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1دورية أكاديمية
المؤلفون: B. O. Asimeng, E. K. Tiburu, K. Kan-Dapaah, J. K. Efavi, R. Asiamah, D. W. Afeke
المصدر: Cerâmica, Vol 66, Iss 379, Pp 340-346 (2020)
مصطلحات موضوعية: bioactivity, biomaterial, hydroxyapatite, snail shell, Engineering (General). Civil engineering (General), TA1-2040
وصف الملف: electronic resource
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2
المؤلفون: Emmerich Bertagnolli, Max C. Lemme, Gustaf Sjöblom, Jörgen Olsson, J. K. Efavi, S. Abermann
المصدر: Microelectronics Reliability. 47:536-539
مصطلحات موضوعية: Materials science, business.industry, Electrical engineering, Analytical chemistry, chemistry.chemical_element, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Metal, Nickel, chemistry, Aluminium, Molybdenum, visual_art, visual_art.visual_art_medium, Metalorganic vapour phase epitaxy, Metallizing, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Tin, business, High-κ dielectric
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1f48fd36f8e5b06e6539fde687c82a33
https://doi.org/10.1016/j .microrel.2007.01.002 -
3
المؤلفون: T. Mollenhauer, Thorsten Wahlbrink, Heinrich Kurz, Max C. Lemme, Michael Schmidt, J. K. Efavi, H. D. B. Gottlob, Tim Echtermeyer
المصدر: Materials Science in Semiconductor Processing. 9:904-908
مصطلحات موضوعية: Materials science, business.industry, Mechanical Engineering, Oxide, Dielectric, Condensed Matter Physics, Epitaxy, Capacitance, chemistry.chemical_compound, chemistry, Mechanics of Materials, Electrode, Optoelectronics, General Materials Science, business, Metal gate, Current density, High-κ dielectric
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4
المؤلفون: Heiner Gottlob, J. K. Efavi, S. Abermann, Erwin Auer, Mathias Schmidt, Emmerich Bertagnolli, Max C. Lemme, Alois Lugstein
المصدر: ECS Transactions. 1:507-515
مصطلحات موضوعية: Metal, Capacitor, Materials science, chemistry, law, visual_art, Metallurgy, visual_art.visual_art_medium, chemistry.chemical_element, Tin, law.invention
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5
المؤلفون: Eberhard Bugiel, Andreas Fissel, T. Mollenhauer, Max C. Lemme, Michael Schmidt, Thorsten Wahlbrink, Heinrich Kurz, J. K. Efavi, H. J. Osten, Tim Echtermeyer, H. D. B. Gottlob, Malte Czernohorsky
المصدر: Solid-State Electronics. 50:979-985
مصطلحات موضوعية: Materials science, business.industry, Electrical engineering, Dielectric, Condensed Matter Physics, Epitaxy, Electronic, Optical and Magnetic Materials, law.invention, Capacitor, CMOS, Gate oxide, law, MOSFET, Materials Chemistry, Optoelectronics, Field-effect transistor, Electrical and Electronic Engineering, business, High-κ dielectric
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6
المؤلفون: Tim Echtermeyer, T. Mollenhauer, Malte Czernohorsky, Andreas Fissel, Eberhard Bugiel, Thorsten Wahlbrink, H. D. B. Gottlob, H. J. Osten, Max C. Lemme, Heinrich Kurz, J. K. Efavi, Michael Schmidt
المصدر: BASE-Bielefeld Academic Search Engine
مصطلحات موضوعية: Materials science, business.industry, Electrical engineering, Oxide, Equivalent oxide thickness, Time-dependent gate oxide breakdown, Electronic, Optical and Magnetic Materials, International Technology Roadmap for Semiconductors, chemistry.chemical_compound, chemistry, Gate oxide, Optoelectronics, Electrical and Electronic Engineering, business, Metal gate, Leakage (electronics), High-κ dielectric
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7دورية أكاديمية
المؤلفون: J. K. Efavi, T. Mollenhauer, T. Wahlbrink, H. D. B. Gottlob, M. C. Lemme, H. Kurz
المصدر: Journal of Materials Science: Materials in Electronics; Jul2005, Vol. 16 Issue 7, p433-436, 4p