المؤلفون: Su, L.T., Hang Hu, Jacobs, J.B., Sherony, M.J., Wei, A., Antoniadis, D.A.

المصدر: Proceedings of 1994 IEEE International Electron Devices Meeting Electron devices Electron Devices Meeting, 1994. IEDM '94. Technical Digest., International. :649-652 1994

Relation: Proceedings of 1994 IEEE International Electron Devices Meeting

المؤلفون: Jacobs, J.B.

المصدر: Military Review. 04/1988 68:94

مصطلحات موضوعية: BOOK REVIEWS

URL الوصول: http://www.dtic.mil/dtic/aulimp/citations/gsa/1988_143421/91682.html

المؤلفون: Jacobs, J.B., Antoniadis, D.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 42(5):870-875 May, 1995

المؤلفون: Hang Hu, Jacobs, J.B., Su, L.T., Antoniadis, D.A.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 42(4):669-677 Apr, 1995

المؤلفون: Su, L.T., Jacobs, J.B., Chung, J.E., Antoniadis, D.A.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 15(9):366-369 Sep, 1994

المؤلفون: Hang Hu, Jacobs, J.B., