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1دورية أكاديمية
المؤلفون: Takeda, AkihiroAff1, IDs11419023006795_cor1, Doi, Takahiro, Asada, Akiko, Yuzawa, Katsuhiro, Nagasawa, Akemichi, Igarashi, Kai, Maeno, Tomokazu, Suzuki, Atsuko, Shimizu, Seiko, Uemura, Nozomi, Nakajima, Jun’ichi, Suzuki, Toshinari, Inomata, Akiko, Tagami, Takaomi
المصدر: Forensic Toxicology. 42(2):142-151
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2دورية أكاديمية
المؤلفون: Takeda, AkihiroAff1, Doi, Takahiro, Asada, Akiko, Suzuki, Toshinari, Yuzawa, Katsuhiro, Ando, Hiroshi, Kubo, Yoshikazu, Nagasawa, Akemichi, Kaihoko, Fujifumi, Hasegawa, Yuko, Tanaka, Kazuyoshi, Igarashi, Kai, Maeno, Tomokazu, Suzuki, Atsuko, Shimizu, Seiko, Uemura, Nozomi, Nakajima, Jun’ichi, Suzuki, Jin, Tagami, Takaomi
المصدر: Forensic Toxicology. 38(2):455-464
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3دورية أكاديمية
المؤلفون: Koh, Meishoku, Igarashi, Kai
المصدر: IEEE Transactions on Nuclear Science; Dec96 Part 1 of 2, Vol. 43 Issue 6, p2952, 8p, 2 Diagrams, 6 Graphs
مصطلحات موضوعية: METAL oxide semiconductor field-effect transistors
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4دورية
المؤلفون: Takashi Tanii, Takashi Tanii, Takashi Matsukawa, Takashi Matsukawa, Shigetaka Mori, Shigetaka Mori, Meishoku Koh, Meishoku Koh, Bungo Shigeta, Bungo Shigeta, Kai Igarashi, Kai Igarashi, Iwao Ohdomari, Iwao Ohdomari
المصدر: Japanese Journal of Applied Physics; June 1996, Vol. 35 Issue: 6 pL688-L688, 1p
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