لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

المؤلفون: H. Paul Urbach, Wim M. J. Coene, Peter van der Walle, Xukang Wei

المصدر: Ultramicroscopy, 229

مصطلحات موضوعية: 010302 applied physics, Physics, Computation, Cramér Rao Lower Bound, Monte Carlo method, Shot noise, Parameterization, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Upper and lower bounds, Noise (electronics), Atomic and Molecular Physics, and Optics, Ptychography, Electronic, Optical and Magnetic Materials, Computational physics, symbols.namesake, Fourier transform, 0103 physical sciences, symbols, Poisson noise, 0210 nano-technology, Instrumentation, Cramér–Rao bound, Ptychograhy

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d779216135596873edd9fc288387b992
https://pubmed.ncbi.nlm.nih.gov/34243020

المؤلفون: Hendrik P. Urbach, Wim M. J. Coene, Paolo Ansuinelli

المصدر: Extreme Ultraviolet Lithography 2020.

مصطلحات موضوعية: Computer science, Extreme ultraviolet lithography, Extreme ultraviolet, Mask inspection, Minification, Inverse problem, Phase retrieval, Algorithm, Ptychography, Metrology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::023c05eb00e9fde04036f3c6845ee82e
https://doi.org/10.1117/12.2572019

المؤلفون: H. P. Urbach, Stefan Witte, Wim M. J. Coene, A. C. C. de Beurs, G. S. M. Jansen, A. P. Konijnenberg

المساهمون: Atoms, Molecules, Lasers, ARCNL, LaserLaB - Physics of Light

المصدر: Konijnenberg, A P, De Beurs, A C C, Jansen, G S M, Urbach, H P, Witte, S & Coene, W M J 2020, ' Phase retrieval algorithms for lensless imaging using diffractive shearing interferometry ', Journal of the Optical Society of America A: Optics and Image Science, and Vision, vol. 37, no. 6, pp. 914-924 . https://doi.org/10.1364/JOSAA.389791
Journal of the Optical Society of America A: Optics and Image Science, and Vision, 37(6), 914-924. The Optical Society

مصطلحات موضوعية: Shearing (physics), Computer science, Iterative reconstruction, 01 natural sciences, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, 010309 optics, Interferometry, Extreme ultraviolet, 0103 physical sciences, SDG 7 - Affordable and Clean Energy, Computer Vision and Pattern Recognition, Uniqueness, Error reduction, Phase retrieval, Algorithm, Ultraviolet radiation

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9432f732eafa1a12f59d410641d9a06b
https://pubmed.ncbi.nlm.nih.gov/32543591

المؤلفون: A. P. Konijnenberg, G. S. M. Jansen, Kjeld S. E. Eikema, Wim M. J. Coene, Xueyan Liu, A. C. C. de Beurs, Stefan Witte

المساهمون: Atoms, Molecules, Lasers, ARCNL, LaserLaB - Physics of Light, LaserLaB - Biophotonics and Microscopy

المصدر: de Beurs, A C C, Liu, X, Jansen, G S M, Konijnenberg, A P, Coene, W M J, Eikema, K S E & Witte, S 2020, ' Extreme ultraviolet lensless imaging without object support through rotational diversity in diffractive shearing interferometry ', Optics Express, vol. 28, no. 4, pp. 5257-5266 . https://doi.org/10.1364/OE.380056
Optics Express, 28(4)
Optics Express, 28(4), 5257-5266. The Optical Society
Optics Express

مصطلحات موضوعية: Physics, Shearing (physics), Diffraction, Image quality, business.industry, 02 engineering and technology, Iterative reconstruction, 021001 nanoscience & nanotechnology, 01 natural sciences, Atomic and Molecular Physics, and Optics, Ptychography, 010309 optics, Interferometry, Optics, Extreme ultraviolet, 0103 physical sciences, 0210 nano-technology, Phase retrieval, business

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b1ee0f0cd27e1d8e26a060d98776992b
https://research.vu.nl/en/publications/bdb050a5-9e8c-40ab-8301-d5ff6408d3f7

المؤلفون: Roland Horsten, Wim M. J. Coene, Martin Gebhardt, Maxim Tschernajew, Robert Klas, Tino Eidam, Jens Limpert, Sergey Pyatchenkov, Sven Werdenburg, Jan Rothhardt, Steffen Hädrich

المصدر: Scopus-Elsevier

مصطلحات موضوعية: Physics, Photon, Repetition (rhetorical device), business.industry, Photon flux, Physics::Optics, Radiation, Photon counting, Optics, Beamline, Extreme ultraviolet, Fiber laser, Harmonics, Harmonic, High harmonic generation, Physics::Atomic Physics, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0ab5c330ca67e36f05533f5adc2949f8
https://doi.org/10.1364/assl.2020.jth2a.21

المؤلفون: Wim M. J. Coene, H. Paul Urbach, Paolo Ansuinelli

المصدر: Applied Optics, 59(20)

مصطلحات موضوعية: Computer science, business.industry, Extreme ultraviolet lithography, Image processing, 01 natural sciences, Atomic and Molecular Physics, and Optics, Metrology, 010309 optics, Optics, Extreme ultraviolet, 0103 physical sciences, Reticle, Wafer, Electrical and Electronic Engineering, Phase retrieval, business, Engineering (miscellaneous), Lithography

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::964fb692178265a7d8c9e740457490a8
http://resolver.tudelft.nl/uuid:0a9affc2-2748-42ee-87b6-ed278496cb15

المؤلفون: H. Paul Urbach, Wim M. J. Coene, Xukang Wei

المصدر: Physical Review A: covering atomic, molecular, and optical physics and quantum information, 102(4)

مصطلحات موضوعية: Physics, Monte Carlo method, Plane wave, Shot noise, Estimator, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Upper and lower bounds, Ptychography, 010309 optics, Minimum-variance unbiased estimator, 0103 physical sciences, Statistical physics, 0210 nano-technology, Cramér–Rao bound

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0c51e2fc2e80da456dcbcfafe35ec58f
http://resolver.tudelft.nl/uuid:0b24b61d-c7c0-48a3-ab85-7c551fdc4bdb

المؤلفون: A. P. Konijnenberg, H. P. Urbach, Wim M. J. Coene

المصدر: Ultramicroscopy, 174

مصطلحات موضوعية: Zernike polynomials, Phase (waves), 02 engineering and technology, Computational imaging, 01 natural sciences, 010309 optics, symbols.namesake, 020210 optoelectronics & photonics, Optics, Sampling (signal processing), 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Instrumentation, Phase retrieval, Physics, business.industry, Phase-contrast imaging, Phase microscopy, Coherent diffraction imaging, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Frequency domain, Coherent diffractive imaging, symbols, business, Phase modulation

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d572db5c5b819519b82c9c2dbfcd15c7

المؤلفون: Paolo Ansuinelli, H. P. Urbach, Wim M. J. Coene

المصدر: Applied Optics
Applied Optics, 58(22)

مصطلحات موضوعية: Atomic force microscopy, business.industry, Scanning electron microscope, Computer science, Extreme ultraviolet lithography, Feature selection, Inversion (meteorology), Inverse problem, Diffraction efficiency, 01 natural sciences, Atomic and Molecular Physics, and Optics, Finite element method, 010309 optics, Correlation, Maxima and minima, Optics, 0103 physical sciences, Electrical and Electronic Engineering, business, Engineering (miscellaneous), Algorithm

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b280a03476c1122789172eada69890b5