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1
المؤلفون: J. Ulrici, M. Sasse, Claudia Höhne, J. Vollrath, G. Hempel
المصدر: Der Anaesthesist. 65:911-916
مصطلحات موضوعية: Gynecology, medicine.medical_specialty, business.industry, General Medicine, Perioperative, Overweight, 03 medical and health sciences, 0302 clinical medicine, Anesthesiology and Pain Medicine, 030202 anesthesiology, medicine, 030212 general & internal medicine, medicine.symptom, business
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2
المؤلفون: P. Appelt, J. Vollrath, S. Schwarz, H. Kiep, W. Kiess, J. Hoppmann
المصدر: Kinder- und Jugendmedizin. 16:288-290
مصطلحات موضوعية: Gynecology, medicine.medical_specialty, Political science, medicine, Primary health care
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::806a5e1055bb8ab9bedfe1d8f2b5545e
https://doi.org/10.1055/s-0037-1616330 -
3
المؤلفون: J, Ulrici, G, Hempel, M, Sasse, J, Vollrath, C, Höhne
المصدر: Der Anaesthesist. 65(12)
مصطلحات موضوعية: Male, Pediatric Obesity, Adolescent, Body Weight, Respiratory Tract Diseases, Overweight, Perioperative Care, Postoperative Complications, Ambulatory Surgical Procedures, Child, Preschool, Intubation, Intratracheal, Humans, Anesthesia, Female, Airway Management, Child, Intraoperative Complications
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4دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
5
المؤلفون: G. Enders, W. Hoenlein, G. Reimbold, Carlos Mazure, Richard Ferrant, J. Vollrath, R. Thewes, F. Allain, Philippe Flatresse, F. Hofmann, Bertrand Pelloux-Prayer
المصدر: 2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S).
مصطلحات موضوعية: Materials science, Silicon, business.industry, Transistor, Electrical engineering, Silicon on insulator, chemistry.chemical_element, Biasing, Threshold voltage, law.invention, chemistry, law, MOSFET, Optoelectronics, business, Saturation (magnetic), Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8ba3b898a27a344f0009e60a1f1f3f88
https://doi.org/10.1109/s3s.2013.6716547 -
6
المؤلفون: J. Vollrath, A.J. van de Goor, Said Hamdioui, Georgi Gaydadjiev, Zaid Al-Ars
المصدر: ITC
مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Computer science, Universal memory, Spice, Registered memory, Memory rank, Parallel computing, Static random-access memory, Fault (power engineering), Memory controller, Dram, Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::32f76da98c7e80a0769fa5a9a1750287
https://doi.org/10.1109/test.2006.297701 -
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المؤلفون: Zaid Al-Ars, Said Hamdioui, J. Vollrath
المصدر: Asian Test Symposium
مصطلحات موضوعية: Engineering, Fabrication, business.industry, Process (computing), Extrapolation, Electronic engineering, Technology scaling, business, Memory testing, Dram
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::865920bb77841a498b09945027bc6a85
https://doi.org/10.1109/ats.2005.71 -
8
المؤلفون: S. Schwehr, T. Persch, H. Acker, M. Hauck, J. Vollrath
المصدر: Proceedings Euro ASIC '92.
مصطلحات موضوعية: Engineering, business.industry, Transistor, Transistor array, Hardware_PERFORMANCEANDRELIABILITY, Chip, law.invention, Data acquisition, CMOS, law, Field-programmable analog array, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, business, Digital array, Electronic circuit
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::afeaefbbb907e290d78d781b9f7d4e13
https://doi.org/10.1109/euasic.1992.228009 -
9
المؤلفون: W. Langheinrich, J. Vollrath, D. P. Runthala, P.D. Vyas, S.S. Shekhawat, D.K. Thakur, A. Kumar
المصدر: Conference Record of the 1993 IEEE Industry Applications Conference Twenty-Eighth IAS Annual Meeting.
مصطلحات موضوعية: Engineering, business.industry, Transconductance, Transistor, Electrical engineering, Charge density, Hardware_PERFORMANCEANDRELIABILITY, Chip, law.invention, Threshold voltage, Switching time, Darlington transistor, law, MOSFET, Hardware_INTEGRATEDCIRCUITS, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::109d9bb387ece9f34c093cce8676f5d3
https://doi.org/10.1109/ias.1993.299117 -
10
المؤلفون: J. Vollrath, R. Rooney
المصدر: ITC
مصطلحات موضوعية: Test strategy, Engineering, business.industry, Real-time computing, Process (computing), Random testing, computer.file_format, Construct (python library), Computer engineering, Built-in self-test, Component (UML), Burn-in, Bitmap, business, computer
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c2448d322afc97e1ef8180f30245e218
https://doi.org/10.1109/test.2001.966698