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1دورية أكاديمية
المؤلفون: M.-L. Pourteau, A. Gharbi, P. Brianceau, J.-A. Dallery, F. Laulagnet, G. Rademaker, R. Tiron, H.-J. Engelmann, J. von Borany, K.-H. Heinig, M. Rommel, L. Baier
المصدر: Micro and Nano Engineering, Vol 9, Iss , Pp 100074- (2020)
مصطلحات موضوعية: Single-electron-transistor, Multilayer nanopillars, Si nanodots, E-beam lithography, ICP-RIE, EFTEM, Electronics, TK7800-8360, Technology (General), T1-995
وصف الملف: electronic resource
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المؤلفون: D. Lehninger, F. Honeit, D. Rafaja, V. Klemm, C. Röder, L. Khomenkova, F. Schneider, J. von Borany, J. Heitmann
المصدر: MRS Bulletin. 47:773-782
مصطلحات موضوعية: General Materials Science, Physical and Theoretical Chemistry, Condensed Matter Physics
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المؤلفون: J von Borany, H-J Engelmann, K-H Heinig, E Amat, G Hlawacek, F Klüpfel, R Hübner, W Möller, M-L Pourteau, G Rademaker, M Rommel, L Baier, P Pichler, F Perez-Murano, R Tiron
المصدر: Semiconductor Science and Technology. 38:055011
مصطلحات موضوعية: Materials Chemistry, Electrical and Electronic Engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials
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المؤلفون: A del Moral, E Amat, H-J Engelmann, M-L Pourteau, G Rademaker, D Quirion, N Torres-Herrero, M Rommel, K-H Heinig, J von Borany, R Tiron, J Bausells, F Perez-Murano
المصدر: Semiconductor Science and Technology 37(2022), 125014-125023
مصطلحات موضوعية: hybrid circuit, MOSFET, CMOS, Materials Chemistry, Electrical and Electronic Engineering, Condensed Matter Physics, single electron transistor, vertical nanopillar, Electronic, Optical and Magnetic Materials
وصف الملف: application/pdf
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المؤلفون: P. Brianceau, M. Rommel, Hans-Jürgen Engelmann, M.-L. Pourteau, J. von Borany, F. Laulagnet, Guido Rademaker, J.-A. Dallery, Ahmed Gharbi, L. Baier, Karl-Heinz Heinig, Raluca Tiron
المساهمون: Département Plate-Forme Technologique (DPFT), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Vistec Electron Beam GmbH, Helmholtz-Zentrum Dresden-Rossendorf (HZDR), Fraunhofer Institute for Integrated Systems and Device Technology (Fraunhofer IISB), Fraunhofer (Fraunhofer-Gesellschaft), European Project: 688072,H2020,H2020-ICT-2015,IONS4SET(2016), Publica
المصدر: Micro and Nano Engineering
Micro and Nano Engineering, Elsevier, 2020, 9, https://doi.org/10.1016/j.mne.2020.100074. ⟨10.1016/j.mne.2020.100074⟩
Micro and Nano Engineering, 2020, 9, https://doi.org/10.1016/j.mne.2020.100074. ⟨10.1016/j.mne.2020.100074⟩
Micro and Nano Engineering 9(2020), 100074
Micro and Nano Engineering, Vol 9, Iss, Pp 100074-(2020)مصطلحات موضوعية: Reactive ion etching, Materials science, Fabrication, lcsh:TK7800-8360, EFTEM, 02 engineering and technology, 01 natural sciences, 010309 optics, Single-electron transistor, Characterization methods, E-beam lithography, Robustness (computer science), lcsh:Technology (General), Energy-filtered transmission electron microscopy, 0103 physical sciences, Electrical and Electronic Engineering, Reactive-ion etching, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Lithography, Nanopillar, business.industry, ICP-RIE, lcsh:Electronics, Single-electron-transistor, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Multilayer nanopillars, CMOS, lcsh:T1-995, Optoelectronics, Si nanodots, 0210 nano-technology, business, Silicon nanodots, Critical dimension
وصف الملف: application/pdf
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1ffaa0176ed92185b48dbaa77d24531d
https://hal-cea.archives-ouvertes.fr/cea-03409432 -
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المؤلفون: Stefan Facsko, J. von Borany, Gregor Hlawacek, René Heller, Nico Klingner
المصدر: Ultramicroscopy 198(2019), 10-17
