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1دورية أكاديمية
المؤلفون: R Schafranek, J D Baniecki, M Ishii, Y Kotaka, K Kurihara
المصدر: New Journal of Physics, Vol 15, Iss 5, p 053014 (2013)
وصف الملف: electronic resource
Relation: https://doaj.org/toc/1367-2630
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المؤلفون: Z. Yu, B. Saini, P. J. Liao, Y. K. Chang, V. Hou, C. H. Nien, Y. C. Shih, S. H. Yeong, V. Afanas'Ev, F. Huang, J. D. Baniecki, A. Mehta, C. S. Chang, H.-S. P. Wong, W. Tsai, P. C. McIntyre
المصدر: 2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::75979f9a42d6ce26e176a9d5d00dd21c
https://doi.org/10.1109/vlsi-tsa54299.2022.9771017 -
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المؤلفون: Thomas M. Shaw, Robert B. Laibowitz, H. Xu, Q. Y. Ma, J. D. Baniecki, J. Lian, Christopher Parks
المصدر: Journal of Applied Physics. 89:2873-2885
مصطلحات موضوعية: Materials science, Condensed matter physics, Schottky barrier, Fermi level, Analytical chemistry, General Physics and Astronomy, Thermionic emission, Atmospheric temperature range, symbols.namesake, symbols, Thin film, Forming gas, Current density, Quantum tunnelling
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المؤلفون: Gregory Costrini, J. D. Baniecki, M. Wise, Laertis Economikos, Satish D. Athavale, J. Lian, N. Nagel
المصدر: Integrated Ferroelectrics. 38:259-267
مصطلحات موضوعية: Materials science, business.industry, Condensed Matter Physics, Capacitance, Electronic, Optical and Magnetic Materials, law.invention, Capacitor, Stack (abstract data type), Control and Systems Engineering, law, Materials Chemistry, Ceramics and Composites, Optoelectronics, Metalorganic vapour phase epitaxy, Electrical and Electronic Engineering, Thin film, business, Layer (electronics), Scaling, Dram
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المؤلفون: P. R. Duncombe, David E. Kotecki, J. D. Baniecki, Katherine L. Saenger, H. Shen, Cyril Cabral, J. Lian, Robert B. Laibowitz, Timothy M. Shaw, Q. Y. Ma
المصدر: Journal of the European Ceramic Society. 19:1457-1461
مصطلحات موضوعية: Materials science, business.industry, Annealing (metallurgy), Schottky barrier, Thermionic emission, Dielectric, Cathode, law.invention, law, Materials Chemistry, Ceramics and Composites, Optoelectronics, Thin film, business, Forming gas, Leakage (electronics)
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المؤلفون: Timothy M. Shaw, Katherine L. Saenger, G. Kunkel, Cyril Cabral, J. Lian, Robert B. Laibowitz, J. D. Baniecki, Yandong Wang, H. Shen, P. R. Duncombe, M. Gutsche, David E. Kotecki, Richard Wise, Satish D. Athavale, Young-Jin Park
المصدر: IBM Journal of Research and Development. 43:367-382
مصطلحات موضوعية: Materials science, General Computer Science, business.industry, Chemical vapor deposition, Dielectric, Capacitance, law.invention, Capacitor, chemistry.chemical_compound, chemistry, law, Electrode, Electronic engineering, Strontium titanate, Optoelectronics, Thin film, business, Dram
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المؤلفون: E. Liniger, M. Huang, Zhigang Suo, Robert B. Laibowitz, Timothy M. Shaw, J. D. Baniecki
المصدر: Applied Physics Letters. 75:2129-2131
مصطلحات موضوعية: Stress (mechanics), Permittivity, Materials science, Physics and Astronomy (miscellaneous), Residual stress, Ultimate tensile strength, Dielectric, Substrate (electronics), Composite material, Thin film, Capacitance
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المؤلفون: P. R. Duncombe, Deborah A. Neumayer, Timothy M. Shaw, David E. Kotecki, M. Copel, Robert B. Laibowitz, J. D. Baniecki
المصدر: Applied Physics Letters. 73:1832-1834
مصطلحات موضوعية: chemistry.chemical_classification, Materials science, Physics and Astronomy (miscellaneous), Condensed matter physics, Photoemission spectroscopy, Doping, Analytical chemistry, Charge density, Thermionic emission, Dielectric, Electron acceptor, chemistry, Impurity, Thin film
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المؤلفون: J D Baniecki, S H Hong, J R LaGraff, Q. Y. Ma, H. Chan, J M Murduck
المصدر: Superconductor Science and Technology. 11:375-377
مصطلحات موضوعية: High-temperature superconductivity, Materials science, Annealing (metallurgy), Metals and Alloys, Analytical chemistry, Condensed Matter Physics, Ion, law.invention, Ion implantation, law, Getter, Electrical resistivity and conductivity, Materials Chemistry, Ceramics and Composites, Electrical and Electronic Engineering, Thin film, Sheet resistance
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المؤلفون: David E. Kotecki, P. R. Duncombe, Q. Y. Ma, Timothy M. Shaw, Robert B. Laibowitz, H. Shen, J. D. Baniecki, Deborah A. Neumayer
المصدر: Applied Physics Letters. 72:498-500
مصطلحات موضوعية: Permittivity, Materials science, Physics and Astronomy (miscellaneous), business.industry, Dielectric, Capacitance, Nuclear magnetic resonance, K band, Dispersion (optics), Optoelectronics, Relaxation (physics), Dielectric loss, Thin film, business