المؤلفون: Stutz, Andreas, Maurmaier, Mathias, Schneller, Martin, Romberg, Thomas, Krause, Markus, Stubbe, Felix

المصدر: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA) Emerging Technologies and Factory Automation (ETFA), 2022 IEEE 27th International Conference on. :1-8 Sep, 2022

Relation: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)

المؤلفون: Teryak, H., Albaseer, A., Abdallah, M., Al-Kuwari, S., Qaraqe, M.

المصدر: IEEE Open Journal of the Industrial Electronics Society IEEE Open J. Ind. Electron. Soc. Industrial Electronics Society, IEEE Open Journal of the. 4:629-642 2023

المؤلفون: Tofani, Kemas M., Permana, P. A., Harsono, B. B. S. D. A, Jintaka, Dhandis R, Mangunnkusumo, K. G. H

المصدر: 2020 2nd International Conference on Industrial Electrical and Electronics (ICIEE) Industrial Electrical and Electronics (ICIEE), 2020 2nd International Conference on. :57-61 Oct, 2020

Relation: 2020 2nd International Conference on Industrial Electrical and Electronics (ICIEE)

المؤلفون: Hadir Teryak, Abdullatif Albaseer, Mohamed Abdallah, Saif Al-Kuwari, Marwa Qaraqe

المصدر: IEEE Open Journal of the Industrial Electronics Society, Vol 4, Pp 629-642 (2023)

مصطلحات موضوعية: Adversarial attacks, deep learning, IEC 60870-5-104 protocol, intrusion detection systems (IDS), machine learning (ML), smart grids (SGs), Electronics, TK7800-8360, Industrial engineering. Management engineering, T55.4-60.8

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10328057/; https://doaj.org/toc/2644-1284

URL الوصول: https://doaj.org/article/0e68e616b0eb44b6842d7239a4a18f95

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