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1دورية أكاديمية
المؤلفون: Jan Dvořák, Jiří Vohánka, Vilma Buršíková, Ivan Ohlídal
المصدر: Heliyon, Vol 10, Iss 5, Pp e27246- (2024)
مصطلحات موضوعية: Ellipsometry, Reflectometry, Optical characterization, Polymer-like thin films, Plasma polymer, Inhomogeneity, Science (General), Q1-390, Social sciences (General), H1-99
وصف الملف: electronic resource
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2
المؤلفون: Ivan Ohlídal, Jiří Vohánka, Vilma Buršíková, Jan Dvořák, Petr Klapetek, Nupinder Jeet Kaur
المصدر: Optics express. 30(21)
مصطلحات موضوعية: Atomic and Molecular Physics, and Optics
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b9d614c34b3e54ad86502e35b120a4ed
https://pubmed.ncbi.nlm.nih.gov/36258456 -
3
المؤلفون: Jiří Vohánka, Václav Šulc, Ivan Ohlídal, Miloslav Ohlídal, Petr Klapetek
المصدر: Optik. 280:170775
مصطلحات موضوعية: Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials
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4
المؤلفون: Jan Dvořák, Jiří Vohánka, Vilma Buršíková, Daniel Franta, Ivan Ohlídal
المصدر: Coatings; Volume 13; Issue 5; Pages: 873
مصطلحات موضوعية: Materials Chemistry, optical characterization, inhomogeneous thin films, non-absorbing substrates, dual-side measurements, spectroscopic ellipsometry, spectrophotometry, polymer-like thin films, optical properties, Surfaces and Interfaces, Surfaces, Coatings and Films
وصف الملف: application/pdf
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5
المؤلفون: Jiří Vohánka, Ivan Ohlídal, Vilma Buršíková, Petr Klapetek, Nupinder Jeet Kaur
المصدر: OPTICS EXPRESS. 2022, vol. 30, issue 2, p. 2033-2047.
مصطلحات موضوعية: REFLECTION, HEIGHT DISTRIBUTION, STATISTICAL PROPERTIES, CONSTANTS, SPECTROSCOPIC ELLIPSOMETRY, THICKNESS NONUNIFORMITY, REFRACTIVE-INDEX, SURFACE-ROUGHNESS, SILICON, Atomic and Molecular Physics, and Optics, SYSTEM
وصف الملف: text; application/pdf
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1eb1422fc5ccc0b925ef495c23c8e90e
https://pubmed.ncbi.nlm.nih.gov/35209352 -
6
المؤلفون: Daniel Franta, Ivan Ohlídal, Jaroslav Ženíšek, Petr Vašina, Jiří Vohánka, Martin Čermák
المصدر: Journal of Electrical Engineering. 70:16-26
مصطلحات موضوعية: Materials science, business.industry, 010401 analytical chemistry, 01 natural sciences, Reflectivity, 0104 chemical sciences, Characterization (materials science), 010309 optics, chemistry.chemical_compound, Interference (communication), Silicon nitride, chemistry, 0103 physical sciences, Optoelectronics, Point (geometry), Thin film, business
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7
المؤلفون: Pavel Franta, Martin Čermák, Daniel Franta, Ivan Ohlídal, Jiří Vohánka
المصدر: Journal of Electrical Engineering. 70:1-15
مصطلحات موضوعية: 010302 applied physics, Physics, Kramers–Kronig relations, Solid-state physics, business.industry, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Symmetry (physics), Consistency (statistics), 0103 physical sciences, Dispersion (optics), Dissipative system, Microelectronics, Sum rule in quantum mechanics, Statistical physics, 0210 nano-technology, business
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8
المؤلفون: Ivan Ohlídal, Daniel Franta, Jiří Vohánka, Martin Čermák, Vilma Buršíková
المصدر: Optics express. 28(1)
مصطلحات موضوعية: Amorphous silicon, Materials science, Condensed matter physics, Silicon, business.industry, chemistry.chemical_element, 02 engineering and technology, Substrate (electronics), 021001 nanoscience & nanotechnology, 01 natural sciences, Atomic and Molecular Physics, and Optics, Light scattering, 010309 optics, chemistry.chemical_compound, Optics, chemistry, 0103 physical sciences, Dispersion (optics), Mueller calculus, Thin film, 0210 nano-technology, business, Refractive index
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b09261e35fb27146ee94cdcf60bd2b1c
https://pubmed.ncbi.nlm.nih.gov/32118947 -
9
المؤلفون: Daniel Franta, Ivan Ohlídal, Jiří Vohánka, Martin Čermák
المصدر: Journal of Modern Optics. 65:1720-1736
مصطلحات موضوعية: Imagination, Electromagnetic field, Physics, Chemical substance, media_common.quotation_subject, Isotropy, Mathematical analysis, Perturbation (astronomy), 02 engineering and technology, Surface finish, 021001 nanoscience & nanotechnology, 01 natural sciences, Atomic and Molecular Physics, and Optics, 010309 optics, symbols.namesake, 0103 physical sciences, Transmittance, symbols, Rayleigh scattering, 0210 nano-technology, media_common
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10
المؤلفون: Daniel Franta, Jaroslav Ženíšek, Martin Čermák, Jiří Vohánka, Ivan Ohlídal, Petr Vašina
المصدر: Surface and Interface Analysis. 50:757-765
مصطلحات موضوعية: Materials science, Isotropy, Boundary (topology), Richardson extrapolation, 02 engineering and technology, Surfaces and Interfaces, General Chemistry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Surfaces, Coatings and Films, Computational physics, Characterization (materials science), 010309 optics, chemistry.chemical_compound, Stack (abstract data type), Silicon nitride, chemistry, Ellipsometry, 0103 physical sciences, Materials Chemistry, 0210 nano-technology, Layer (electronics)