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1مؤتمر
المؤلفون: Zhu, Zeqin, McAndrew, Colin C., Ik-Sung Lim, Gildenblat, Gennady
المصدر: 2012 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures (ICMTS), 2012 IEEE International Conference on. :196-200 Mar, 2012
Relation: 2012 IEEE International Conference on Microelectronic Test Structures (ICMTS)
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2مؤتمر
المؤلفون: Shams, S.F., McAndrew, C.C., Ik-Sung Lim, Zlotnicka, A.
المصدر: Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting Bipolar/BiCMOS circuits and technology Bipolar/BiCMOS Circuits and Technology Meeting, 2002. Proceedings of the 2002. :92-95 2002
Relation: 2002 IEEE Bipolar/BICMOS Circuits and Technology Meeting
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3مؤتمر
المؤلفون: Thuy Dao, Ik_Sung Lim, Connell, Larry, Triyoso, Dina H., Park, Youngbog, Mackenzie, Charlie
المصدر: 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial Integrated Circuit Design and Technology and Tutorial, 2008. ICICDT 2008. IEEE International Conference on. :109-112 Jun, 2008
Relation: 2008 IEEE International Conference on IC Design and Technology & Tutorial (ICICDT)
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4دورية أكاديمية
المؤلفون: Shin, H.C., Ik-Sung Lim, Racanelli, M., Wen-Ling Margaret Huang, Foerstner, J., Bor-Yuan Hwang
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 43(2):318-325 Feb, 1996
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5مؤتمر
المؤلفون: Bor-Yuan Hwang, Jenn Tsao, Racanelli, M., Huang, M., Foerstner, J., Wetteroth, T., Ik-Sung Lim
المصدر: Proceedings of 1993 IEEE International SOI Conference SOI conference SOI Conference, 1993. Proceedings., 1993 IEEE International. :128-129 1993
Relation: Proceedings of 1993 IEEE International SOI Conference
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6
المؤلفون: Daehyun Kim, Ik Sung Lim
المصدر: Journal of Applied Reliability. 19:404-412
مصطلحات موضوعية: Filler (packaging), Thermal conductivity, Materials science, Reliability (semiconductor), Sputtering, visual_art, Composite number, visual_art.visual_art_medium, Ceramic, Thermal management of electronic devices and systems, Composite material, Laser flash analysis
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bb54a62199635f546da03f3b9b1dd7e1
https://doi.org/10.33162/jar.2019.12.19.4.404 -
7دورية أكاديمية
المؤلفون: Jae Heon Kim, Sung Ryul Shim, Seung Whan Doo, Won Jae Yang, Byung Wook Yoo, Joyce Mary Kim, Young Myoung Ko, Eun Seop Song, Ik Sung Lim, Hong Jun Lee, Yun Seob Song
المصدر: PLoS ONE, Vol 10, Iss 3, p e0113491 (2015)
وصف الملف: electronic resource
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8
المؤلفون: Chang Deok Choi, Ik Sung Lim
المصدر: Journal of Applied Reliability. 18:240-249
مصطلحات موضوعية: 0106 biological sciences, Materials science, business.industry, Nuclear engineering, Boiler (power generation), Thermal power station, 02 engineering and technology, Welding, 021001 nanoscience & nanotechnology, 01 natural sciences, law.invention, law, Nondestructive testing, 0210 nano-technology, business, 010606 plant biology & botany
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::241f615f2460202ab195dc693b3666dd
https://doi.org/10.33162/jar.2018.09.18.3.240 -
9
المؤلفون: Ik-Sung Lim, Zeqin Zhu, Colin C. McAndrew, Gennady Gildenblat
المصدر: IEEE Transactions on Electron Devices. 59:1236-1244
مصطلحات موضوعية: Computer Science::Hardware Architecture, Computer science, Logic gate, Convergence (routing), MOSFET, Benchmark (computing), NQS, Electronic engineering, Mixed-signal integrated circuit, Transient (oscillation), Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Data modeling
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10
المؤلفون: Kun-Woo Song, Je-Geon Bang, Sun-Ki Kim, Ik-Sung Lim, Yong-Sik Yang, Dae-Ho Kim
المصدر: Journal of the Korean Ceramic Society. 47:106-112
مصطلحات موضوعية: Materials science, Hydrogen, Diffusion, Kinetics, Metallurgy, technology, industry, and agriculture, Oxide, chemistry.chemical_element, Zr alloy, Atmospheric temperature range, equipment and supplies, Oxygen, chemistry.chemical_compound, chemistry, Ceramics and Composites, Short circuit
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2d73db81c9c273ec06be82e06d5a354a
https://doi.org/10.4191/kcers.2010.47.2.106