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المؤلفون: Martin Sagmeister, Rainer Hainberger, Gerald Meinhardt, Moritz Eggeling, J. Edlinger, Paul Muellner, Alejandro Maese-Novo, Wolfgang Drexler, M. Vlaskovic, Dana Seyringer, Jochen Kraft, Horst Zimmermann, Elisabet Rank, Günther Koppitsch
المصدر: ICTON
مصطلحات موضوعية: Materials science, Spectrometer, medicine.diagnostic_test, business.industry, 020208 electrical & electronic engineering, High resolution, Spectral domain, 02 engineering and technology, Chip, chemistry.chemical_compound, Wavelength, 020210 optoelectronics & photonics, Silicon nitride, chemistry, CMOS, Optical coherence tomography, 0202 electrical engineering, electronic engineering, information engineering, medicine, Optoelectronics, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fbe86b7ffa8ee914f8f89273a4d17de7
https://doi.org/10.1109/icton.2019.8840473 -
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المؤلفون: Jochen Kraft, Günther Koppitsch, Paul Muellner, Alejandro Maese-Novo, Horst Zimmermann, M. Vlaskovic, Dana Seyringer, C. Burtscher, Wolfgang Drexler, Rainer Hainberger, J. Edlinger, Gerald Meinhardt, Elisabet Rank, Martin Sagmeister
المصدر: Nanoengineering: Fabrication, Properties, Optics, and Devices XV.
مصطلحات موضوعية: Spectrometer, Computer science, business.industry, Size reduction, Nanophotonics, 02 engineering and technology, 01 natural sciences, 010309 optics, Reduction (complexity), Wavelength, 020210 optoelectronics & photonics, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Photonics, business, Large size, Communication channel
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::05acec3c4aebcfd026e081b782125831
https://doi.org/10.1117/12.2319670 -
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المؤلفون: Rainer Hainberger, Jochen Kraft, Dana Seyringer, Gerald Meinhardt, J. Edlinger, C. Burtscher, Günther Koppitsch, Alejandro Maese-Novo, Stefan Partel, Paul Muellner
المصدر: SPIE Proceedings.
مصطلحات موضوعية: medicine.diagnostic_test, Computer science, business.industry, Photonic integrated circuit, 02 engineering and technology, 01 natural sciences, Arrayed waveguide grating, law.invention, 010309 optics, Crosstalk, Wavelength, 020210 optoelectronics & photonics, Optical coherence tomography, law, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, medicine, Optoelectronics, Photonics, business, Waveguide, Communication channel
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::792c317611bfae28769a7072260bbfdc
https://doi.org/10.1117/12.2249675 -
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المؤلفون: Rainer Hainberger, Paul Muellner, Günther Koppitsch, Jochen Kraft, J. Edlinger, Dana Seyringer, Stefan Partel, C. Burtscher, Alejandro Maese-Novo, Gerald Meinhardt
المصدر: 2016 18th International Conference on Transparent Optical Networks (ICTON).
مصطلحات موضوعية: Medical diagnostic, Materials science, business.industry, Photonic integrated circuit, 02 engineering and technology, Crosstalk, Wavelength, 020210 optoelectronics & photonics, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Optoelectronics, Photonics, business, Refractive index
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::57fb369012ceeb5140e3bebc873bc568
https://doi.org/10.1109/icton.2016.7550586 -
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المؤلفون: Rino E. Kunz, P. Sixt, J. Edlinger, Michael T. Gale
المصدر: Sensors and Actuators A: Physical. 47:482-486
مصطلحات موضوعية: Fabrication, Materials science, business.industry, Metals and Alloys, Grating, Condensed Matter Physics, Chip, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Optics, law, Miniaturization, Electrical and Electronic Engineering, Thin film, business, Instrumentation, Diffraction grating, Waveguide, Refractive index
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المؤلفون: J. Edlinger, T. Müller, H.K. Pulker
المصدر: Ultramicroscopy. 41:89-98
مصطلحات موضوعية: Materials science, Mineralogy, Replication (microscopy), Microstructure, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Shock (mechanics), law.invention, law, Transmission electron microscopy, Fracture (geology), Deformation (engineering), Electron microscope, Composite material, Thin film, Instrumentation
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المؤلفون: H.K. Pulker, C.L. Du, Rino E. Kunz, J. Edlinger, M. Seifert
المصدر: Sensors and Actuators A: Physical. 25:155-159
مصطلحات موضوعية: business.industry, Chemistry, Ion plating, Metals and Alloys, Fluorescence spectrometry, Analytical chemistry, Humidity, Condensed Matter Physics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Ion, Optoelectronics, Gas detector, Electrical and Electronic Engineering, Thin film, business, Instrumentation, Low voltage, Refractometry
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المؤلفون: Muir Kumph, Stefan Partel, J. Edlinger, Rainer Blatt, Kirill Lakhmanskiy, Michael Niedermayr, Michael Brownnutt
المصدر: New Journal of Physics. 16:113068
مصطلحات موضوعية: Condensed Matter::Quantum Gases, Physics, Silicon, business.industry, Intrinsic semiconductor, General Physics and Astronomy, chemistry.chemical_element, Quantum simulator, 7. Clean energy, Ion, Trap (computing), Semiconductor, chemistry, Physics::Plasma Physics, Optoelectronics, Ion trap, Quantum information, business
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9دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
10دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.