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المؤلفون: J. Hai, F. Cacho, X. Federspiel, T. Garba-Seybou, A. Divay, E. Lauga-Larroze, J.-D. Arnould
المساهمون: STMicroelectronics [Crolles] (ST-CROLLES), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Reliable RF and Mixed-signal Systems (TIMA-RMS), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA), IEEE
المصدر: IEEE International Reliability Physics Symposium (IRPS 2023)
IEEE International Reliability Physics Symposium (IRPS 2023), Mar 2023, Monterey, United States. ⟨10.1109/IRPS48203.2023.10117885⟩
IEEELinkمصطلحات موضوعية: PACS 85.42, dynamic stress, degradation mode, integrated test circuit, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, off-state reliability, TDDB
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e8145e89588fe5b7bf9959ddd9fd9338
https://hal.science/hal-04105262 -
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المؤلفون: J. Hai, F. Cacho, A. Divay, E. Lauga-Larroze, J.-D. Arnould, J. Forest, V. Knopik, X. Garros
المساهمون: STMicroelectronics, Reliable RF and Mixed-signal Systems (TIMA-RMS), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA), Département d'Architectures, Conception et Logiciels Embarqués-LETI (DACLE-LETI), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes (UGA), ST Microélectronics, ST Microélectronic, IEEE
المصدر: IEEE International Reliability Physics Symposium (IRPS 2022)
IEEE International Reliability Physics Symposium (IRPS 2022), IEEE, Mar 2022, Dallas, United States. pp.4B.2-1-4B.2-6, ⟨10.1109/IRPS48227.2022.9764535⟩مصطلحات موضوعية: sensitivity analysis, power amplifier, RF reliability, CMOS SOI, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Hot-Carrier Injection (HCI)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f2f0a1ad5c79ec0c35e254af09504e2c
https://hal.science/hal-04050556 -
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4دورية أكاديمية
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المؤلفون: Alexandre Giry, C. Raynaud, G. Tant, J-D. Arnould, J.M. Fournier, Pierre Ferris, P. Vincent, G. Pares
المساهمون: Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS), XAVIER, Pascal
المصدر: 2015 IEEE MTT-S International Microwave Symposium (IMS2015)
2015 IEEE MTT-S International Microwave Symposium (IMS2015), May 2015, Phoenix, United States. pp.1-4مصطلحات موضوعية: Engineering, Multi-mode optical fiber, business.industry, Amplifier, [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 020208 electrical & electronic engineering, Silicon on insulator, 020206 networking & telecommunications, 02 engineering and technology, Input impedance, Switched capacitor, [SPI.TRON] Engineering Sciences [physics]/Electronics, [SPI.TRON]Engineering Sciences [physics]/Electronics, GSM, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, business, Electrical impedance, UMTS frequency bands, ComputingMilieux_MISCELLANEOUS
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::695462fb92b1be969061ce8601e1d647
https://hal.archives-ouvertes.fr/hal-02015026 -
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المؤلفون: A. Vilcot, J.-D. Arnould, R. Gary
المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique (IMEP), Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique de Grenoble (INPG)-Université Joseph Fourier - Grenoble 1 (UJF)
المصدر: Journal of Lightwave Technology
Journal of Lightwave Technology, 2006, 24 (5), pp.2163-2170. ⟨10.1109/JLT.2006.872284⟩مصطلحات موضوعية: Differential equations, Charge carrier lifetime, photo-induced, Diffusion equation, Materials science, three-dimensional (3-D) resolution, semiconductor substrate diffusion, Differential equation, Computation, Charge carrier processes, 02 engineering and technology, Microwave devices, 01 natural sciences, 010309 optics, Optics, semiconductor device models, Radiative recombination, optical control, Optical Carrier transmission rates, Charge carrier density, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Diffusion (business), Hankel transform, substrates, three-dimensional carrier density, Hankel transforms, Parametric statistics, optical carrier injection, diffusion equation, business.industry, photo-induced plasma, diffusion, Mathematical analysis, 020206 networking & telecommunications, Transforms, carrier density, Atomic and Molecular Physics, and Optics, Semiconductor, Optical sensors, laser beam, business, Laser beams
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1e02d26f99422cc534969f8c47d72fff
https://doi.org/10.1109/jlt.2006.872284
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7مؤتمر
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المؤلفون: Y. Morandini, F. Sonnerat, J-D Arnould, Christophe Gaquiere, Romain Debroucke, Daniel Gloria
المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)
المصدر: Proceedings of 24th IEEE International Conference on Microelectronic Test Structures, ICMTS 2011
24th IEEE International Conference on Microelectronic Test Structures, ICMTS 2011
24th IEEE International Conference on Microelectronic Test Structures, ICMTS 2011, 2011, Amsterdam, Netherlands. pp.101-104, ⟨10.1109/ICMTS.2011.5976868⟩مصطلحات موضوعية: 010302 applied physics, Engineering, Silicon, business.industry, chemistry.chemical_element, 020206 networking & telecommunications, 02 engineering and technology, BiCMOS, 01 natural sciences, Capacitance, Characterization (materials science), CMOS, chemistry, Stack (abstract data type), Test structure, 0103 physical sciences, Extremely high frequency, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::87b0909aec43d84e0f5e4b66dc24b116
https://hal.archives-ouvertes.fr/hal-00800125 -
9دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
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المؤلفون: P.-E. Bailly, Philippe Ferrari, J.-D. Arnould, C. Hoarau, Pascal Xavier
المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)
المصدر: Electronics Letters
Electronics Letters, IET, 2007, 43 (25), pp.1434-1436. ⟨10.1049/el:20072188⟩مصطلحات موضوعية: Engineering, hybrid technology, Impedance matching, coplanar waveguide components, surface mount technology, 02 engineering and technology, accurate measurement method, Narrowband, RF impedance tuners characterisation, tuning, Transmission line, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Electrical and Electronic Engineering, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Electrical impedance, impedance matching, business.industry, Coplanar waveguide, 020208 electrical & electronic engineering, Bandwidth (signal processing), surface-mounted components, 020206 networking & telecommunications, Tuner, compact narrowband impedance matching network, Electric power transmission, radiofrequency impedance tuner characterisation, coplanar transmission lines, coplanar waveguide transmission lines, radiofrequency impedance tuners, business, complex impedances
