleation, Energy Engineering and Power Technology, Condensed Matter Physics, Epitaxy, Electronic, Optical and Magnetic Materials, Vortex, Condensed Matter::Materials Science, Optics, Condensed Matter::Superconductivity, Electrical and Electronic Engineering, Magnetic force microscope, Thin film, business
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6
المؤلفون: Gabriel Bochi, Hans J. Hug, D. Lipp, R. C. O’Handley, Andreas Moser, B. Stiefel, I. Parashikov, H.-J. Güntherodt, A. Klicznik, D. I. Paul
المصدر: Journal of Applied Physics. 79:5609
مصطلحات موضوعية: Length scale, Condensed Matter::Materials Science, Magnetization, Magnetic anisotropy, Materials science, Condensed matter physics, Magnetic domain, General Physics and Astronomy, Thin film, Magnetic force microscope, Epitaxy, Anisotropy
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7
المؤلفون: Hans J. Hug, H.-J. Güntherodt, H. R. Hidber, D. Weller, I. Parashikov, A. Tonin, Andreas Moser
المصدر: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 12:1591
مصطلحات موضوعية: Kelvin probe force microscope, Cantilever, Materials science, business.industry, Resolution (electron density), General Engineering, Atomic force acoustic microscopy, Conductive atomic force microscopy, Nuclear magnetic resonance, Optics, Microscopy, Magnetic force microscope, business, Non-contact atomic force microscopy
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::41ac700136f47677ec9afd21829f40d0
https://doi.org/10.1116/1.587293 -
8
المؤلفون: A. Wadas, I. Parashikov, H.-J. Güntherodt, Oliver Fritz, Th. Jung, Andreas Moser, Hans J. Hug
المصدر: ResearcherID
مصطلحات موضوعية: Kelvin probe force microscope, Materials science, business.industry, Electrostatic force microscope, Atomic force acoustic microscopy, Conductive atomic force microscopy, Magnetic field, Condensed Matter::Materials Science, Optics, Microscopy, Magnetic force microscope, business, Instrumentation, Non-contact atomic force microscopy
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e1565172a6faa834a98d13ba15960627
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:A1993MC13700030&KeyUID=WOS:A1993MC13700030 -
9
المؤلفون: I. Parashikov, H.-J. Gu¨ntherodt, Oliver Fritz, Hans J. Hug, Andreas Moser, Th. Wolf
المصدر: Scopus-Elsevier
مصطلحات موضوعية: Kelvin probe force microscope, Superconductivity, Physics, Scanning Hall probe microscope, Condensed matter physics, Magnetic resonance force microscopy, Conductive atomic force microscopy, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Paramagnetism, Condensed Matter::Superconductivity, Electrical and Electronic Engineering, Magnetic force microscope, Non-contact atomic force microscopy
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::76336341104a1c14bdb7516a299371cd
http://www.scopus.com/inward/record.url?eid=2-s2.0-18344412032&partnerID=MN8TOARS -
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