المؤلفون: Jae Heon Kim, Sung Ryul Shim, Seung Whan Doo, Won Jae Yang, Byung Wook Yoo, Joyce Mary Kim, Young Myoung Ko, Eun Seop Song, Ik Sung Lim, Hong Jun Lee, Yun Seob Song

المصدر: PLoS ONE, Vol 10, Iss 3, p e0113491 (2015)

مصطلحات موضوعية: Medicine, Science

وصف الملف: electronic resource

Relation: http://europepmc.org/articles/PMC4363872?pdf=render; https://doaj.org/toc/1932-6203

URL الوصول: https://doaj.org/article/99af11d1ebed4486b2525bf29dba47ae

المؤلفون: Zhu, Zeqin, McAndrew, Colin C., Ik-Sung Lim, Gildenblat, Gennady

المصدر: 2012 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures (ICMTS), 2012 IEEE International Conference on. :196-200 Mar, 2012

Relation: 2012 IEEE International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Shams, S.F., McAndrew, C.C., Ik-Sung Lim, Zlotnicka, A.

المصدر: Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting Bipolar/BiCMOS circuits and technology Bipolar/BiCMOS Circuits and Technology Meeting, 2002. Proceedings of the 2002. :92-95 2002

Relation: 2002 IEEE Bipolar/BICMOS Circuits and Technology Meeting

المؤلفون: Thuy Dao, Ik_Sung Lim, Connell, Larry, Triyoso, Dina H., Park, Youngbog, Mackenzie, Charlie

المصدر: 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial Integrated Circuit Design and Technology and Tutorial, 2008. ICICDT 2008. IEEE International Conference on. :109-112 Jun, 2008

Relation: 2008 IEEE International Conference on IC Design and Technology & Tutorial (ICICDT)

المؤلفون: Shin, H.C., Ik-Sung Lim, Racanelli, M., Wen-Ling Margaret Huang, Foerstner, J., Bor-Yuan Hwang

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 43(2):318-325 Feb, 1996

المؤلفون: Bor-Yuan Hwang, Jenn Tsao, Racanelli, M., Huang, M., Foerstner, J., Wetteroth, T., Ik-Sung Lim

المصدر: Proceedings of 1993 IEEE International SOI Conference SOI conference SOI Conference, 1993. Proceedings., 1993 IEEE International. :128-129 1993

Relation: Proceedings of 1993 IEEE International SOI Conference

المؤلفون: Daehyun Kim, Ik Sung Lim

المصدر: Journal of Applied Reliability. 19:404-412

مصطلحات موضوعية: Filler (packaging), Thermal conductivity, Materials science, Reliability (semiconductor), Sputtering, visual_art, Composite number, visual_art.visual_art_medium, Ceramic, Thermal management of electronic devices and systems, Composite material, Laser flash analysis

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bb54a62199635f546da03f3b9b1dd7e1
https://doi.org/10.33162/jar.2019.12.19.4.404

المؤلفون: Chang Deok Choi, Ik Sung Lim

المصدر: Journal of Applied Reliability. 18:240-249

مصطلحات موضوعية: 0106 biological sciences, Materials science, business.industry, Nuclear engineering, Boiler (power generation), Thermal power station, 02 engineering and technology, Welding, 021001 nanoscience & nanotechnology, 01 natural sciences, law.invention, law, Nondestructive testing, 0210 nano-technology, business, 010606 plant biology & botany

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::241f615f2460202ab195dc693b3666dd
https://doi.org/10.33162/jar.2018.09.18.3.240

المؤلفون: Ik-Sung Lim, Zeqin Zhu, Colin C. McAndrew, Gennady Gildenblat

المصدر: IEEE Transactions on Electron Devices. 59:1236-1244

مصطلحات موضوعية: Computer Science::Hardware Architecture, Computer science, Logic gate, Convergence (routing), MOSFET, Benchmark (computing), NQS, Electronic engineering, Mixed-signal integrated circuit, Transient (oscillation), Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Data modeling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ca4e7860b789277e8ca852fbc095658b
https://doi.org/10.1109/ted.2012.2186636

المؤلفون: Kun-Woo Song, Je-Geon Bang, Sun-Ki Kim, Ik-Sung Lim, Yong-Sik Yang, Dae-Ho Kim

المصدر: Journal of the Korean Ceramic Society. 47:106-112

مصطلحات موضوعية: Materials science, Hydrogen, Diffusion, Kinetics, Metallurgy, technology, industry, and agriculture, Oxide, chemistry.chemical_element, Zr alloy, Atmospheric temperature range, equipment and supplies, Oxygen, chemistry.chemical_compound, chemistry, Ceramics and Composites, Short circuit

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2d73db81c9c273ec06be82e06d5a354a
https://doi.org/10.4191/kcers.2010.47.2.106