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1تقرير
المؤلفون: R A Austin, B D Sierawski, J M Trippe, K L Ryder, J M Petrin, A L Sternberg, R A Reed, A F Witulski, N Mahadevan, G Karsai, R D Schrimpf, K M Warren, R A Weller, K A LaBel, J W Evans, F J Groen
المصدر: Public website https://nepp.nasa.gov.
مصطلحات موضوعية: Quality Assurance And Reliability, Electronics And Electrical Engineering
URL الوصول: https://ntrs.nasa.gov/citations/20205006328