مصطلحات موضوعية: Microscope, Materials science, Resolution (mass spectrometry), 02 engineering and technology, 01 natural sciences, Secondary electrons, Time-Of-Flight, law.invention, Ion, Optics, law, 0103 physical sciences, Collision cascade, Instrumentation, 010302 applied physics, Spectrometer, business.industry, 021001 nanoscience & nanotechnology, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Secondary ion mass spectrometry, 0210 nano-technology, business, Helium Ion Microscope, SIMS, Field ion microscope
وصف الملف: application/pdf
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fb76e8f382c22b2d58e240c000fed681
https://www.hzdr.de/publications/Publ-27454-1 -
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المؤلفون: Elżbieta Dynowska, Zbigniew Kurant, Iosif Sveklo, Andrzej Maziewski, Ewelina Milińska, Andrzej Wawro, M. Jakubowski, Roman Böttger, Andreas Wagner, J. von Borany, Maciej Oskar Liedke, Maik Butterling
المصدر: Journal of Physics: Condensed Matter 31(2019), 185801
مصطلحات موضوعية: Materials science, vacancy formation, Analytical chemistry, atom, molecule, and ion impact, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Rutherford backscattering spectrometry, 01 natural sciences, Crystallographic defect, Rutherford backscattering, RBS, Positron annihilation spectroscopy, Ion, positron spectroscopies, thin films, magnetic measurements, 0103 physical sciences, X-ray crystallography, General Materials Science, Irradiation, 010306 general physics, 0210 nano-technology, Spectroscopy, Anisotropy
وصف الملف: application/pdf
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ba3e3010d8ed5bf840ebda02ff8c89b4
https://www.hzdr.de/publications/Publ-28819-1 -
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المؤلفون: René Ziegenrücker, Stanisław H. Nowak, Josef Buchriegler, J. von Borany, Frans Munnik, Daniel Hanf, Silke Merchel, Axel D. Renno, Oliver Scharf
المصدر: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and
Nuclear Instruments and Methods in Physics Research B 377(2016), 17-24مصطلحات موضوعية: Nuclear and High Energy Physics, Photon, Materials science, Pixel, business.industry, 010401 analytical chemistry, Resolution (electron density), chemistry.chemical_element, Scale (descriptive set theory), Particle-induced X-ray emission, Lateral Resolution, 010502 geochemistry & geophysics, 01 natural sciences, Sample (graphics), Imaging, Geometallurgy, 0104 chemical sciences, Optics, chemistry, PIXE, business, Tin, Instrumentation, Energy (signal processing), 0105 earth and related environmental sciences
وصف الملف: application/pdf
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المؤلفون: Raluca Tiron, Hans-Jürgen Engelmann, L. Baier, Ahmed Gharbi, Guido Rademaker, Karl-Heinz Heinig, J.-A. Dallery, P. Brianceau, J. von Borany, M.-L. Pourteau, F. Laulagnet, M. Rommel
المصدر: Microelectronic Engineering. :111336
مصطلحات موضوعية: Set (abstract data type), CMOS, business.industry, Computer science, Optoelectronics, Electrical and Electronic Engineering, Condensed Matter Physics, business, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Nanopillar
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المؤلفون: Shavkat Akhmadaliev, A. Lieberwirth, J. von Borany, E. Gütlich, Wolfgang Ensinger, S. Lederer, J. Zimmermann
المصدر: Nuclear Instruments and Methods in Physics Research B 359(2015), 161-166
مصطلحات موضوعية: Nuclear and High Energy Physics, Scintillation, Materials science, Ion beam, Physics::Instrumentation and Detectors, Thermal annealing, Physics::Medical Physics, Alumina, Radiochemistry, Analytical chemistry, Fluence, Scintillation yield decrease, Ion, Heavy-ion irradiation, High-temperature scintillation, Irradiation, Emission spectrum, Luminescence, Absorption (electromagnetic radiation), Instrumentation
وصف الملف: application/pdf
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