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المؤلفون: M. J. H. van Dal, Alexeij Y. Kovalgin, Christa Vrancken, Robertus A.M. Wolters, N. Stavitski, Anne Lauwers
المصدر: IEEE Transactions on Electron Devices, 55(DTR08-9/5):10.1109/TED.2008.918658, 1170-1176. IEEE
مصطلحات موضوعية: transmission line model (TLM), platinum silicide (PtSi), Materials science, Silicon, Semiconductor device modeling, chemistry.chemical_element, chemistry.chemical_compound, Platinum silicide, Transmission line, Silicide, EWI-13045, Electronic engineering, Electrical and Electronic Engineering, IR-64868, METIS-251068, business.industry, Contact resistance, SC-ICF: Integrated Circuit Fabrication, Nickel silicide (NiSi), Specific contact resistance, Electronic, Optical and Magnetic Materials, silic7ide, Semiconductor, chemistry, CMOS, Optoelectronics, business
وصف الملف: application/octet-stream; application/pdf