يعرض 1 - 10 نتائج من 3,129 نتيجة بحث عن '"Ideality"', وقت الاستعلام: 0.92s تنقيح النتائج
  1. 1
    دورية أكاديمية
    Modeling Cycle-to-Cycle Variation in Memristors for In-Situ Unsupervised Trace-STDP Learning

    المؤلفون: Xu, J., Zheng, Y., Li, F., Stathis, D., Shen, R., Chu, H., Lansner, A., Zheng, L., Zou, Z., Hemani, A.

    المصدر: IEEE Transactions on Circuits and Systems II: Express Briefs IEEE Trans. Circuits Syst. II Circuits and Systems II: Express Briefs, IEEE Transactions on. 71(2):627-631 Feb, 2024

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  2. 2
    مؤتمر
    Robust Method for Estimating Single-Diode Model Parameters of a PV Module from the Manufacturer's Datasheet Information

    المؤلفون: Rajapakse, Athula, Ranasinghe, Githmi, Jayasinghe, Rohitha, Kotalawala, Lalin, Muthumini, Dharshana

    المصدر: 2023 International Conference on Sustainable Technology and Engineering (i-COSTE) Sustainable Technology and Engineering (i-COSTE), 2023 International Conference on. :1-6 Dec, 2023

    Relation: 2023 International Conference on Sustainable Technology and Engineering (i-COSTE)

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  3. 3
    دورية أكاديمية
    Electrically Tunable Ideality Factor and Series Resistance of Gate-Controlled Graphene/Pentacene Schottky Junctions

    المؤلفون: Lee, T.Y., Kim, Y., Ahn, S., Jeon, D.

    المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 12:379-383 2024

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  4. 4
    مؤتمر
    Swordfish: A Framework for Evaluating Deep Neural Network-based Basecalling using Computation-In-Memory with Non-Ideal Memristors

    المؤلفون: Shahroodi, Taha, Singh, Gagandeep, Zahedi, Mahdi, Mao, Haiyu, Lindegger, Joel, Firtina, Can, Wong, Stephan, Mutlu, Onur, Hamdioui, Said

    المصدر: 2023 56th IEEE/ACM International Symposium on Microarchitecture (MICRO) Microarchitecture (MICRO), 2023 56th IEEE/ACM International Symposium on. :1437-1452 Oct, 2023

    Relation: 2023 56th IEEE/ACM International Symposium on Microarchitecture (MICRO)

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  5. 5
    مؤتمر
    Mitigating Non-ideality Issues of Analog Computing-In-Memory in DNN-based designs

    المؤلفون: Huang, Chi-Tse, Wu, An-Yeu Andy

    المصدر: 2023 IEEE 15th International Conference on ASIC (ASICON) ASIC (ASICON), 2023 IEEE 15th International Conference on. :1-4 Oct, 2023

    Relation: 2023 IEEE 15th International Conference on ASIC (ASICON)

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  6. 6
    مؤتمر
    BWA-NIMC: Budget-based Workload Allocation for Hybrid Near/In-Memory-Computing

    المؤلفون: Huang, Chi-Tse, Chang, Cheng-Yang, Chuang, Yu-Chuan, Wu, An-Yeu Andy

    المصدر: 2023 60th ACM/IEEE Design Automation Conference (DAC) Design Automation Conference (DAC), 2023 60th ACM/IEEE. :1-6 Jul, 2023

    Relation: 2023 60th ACM/IEEE Design Automation Conference (DAC)

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  7. 7
    دورية أكاديمية
    Damage Separation in Proton-Irradiated Bipolar Junction Transistors as a Function of Energy

    المؤلفون: Witczak, S.C., Schrimpf, R.D., Fleetwood, D.M., Messenger, S.R., Langlois, M.S., McCurdy, M.W., Rodriguez, J.A.

    المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 70(8):1900-1907 Aug, 2023

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  8. 8
    دورية أكاديمية
    Graphene/Al2O3/Si Schottky diode with integrated waveguide on a silicon-on-insulator wafer

    المؤلفون: Seven, E.Aff1, Aff2, IDs12648023030627_cor1, Orhan, E.Öz, Di Bartolomeo, A., Ertuğrul, M.Aff1, Aff6, Aff7, Taştekin, N. Avişhan

    المصدر: Indian Journal of Physics. 98(8):2795-2803

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  9. 9
    مؤتمر
    Mitigating the effects of op-amp non-idealities by fractional order notch filter

    المؤلفون: Mohapatra, Arpit Sourav, Ray, Indrani, Biswas, Karabi

    المصدر: 2023 International Conference on Fractional Differentiation and Its Applications (ICFDA) Fractional Differentiation and Its Applications (ICFDA), 2023 International Conference on. :1-5 Mar, 2023

    Relation: 2023 International Conference on Fractional Differentiation and Its Applications (ICFDA)

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  10. 10
    دورية أكاديمية
    Fault-Free: A Framework for Analysis and Mitigation of Stuck-at-Fault on Realistic ReRAM-Based DNN Accelerators

    المؤلفون: Shin, H., Kang, M., Kim, L.

    المصدر: IEEE Transactions on Computers IEEE Trans. Comput. Computers, IEEE Transactions on. 72(7):2011-2024 Jul, 2023

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