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1دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
2دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
3
المؤلفون: M. von Tottleben, T. Bui, S.G.J. van Breda, C. Strijbos, I. de Jong, J. Bisschop, M. Schluck, M. van Leeuwen
المساهمون: RS: GROW - R1 - Prevention, Toxicogenomics
المصدر: Food Quality and Preference, 54, 13-22. ELSEVIER SCI LTD
مصطلحات موضوعية: 0301 basic medicine, Meat, Nitrite, media_common.quotation_subject, Phytochemicals, Consumer awareness, 03 medical and health sciences, Promotion (rank), Health claims on food labels, 0502 economics and business, Credibility, Health claims, Consumer credibility, Marketing, media_common, Consumption (economics), National health, 030109 nutrition & dietetics, Nutrition and Dietetics, 05 social sciences, Advertising, Order (business), Population study, 050211 marketing, Business, Food Science
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3eb2d45eec773f187492b3b853fa4813
https://doi.org/10.1016/j .foodqual.2016.06.014 -
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المؤلفون: Mohammad E. Barbati, Johannes Kalder, A.G. Peppelenbosch, Barend Mees, Geert Willem H. Schurink, Paula R. Keschenau, Alexander Gombert, J. Bisschop, Michael J. Jacobs, Drosos Kotelis, Jochen Grommes
المصدر: Journal of Vascular Surgery. 66:1913-1914
مصطلحات موضوعية: medicine.medical_specialty, business.industry, 030204 cardiovascular system & hematology, Aortic repair, medicine.disease, Connective tissue disease, Surgery, 03 medical and health sciences, 0302 clinical medicine, medicine, In patient, 030212 general & internal medicine, Cardiology and Cardiovascular Medicine, business
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5دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
6
المؤلفون: J. Bisschop, Jinbo Wan, Hans G. Kerkhoff
المصدر: IEEE transactions on nanotechnology, 15(2), 137-148. IEEE
IEEE Transactions on Nanotechnologyمصطلحات موضوعية: Engineering, NBTI, Semiconductor device modeling, 02 engineering and technology, Hardware_PERFORMANCEANDRELIABILITY, 01 natural sciences, Stress (mechanics), Reliability (semiconductor), Control theory, 0103 physical sciences, Reaction–diffusion system, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Electrical and Electronic Engineering, Reaction-diffusion, 010302 applied physics, Negative-bias temperature instability, business.industry, CMOS, Analog, Mixed-signal integrated circuit, Reliability, 020202 computer hardware & architecture, Computer Science Applications, 13. Climate action, business, Cadence
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المؤلفون: Leo van Marwijk, V. M. Girault, Som Nath, J. Zhang, S. Jose, J. Bisschop
المصدر: 2016 IEEE International Integrated Reliability Workshop (IIRW).
مصطلحات موضوعية: 010302 applied physics, Materials science, Physics::Instrumentation and Detectors, business.industry, Thermal resistance, Electrical engineering, Physics::Physics Education, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Temperature measurement, Computer Science::Other, law.invention, Stress (mechanics), Computer Science::Emerging Technologies, Reliability (semiconductor), CMOS, Chip-scale package, law, 0103 physical sciences, Optoelectronics, Wafer, Resistor, 0210 nano-technology, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6a6ebb7f8e6efe4ba988f4d5c18c0344
https://doi.org/10.1109/iirw.2016.7904904 -
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المؤلفون: G.T. Sasse, D. Stephens, A. J. Scholten, J. Bisschop, G. D. J. Smit
المصدر: IEEE Transactions on Electron Devices. 58:2721-2728
مصطلحات موضوعية: Physics, Work (thermodynamics), Transistor, Type (model theory), Electronic, Optical and Magnetic Materials, law.invention, Stress (mechanics), Set (abstract data type), law, MOSFET, Electronic engineering, Applied mathematics, Radio frequency, Electrical and Electronic Engineering, Degradation (telecommunications)
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المؤلفون: Ramun M. Kho, A. J. Moonen, Z. N. Liang, J. Bisschop, Edgar Olthof, V. M. Girault, Som Nath
المصدر: Microelectronics Reliability. 50:1210-1214
مصطلحات موضوعية: Engineering, business.industry, Electrical engineering, Process (computing), Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Rule of thumb, Reliability engineering, Stress level, law.invention, Reliability (semiconductor), law, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4ca6eed588193b50c0b9a3a27fff79ae
https://doi.org/10.1016/j .microrel.2010.07.103 -
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المؤلفون: J. Bisschop
المصدر: Microelectronics Reliability. 47:1330-1335
مصطلحات موضوعية: Engineering, Standardization, Operations research, business.industry, Process (engineering), Knowledge economy, Reliability methods, Customer requirements, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Engineering management, Application areas, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Reliability (statistics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::66d44053200916b763b3353b5bd67f85
https://doi.org/10.1016/j .microrel.2007.07.084