يعرض 1 - 10 نتائج من 95,645 نتيجة بحث عن '"In A. Sim"', وقت الاستعلام: 1.30s تنقيح النتائج
  1. 1
    دورية أكاديمية
    A 13-Gb/s Single-Ended NRZ Receiver With 1-Sample Per 2-UI Using Data Edge Sampling for Memory Interfaces

    المؤلفون: Kang, H., Choi, Y., Sim, J., Choi, J., Kwon, Y., Park, S., Kim, S., Sim, C., Kim, C.

    المصدر: IEEE Transactions on Circuits and Systems II: Express Briefs IEEE Trans. Circuits Syst. II Circuits and Systems II: Express Briefs, IEEE Transactions on. 71(7):3328-3332 Jul, 2024

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  2. 2
    مؤتمر
    Finite Element Modeling for Wafer-to-Wafer Direct Bonding Behaviors and Alignment Prediction

    المؤلفون: Baek, Kyungmin, Han, Min-soo, Han, Il Young, Shin Lee, Jung, Sim, Jaeuk, Lee, Joongha, Min, Daeho, Lim, Kyeongbin, Rhee, Minwoo Daniel

    المصدر: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2024 IEEE 74th. :1256-1259 May, 2024

    Relation: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC)

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  3. 3
    مؤتمر
    New Double Sided Molded Package Platform Development with Open Cavity Mold on One Side and Exposed Die Mold on the Other Side

    المؤلفون: Choi, MiKyeong, Tsai, Julius, Lee, GyeongCheol, Sim, KiDong

    المصدر: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2024 IEEE 74th. :1265-1270 May, 2024

    Relation: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC)

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  4. 4
    مؤتمر
    A2FL: Autonomous and Adaptive File Layout in HPC through Real-time Access Pattern Analysis

    المؤلفون: Sung, Dong Kyu, Son, Yongseok, Sim, Alex, Wu, Kesheng, Byna, Suren, Tang, Houjun, Eom, Hyeonsang, Kim, Changjong, Kim, Sunggon

    المصدر: 2024 IEEE International Parallel and Distributed Processing Symposium (IPDPS) IPDPS Parallel and Distributed Processing Symposium (IPDPS), 2024 IEEE International. :506-518 May, 2024

    Relation: 2024 IEEE International Parallel and Distributed Processing Symposium (IPDPS)

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  5. 5
    مؤتمر
    Development of a Fault Localization Algorithm Based on SFWR Considering Propagation Velocity Changes with Propagation Distance

    المؤلفون: Seong, Hyun-Mo, Sim, Yeon-Sub, Lee, Chun-Kwon, Kwon, Gu-Young, Chang, Seung Jin

    المصدر: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2024 IEEE International. :1-5 May, 2024

    Relation: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

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  6. 6
    مؤتمر
    Development of a Multiple HFCT-Based Reflectometry System for Live Cable Diagnosis

    المؤلفون: Hong, Chang Hyeon, Sim, Yeon-Sub, Seong, Hyun-Mo, Kwon, Gu-Young, Lee, Chun-Kwon, Chang, Seung Jin

    المصدر: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2024 IEEE International. :1-6 May, 2024

    Relation: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

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  7. 7
    مؤتمر
    Robust Feedback Linearization for Serial Robots

    المؤلفون: Mihaly, Vlad, Susca, Mircea, Birlescu, Iosif, Sim, Simona, Pisla, Doina, Dobra, Petru

    المصدر: 2024 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) Automation, Quality and Testing, Robotics (AQTR), 2024 IEEE International Conference on. :1-6 May, 2024

    Relation: 2024 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR)

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  8. 8
    مؤتمر
    A Novel 3D Gate-All-Around Vertical FeFET with Back-Gate Structure for Disturbance-Less Program Operation

    المؤلفون: Ku, Boncheol, Sim, Jae-Min, Hur, Jae Seok, Jeong, Jae Kyeong, Song, Yun-Heub, Choi, Changhwan

    المصدر: 2024 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2024 IEEE International. :1-4 May, 2024

    Relation: 2024 IEEE International Memory Workshop (IMW)

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  9. 9
    مؤتمر
    Within-Chip Bridged-Pattern Short Detection Using Spatially Distributed Kerf Test Structures in 7nm FinFET Technology

    المؤلفون: Lin, C.Y., Ogino, A., Lee, C.H., Bang, Y.S., Jeong, B.W., Choi, D.U., Wu, S., Xin, Y., Walsh, B., Manya, C., Sim, J., Angyal, M.

    المصدر: 2024 IEEE 33rd Microelectronics Design & Test Symposium (MDTS) Microelectronics Design & Test Symposium (MDTS), 2024 IEEE 33rd. :1-3 May, 2024

    Relation: 2024 IEEE 33rd Microelectronics Design & Test Symposium (MDTS)

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  10. 10
    دورية أكاديمية
    Hierarchical Approach for Detection and Location of Open Conductor Fault in Power Distribution Networks

    المؤلفون: Hong, J., Sim, G., Hyun, S., Yun, S.

    المصدر: IEEE Transactions on Power Delivery IEEE Trans. Power Delivery Power Delivery, IEEE Transactions on. 39(3):1939-1951 Jun, 2024

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