يعرض 1 - 10 نتائج من 299 نتيجة بحث عن '"Irrera, F."', وقت الاستعلام: 0.87s تنقيح النتائج
  1. 1
    مؤتمر
    Large-Scale CMOS-Compatible Process for growing Si-BC8 Nanowires

    المؤلفون: Mazzotta, I., Rigoni, F., Irrera, F., Riello, P., Quaranta, S., Latini, A., Palma, F.

    المصدر: 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) Ultimate Integration on Silicon (EUROSOI-ULIS), 2020 Joint International EUROSOI Workshop and International Conference on. :1-4 Sep, 2020

    Relation: 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)

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  2. 2
    مؤتمر
    A Machine Learning-based Approach to Optimize Repair and Increase Yield of Embedded Flash Memories in Automotive Systems-on-Chip

    المؤلفون: Manzini, A., Inglese, P., Caldi, L., Cantoro, R., Carnevale, G., Coppetta, M., Giltrelli, M., Mautone, N., Irrera, F., Ullmann, R., Bernardi, P.

    المصدر: 2019 IEEE European Test Symposium (ETS) Test Symposium (ETS), 2019 IEEE European. :1-6 May, 2019

    Relation: 2019 IEEE European Test Symposium (ETS)

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  3. 3
    دورية أكاديمية
    On Border Traps in Back-Side-Illuminated CMOS Image Sensor Oxides

    المؤلفون: Vici, A., Russo, F., Lovisi, N., Irrera, F.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(5):2022-2027 May, 2020

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  4. 4
    دورية أكاديمية
    Performance and Reliability Degradation of CMOS Image Sensors in Back-Side Illuminated Configuration

    المؤلفون: Vici, A., Russo, F., Lovisi, N., Marchioni, A., Casella, A., Irrera, F.

    المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 8:765-772 2020

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  5. 5
    مؤتمر
    Smart sensors for the recognition of specific human motion disorders in Parkinson's disease

    المؤلفون: Lorenzi, P., Rao, R., Romano, G., Kita, A., Serpa, M., Filesi, F., Irrera, F., Bologna, M., Suppa, A., Berardelli, A.

    المصدر: 2015 6th International Workshop on Advances in Sensors and Interfaces (IWASI) Advances in Sensors and Interfaces (IWASI), 2015 6th IEEE International Workshop on. :131-136 Jun, 2015

    Relation: 2015 6th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI)

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  6. 6
    دورية أكاديمية
    Microwave driven synthesis of narrow bandgap alpha-tin nanoparticles on silicon

    المؤلفون: Mazzetta, I., Viti, L., Rigoni, F., Quaranta, S., Gasparotto, A., Barucca, G., Palma, F., Riello, P., Cattaruzza, E., Asgari, M., Vitiello, M., Irrera, F.

    المصدر: In Materials & Design May 2022 217

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  7. 7
    مؤتمر
    Through-silicon-trench in back-side-illuminated CMOS image sensors for the improvement of gate oxide long term performance

    المؤلفون: Vici, A., Russo, F., Lovisi, N., Latessa, L., Marchioni, A., Casella, A., Irrera, F.

    المصدر: 2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :32.3.1-32.3.4 Dec, 2018

    Relation: 2018 IEEE International Electron Devices Meeting (IEDM)

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  8. 8
    دورية أكاديمية
    Large-scale CMOS-compatible process for silicon nanowires growth and BC8 phase formation

    المؤلفون: Mazzetta, I., Rigoni, F., Irrera, F., Riello, P., Quaranta, S., Latini, A., Palma, F.

    المصدر: In Solid State Electronics December 2021 186

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  9. 9
    مؤتمر
    Impact of Forming Pulse Geometry and Area Scaling on Forming Kinetics and Stability of the Low Resistance State in HfO2-Based RRAM Cells

    المؤلفون: Lorenzi, P., Rao, R., Irrera, F.

    المصدر: 2012 4th IEEE International Memory Workshop Memory Workshop (IMW), 2012 4th IEEE International. :1-4 May, 2012

    Relation: 2012 4th IEEE International Memory Workshop (IMW)

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  10. 10
    دورية أكاديمية
    Forming Kinetics in $\hbox{HfO}_{2}$ -Based RRAM Cells

    المؤلفون: Lorenzi, P., Rao, R., Irrera, F.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 60(1):438-443 Jan, 2013

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