المؤلفون: S. Bianchi, I. Muñoz-Martin, E. Covi, A. Bricalli, G. Piccolboni, A. Regev, G. Molas, J. F. Nodin, F. Andrieu, D. Ielmini

المصدر: Nature Communications, Vol 14, Iss 1, Pp 1-14 (2023)

مصطلحات موضوعية: Science

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2041-1723

URL الوصول: https://doaj.org/article/1fd89242574943b3ba52bdec76007f2c

المؤلفون: L. Reganaz, D. Deleruyelle, Q. Rafhay, J. Minguet Lopez, N. Castellani, J. F. Nodin, A. Bricalli, G. Piccolboni, G. Molas, F. Andrieu

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::321b56f0a9151384af9e1c720e5b3e21
https://doi.org/10.1109/irps48203.2023.10117882

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المؤلفون: Amir Regev, D. Green, G. Piccolboni, Alessandro Bricalli, W. Goes, P. Blaise, G. Molas, J. F. Nodin

المصدر: 2021 IEEE International Memory Workshop (IMW).

مصطلحات موضوعية: Predictive simulation, chemistry.chemical_compound, chemistry, Computer science, Resistive switching, Electronic engineering, Oxide, Experimental data, Data retention, Technology CAD, Resistive random-access memory, Data modeling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::20becfe5b90f3fb07da1aae129863d3f
https://doi.org/10.1109/imw51353.2021.9439623

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المؤلفون: J-F Nodin, Gabriel Molas, Etienne Nowak, Elisa Vianello, D. R. B. Ly, C. Fenouillet-Beranger, J.-P. Noel, Giacomo Indiveri, Bastien Giraud, Alessandro Grossi, Gilbert Sassine, N. Castellani

المساهمون: Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Institute of Neuroinformatics [Zürich] (INI), Universität Zürich [Zürich] = University of Zurich (UZH)- Eidgenössische Technische Hochschule - Swiss Federal Institute of Technology [Zürich] (ETH Zürich), IEEE

المصدر: 2018 IEEE International Electron Devices Meeting (IEDM 2018)
2018 IEEE International Electron Devices Meeting (IEDM 2018), IEEE, Dec 2018, San Francisco, CA, United States. pp.20.3.1-20.3.4, ⟨10.1109/IEDM.2018.8614603⟩

مصطلحات موضوعية: [INFO.INFO-AR]Computer Science [cs]/Hardware Architecture [cs.AR], Hardware_MEMORYSTRUCTURES, Computer science, 020208 electrical & electronic engineering, 02 engineering and technology, Content-addressable memory, [INFO.INFO-NE]Computer Science [cs]/Neural and Evolutionary Computing [cs.NE], 020202 computer hardware & architecture, Resistive random-access memory, Reliability (semiconductor), Neuromorphic engineering, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, [INFO.INFO-ET]Computer Science [cs]/Emerging Technologies [cs.ET], Static random-access memory, Latency (engineering), [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Standby power, Block (data storage)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d10faf3c63a9f463455a0e0925d8f5cc
https://hal.archives-ouvertes.fr/hal-02939330/document

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المؤلفون: B. Traore, F. Perrin, L. Perniola, Emmanuel Nolot, E. Vianello, Nicolas Vaxelaire, F. Mazen, J. Coignus, Alessandro Grossi, P. Blaise, L. Lachal, S. Bernasconi, S. Pauliac, E. Nowak, S. Chevalliez, J. F. Nodin, R. Crochemore, L. Grenouillet, M. Barlas, C. Pellissier

المصدر: 2017 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: 010302 applied physics, Materials science, Silicon, business.industry, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Resistive random-access memory, Ion implantation, chemistry, Robustness (computer science), 0103 physical sciences, Memory window, Optoelectronics, Data retention, 0210 nano-technology, business, Low voltage, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e525df8362cea51b975b7d5fc88fe9c4
https://doi.org/10.1109/iedm.2017.8268392

المؤلفون: J-F. Nodin, G. Reimbold, L. Kadura, C. Cagli, C. Nguyen, S. Bernasconi

المصدر: 2017 International Conference of Microelectronic Test Structures (ICMTS).

مصطلحات موضوعية: Engineering, Resistive touchscreen, business.industry, Electrical engineering, 02 engineering and technology, 010402 general chemistry, 021001 nanoscience & nanotechnology, 01 natural sciences, 0104 chemical sciences, Characterization (materials science), Resistive random-access memory, Electronic engineering, 0210 nano-technology, business, Random access, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fed960d1e6d5f24375fabd69ca9a6714
https://doi.org/10.1109/icmts.2017.7954276

المؤلفون: Blaise Yvert, Thilo Werner, Olivier Bichler, Etienne Nowak, Luca Perniola, J. F. Nodin, Alessandro Grossi, B. DeSalvo, Elisa Vianello

المساهمون: Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Département d'Architectures, Conception et Logiciels Embarqués-LIST (DACLE-LIST), Laboratoire d'Intégration des Systèmes et des Technologies (LIST), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Technologique (CEA) (DRT (CEA)), Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), Clinatec - Centre de recherche biomédicale Edmond J.Safra (SCLIN), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre Hospitalier Universitaire [Grenoble] (CHU)-Institut National de la Santé et de la Recherche Médicale (INSERM)-Université Grenoble Alpes (UGA), Laboratoire d'Intégration des Systèmes et des Technologies (LIST (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre Hospitalier Universitaire [Grenoble] (CHU)-Institut National de la Santé et de la Recherche Médicale (INSERM)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])

المصدر: 2016 IEEE International Electron Devices Meeting (IEDM)
2016 IEEE International Electron Devices Meeting (IEDM), Dec 2016, San Francisco, United States. pp.16.6.1-16.6.4, ⟨10.1109/IEDM.2016.7838433⟩

مصطلحات موضوعية: Computer science, Switching probability, 02 engineering and technology, Background noise, Computational power, 01 natural sciences, Synaptic plasticity, Experimental demonstrations, Input output programs, Electron devices, [SPI]Engineering Sciences [physics], Fully connected neural network, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Detection theory, 010302 applied physics, Noise measurement, Artificial neural network, Reading (computer), Reliable detection, 020202 computer hardware & architecture, Term (time), Power (physics), Circuit architectures, Algorithm, Decoding methods, Signal detection

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::13aa0fdab7c6e62721569a0c6b4e4374
https://hal-cea.archives-ouvertes.fr/cea-01839875