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المؤلفون: V. Benevent, Jean-Paul Barnes, D. Lafond, Didier Dutartre, Francois Andrieu, J.M. Hartmann, M. Veillerot, S. Morvan, J.-F. Damlencourt, Bernard Previtali, Nicolas Loubet
المصدر: Solid-State Electronics. 83:10-17
مصطلحات موضوعية: Materials science, Yield (engineering), Drop (liquid), Transistor, Analytical chemistry, Gate length, Nanotechnology, Blanket, Condensed Matter Physics, Epitaxy, Electronic, Optical and Magnetic Materials, law.invention, law, Materials Chemistry, Wafer, Electrical and Electronic Engineering
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المؤلفون: J.-F. Damlencourt, T. Billon, J.M. Hartmann, V. Benevent
المصدر: Thin Solid Films. 520:3185-3189
مصطلحات موضوعية: Silicon, Metals and Alloys, Analytical chemistry, chemistry.chemical_element, Dichlorosilane, Nanotechnology, Surfaces and Interfaces, Vapour deposition, Silane, Arrhenius plot, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Silicon-germanium, chemistry.chemical_compound, chemistry, Materials Chemistry, Disilane, Growth rate
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المؤلفون: J. F. Damlencourt, C. Bonafos, A. Diab, Sorin Cristoloveanu, I. Ionica, Jung-Hee Lee, E. Saracco
المصدر: Journal of The Electrochemical Society. 159:H467-H472
مصطلحات موضوعية: Materials science, Electrical transport, Renewable Energy, Sustainability and the Environment, business.industry, Materials Chemistry, Electrochemistry, Nanowire, Optoelectronics, Condensed Matter Physics, business, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials
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المؤلفون: Paulo Gentil, Laurent Clavelier, Q.T. Nguyen, Benjamin Vincent, Yves Morand, Sorin Cristoloveanu, J.-F. Damlencourt
المصدر: Solid-State Electronics. 51:1172-1179
مصطلحات موضوعية: Electron mobility, Fabrication, Materials science, business.industry, Silicon on insulator, chemistry.chemical_element, Insulator (electricity), Germanium, Electron, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, chemistry, Materials Chemistry, Electronic engineering, Optoelectronics, Wafer, Electrical and Electronic Engineering, business
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المؤلفون: F. Maccherozzi, Nicholas Barrett, O. Renault, M. Fabrizioli, J.-F. Damlencourt
المصدر: Journal of non-crystalline solids 353 (2007): 635–638.
info:cnr-pdr/source/autori:Barrett, N; Renault, O; Damlencourt, JF; Maccherozzi, F; Fabrizioli, M/titolo:Photoelectron spectroscopy study of the effect of substrate doping on an HfO2%2FSiO2%2Fn-Si gate stack/doi:/rivista:Journal of non-crystalline solids/anno:2007/pagina_da:635/pagina_a:638/intervallo_pagine:635–638/volume:353مصطلحات موضوعية: Chemistry, SURFACES, Doping, Fermi level, Analytical chemistry, CORE-LEVEL SHIFTS, Equivalent oxide thickness, Substrate (electronics), Condensed Matter Physics, BAND, Electronic, Optical and Magnetic Materials, INTERFACE, symbols.namesake, X-ray photoelectron spectroscopy, Gate oxide, Materials Chemistry, Ceramics and Composites, symbols, Work function, SI, Extrinsic semiconductor
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::89c7de387dd9285c24ec2467941b575a
https://doi.org/10.1016/j .jnoncrysol.2006.11.013 -
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المؤلفون: C. Licitra, J.-F. Damlencourt, Laurent Clavelier, Emmanuel Nolot, P. Rivallin, Benjamin Vincent, Yves Morand
المصدر: Semiconductor Science and Technology. 22:237-244
مصطلحات موضوعية: Fabrication, Chemistry, Condensation process, Analytic model, Materials Chemistry, Experimental data, Insulator (electricity), Electrical and Electronic Engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Computational physics
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المؤلفون: B. Hazebrouck, P. Neofytou, P. Swiezewsk, R. Ciobanu, S. Fernández, S. Contreras, J. F. Damlencourt, M. Pilou, A. Tabrea, Iñigo Larraza, C. Vaquero, R. Pina, O. Salvi, Drew Thompson, David Y.H. Pui, J. M.López De Ipiña, M. Calderon, H. Stockmann-Juvala, A. Romero, V. Vaananen, D. Boutry, K. Otkallo, T. Oroz, E. Jankowska, C. Salazar, A. Pintea, B. Hargreaves
المصدر: TECNALIA Publications
Fundación Tecnalia Research & Innovationمصطلحات موضوعية: History, Engineering, business.industry, Nanorisks, Integrated approach, Construction engineering, Computer Science Applications, Education, Tools, Work (electrical), ISO 31000, Component (UML), Forensic engineering, Methods, business, Risk management, Construction
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f76458062b09e0a70fe2c5860f7e5ee4
http://hdl.handle.net/11556/330 -
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المؤلفون: J.-F. Damlencourt, Francois Andrieu, Bernard Guillaumot, O. Renault, Thomas Ernst, F. Ducroquet, Olivier Weber, Simon Deleonibus, J.M. Hartmann, A.M. Papon
المصدر: IEEE Transactions on Electron Devices. 53:449-456
مصطلحات موضوعية: Electron mobility, Materials science, Silicon, business.industry, Electrical engineering, chemistry.chemical_element, Electronic, Optical and Magnetic Materials, Silicon-germanium, chemistry.chemical_compound, chemistry, MOSFET, Parasitic element, Optoelectronics, Electrical and Electronic Engineering, business, Metal gate, Tin, High-κ dielectric
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::083369e88a6ea9c578537f03ae5cd5f2
https://doi.org/10.1109/ted.2005.863536
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المؤلفون: J.-F. Damlencourt, Elena O. Filatova, F. Martin, Philippe Jonnard, Jean-Michel André, Olivier Renault
المصدر: Surface and Interface Analysis. 38:777-780
مصطلحات موضوعية: Valence (chemistry), Silicon, X-ray, Analytical chemistry, chemistry.chemical_element, Surfaces and Interfaces, General Chemistry, Condensed Matter Physics, Spectral line, Surfaces, Coatings and Films, chemistry, Absorption edge, Monolayer, Materials Chemistry, Emission spectrum, Silicon oxide
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المؤلفون: Gerard Ghibaudo, Julien Buckley, J. F. Damlencourt, Marc Gely, Simon Deleonibus, Giuseppe Nicotra, François Martin, B. De Salvo
المصدر: Solid-State Electronics. 49:1833-1840
مصطلحات موضوعية: business.industry, Chemistry, Dielectric, Condensed Matter Physics, Band offset, Electronic, Optical and Magnetic Materials, Non-volatile memory, Tunnel effect, Effective mass (solid-state physics), Materials Chemistry, Electronic engineering, Optoelectronics, Electrical measurements, Electrical and Electronic Engineering, business, Quantum tunnelling, High-κ dielectric
