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1دورية أكاديمية
المؤلفون: E. Gomiero, G. Samanni, J. Jasse, C. Jahan, O. Weber, R. Berthelon, R. Ranica, L. Favennec, V. Caubet, D. Ristoiu, J. P. Reynard, L. Clement, P. Zuliani, R. Annunziata, F. Arnaud
المصدر: IEEE Journal of the Electron Devices Society, Vol 7, Pp 517-521 (2019)
مصطلحات موضوعية: Amorphous, chalcogenide, phase change memory (PCM), Ge-Sb-Te (GST) compounds, quenching time, resistance, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
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المؤلفون: A. Redaelli, A. Gandolfo, G. Samanni, E. Gomiero, E. Petroni, L. Scotti, A. Lippiello, P. Mattavelli, J. Jasse, D. Codegoni, A. Serafini, R. Ranica, C. Boccaccio, J. Sandrini, R. Berthelon, J.-C. Grenier, O. Weber, D. Turgis, A. Valery, S. Del Medico, V. Caubet, J.-P. Reynard, D. Dutartre, L. Favennec, A. Conte, F. Disegni, M. De Tomasi, A. Ventre, M. Baldo, D. Ielmini, A. Maurelli, P. Ferreira, F. Arnaud, F. Piazza, P. Cappelletti, R. Annunziata, R. Gonella
مصطلحات موضوعية: reliability, emerging memory, Germanium, Resistance, Dispersion, Electronic, Optical and Magnetic Materials, Metals, Programming, 28nm FDSOI, BEOL, Ge-rich GST, embedded memory, Electrical and Electronic Engineering, GST, Crystallization, Biotechnology, ePCM
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::97fb4ae59fb0a298673919264d6fb111
http://hdl.handle.net/11311/1220301 -
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المؤلفون: Roberto Annunziata, O. Weber, J. Jasse, Paola Zuliani, V. Caubet, Franck Arnaud, G. Samanni, Enrico Gomiero, L. Favennec, R. Berthelon, D. Ristoiu, C. Jahan, L. Clement, J. P. Reynard, R. Ranica
المصدر: IEEE Journal of the Electron Devices Society, Vol 7, Pp 517-521 (2019)
مصطلحات موضوعية: Materials science, Chalcogenide, Measure (mathematics), law.invention, resistance, chalcogenide, chemistry.chemical_compound, law, Electrical and Electronic Engineering, Crystallization, business.industry, Process (computing), quenching time, Function (mathematics), Ge-Sb-Te (GST) compounds, Electronic, Optical and Magnetic Materials, Amorphous solid, chemistry, phase change memory (PCM), Amorphous, Optoelectronics, lcsh:Electrical engineering. Electronics. Nuclear engineering, State (computer science), business, lcsh:TK1-9971, Reset (computing), Biotechnology
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4High Density Embedded PCM Cell in 28nm FDSOI Technology for Automotive Micro-Controller Applications
المؤلفون: Roberto Annunziata, L. Favennec, F. Disegni, D. Turgis, Jean-Luc Ogier, Remi Beneyton, Xavier Federspiel, N. Cherault, Fausto Piazza, A. Gandolfo, M. Molgg, E. Ciantar, Enrico Gomiero, P.O. Sassoulas, J. P. Reynard, B. Dumont, S. Delmedico, Alexandre Villaret, Olivier Weber, A. Viscuso, Franck Arnaud, L. Clement, L. Desvoivres, Paulo Ferreira, Paolo Mattavelli, C. Gallon, R. Ranica, O. Kermarrec, J. Jasse, S. Chouteau, C. Jahan, C. Boccaccio, Paolo Cappelletti, A. Souhaite, G. Samanni, Paola Zuliani, R. Berthelon, V. Caubet, Philippe Boivin, D. Ristoiu, Alfonso Maurelli, J. C. Grenier
المصدر: 2020 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: Computer science, business.industry, Reading (computer), Transistor, Bipolar junction transistor, Automotive industry, High density, law.invention, Microcontroller, Reliability (semiconductor), law, Soldering, Electronic engineering, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cb9d7d45a06fe3730a77e9eea337f87a
https://doi.org/10.1109/iedm13553.2020.9371934 -
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المؤلفون: Ludovic Goffart, Gauthier Lefevre, Bernard Pelissier, Christophe Vallée, Gabriele Navarro, J. P. Reynard
المساهمون: STMicroelectronics [Crolles] (ST-CROLLES), Laboratoire des technologies de la microélectronique (LTM ), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA), CEA-LETI - Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information
المصدر: ECS PRiME 2020
ECS PRiME 2020, Oct 2020, Hawaï, United States. pp.1358-1358, ⟨10.1149/ma2020-02141358mtgabs⟩مصطلحات موضوعية: Materials science, Fabrication, Annealing (metallurgy), Thermodynamics, Optical storage, GeSbTe, Amorphous solid, Phase-change memory, chemistry.chemical_compound, chemistry, Operating temperature, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Thin film, ComputingMilieux_MISCELLANEOUS
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المؤلفون: Alain Toffoli, Loic Welter, J. P. Reynard, C. Jahan, Franck Julien, E. Richard, Dann Morillon, Pascal Masson, Jean Coignus
المصدر: 2017 International Conference of Microelectronic Test Structures (ICMTS).
مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Gate dielectric, Electrical engineering, Time-dependent gate oxide breakdown, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, CMOS, Hardware_GENERAL, Gate oxide, Logic gate, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, 0210 nano-technology, business, Metal gate, Gate equivalent, Hardware_LOGICDESIGN, High-κ dielectric
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1e1467f72c9b9b61750449a2f6180b0b
https://doi.org/10.1109/icmts.2017.7954274 -
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المؤلفون: Bénédicte Mortini, C. Aumont, E. Mortini, J.-P. Reynard, Jérôme Vaillant, A. Hirigoen, Axel Crocherie
المصدر: Journal of Photopolymer Science and Technology. 22:707-711
مصطلحات موضوعية: Fabrication, Materials science, Polymers and Plastics, Pixel, business.industry, High-refractive-index polymer, Organic Chemistry, Process (computing), Optics, Optical path, Materials Chemistry, Optoelectronics, Process optimization, Image sensor, business, Refractive index
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c9a76f0f94186f3e9995f9faa450bdd5
https://doi.org/10.2494/photopolymer.22.707 -
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المؤلفون: Z. Fang, Damien Lenoble, M Juhel, Y Rault, Jay T. Scheuer, J.-P Reynard, F. Lallement, Steven R. Walther, Ludovic Godet, A. Grouillet
المصدر: Surface and Coatings Technology. 186:17-20
مصطلحات موضوعية: Materials science, business.industry, Doping, Transistor, Nanotechnology, Surfaces and Interfaces, General Chemistry, Semiconductor device, Condensed Matter Physics, Surfaces, Coatings and Films, law.invention, Ion implantation, CMOS, law, Materials Chemistry, Optoelectronics, Wafer, business, NMOS logic, Sheet resistance
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::76a6fdfced34eb61b761ea998e5caf5b
https://doi.org/10.1016/j .surfcoat.2004.04.004 -
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المؤلفون: F. Lallement, J.-P Reynard, Damien Lenoble, J. Weeman, D Downey, Ludovic Godet, Timothy J. Miller, Z. Fang, A Arevalo, Daniel Distaso, Bon-Woong Koo, Jay T. Scheuer, A. Grouillet
المصدر: Surface and Coatings Technology. 186:57-61
مصطلحات موضوعية: Materials science, business.industry, Doping, technology, industry, and agriculture, Nanotechnology, Surfaces and Interfaces, General Chemistry, Repeatability, Plasma, Semiconductor device, Condensed Matter Physics, Surfaces, Coatings and Films, Ion implantation, Beamline, Materials Chemistry, Optoelectronics, Particle, Process control, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::60e2273def0aa50ba8d764716254a493
https://doi.org/10.1016/j .surfcoat.2004.04.011 -
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المؤلفون: E. Sabouret, C. Verove, C. Chaton, Kathy Barla, B. Descouts, J. P. Reynard, J. Michailos, P. Motte
المصدر: Microelectronic Engineering. 60:113-118
مصطلحات موضوعية: Materials science, Silicon, business.industry, Doping, Copper interconnect, chemistry.chemical_element, Integrated circuit, Dielectric, Condensed Matter Physics, Copper, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, chemistry, law, Optoelectronics, Electrical and Electronic Engineering, business, Silicon oxide, Layer (electronics)