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المؤلفون: Jonathan Fales, Binod Kumar G. Nair, Jeffrey E. Nelson, Frank E. Gennari, Philippe Hurat, Jac Condella, Akif Sultan, Aaron Sinnott, Xiaoyuan Qi, Sriram Madhavan, Uwe Paul Schroeder, Rwik Sengupta, Ya-Chieh Lai
المصدر: IEEE Transactions on Semiconductor Manufacturing. 34:372-378
مصطلحات موضوعية: Computer science, Process (engineering), Yield (finance), Semiconductor device modeling, Critical area, Integrated circuit, Condensed Matter Physics, Industrial and Manufacturing Engineering, Electronic, Optical and Magnetic Materials, Reliability engineering, law.invention, law, Range (statistics), Electrical and Electronic Engineering, Failure mode and effects analysis, Scaling
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المؤلفون: Philippe Hurat, Ya-Chieh Lai, Atul Chittora, Jeffrey E. Nelson, Xiaoyuan Qi, Rwik Sengupta, Binod Kumar G. Nair, Aaron Sinnott, Frank E. Gennari, Jac Condella, Jonathan Fales, Shobhit Malik
المصدر: Design-Process-Technology Co-optimization XV.
مصطلحات موضوعية: Adaptive sampling, Computer science, law, Yield (finance), Transistor, Process (computing), Normalization (sociology), Critical area, Projection (set theory), Failure mode and effects analysis, Reliability engineering, law.invention
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e31d2dd7cd19fd6f640897511ffa93f0
https://doi.org/10.1117/12.2583515 -
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المؤلفون: Frank E. Gennari, Piyush Pathak, Ya-Chieh Lai, Sangah Lee, Jae-Hyun Kang, Jac Condella, Joong-Won Jeon, Jin Kim, Philippe Hurat, Jaehwan Kim, Shin Byung-Chul
المصدر: Design-Process-Technology Co-optimization for Manufacturability XIV.
مصطلحات موضوعية: Set (abstract data type), Optical proximity correction, Computer science, Extreme ultraviolet lithography, Reliability (computer networking), Design pattern, Process (computing), Overhead (computing), Design for manufacturability, Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c74af2a2e8bc634694fb1288e684fbd6
https://doi.org/10.1117/12.2551970 -
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المؤلفون: Sriram Madhavan, Philippe Hurat, Piyush Pathak, Rasit O. Topaloglu, Jac Condella, Ramez Nachman, Luigi Capodieci
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Standard cell, Stress (mechanics), Computer science, law, Real-time computing, Transistor, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Process (computing), Integrated circuit design, Lithography, law.invention
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0e3e8ae1371faff89cefb630e353d6c5
https://doi.org/10.1117/12.882508 -
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المؤلفون: Yajun Ran, Mark E. Mason, Anand Rajaram, Robert Ritchie, Philippe Hurat, Bala Kasthuri, Nishath Verghese, Clive Bittlestone, Haizhou Chen, Arjun Rajagopal, Raguram Damodaran, Jac Condella, Mark Terry, Srinivas Swaminathan, Frank Cano
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Silicon, chemistry, law, Computer science, Transistor, Hardware_INTEGRATEDCIRCUITS, chemistry.chemical_element, Integrated circuit design, Lithography, Algorithm, Simulation, law.invention, Design for manufacturability
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a0cac00d83a2c930841dde78418608ac
https://doi.org/10.1117/12.778836 -
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المؤلفون: Koya Sato, Takeshi Hamamoto, Toshiaki Yanagihara, Jac Condella, Nishath Verghese, Philippe Hurat, Toshiyuki Matsunaga, Atsushi Okamura, Naohiro Kobayashi, Tatsuya Maekawa
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Delay calculation, business.industry, Computer science, Signoff, Semiconductor device fabrication, Transistor, Static timing analysis, Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit, Chip, law.invention, Microprocessor, Semiconductor, CMOS, law, Embedded system, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Miniaturization, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6e6e9d5b30d10c0a53e2db21f5045828
https://doi.org/10.1117/12.773013 -
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المؤلفون: Jac Condella, Carleton DeTar
المصدر: Scopus-Elsevier
مصطلحات موضوعية: Quantum chromodynamics, Quark, Physics, Nuclear and High Energy Physics, Phase transition, Flux tube, High Energy Physics::Lattice, High Energy Physics::Phenomenology, High Energy Physics - Lattice (hep-lat), FOS: Physical sciences, Chiral Potts curve, Deconfinement, High Energy Physics - Lattice, Quantum electrodynamics, Baryon number, Nuclear Experiment, Potts model
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::df0a1d9f71511dcec543157c0296df93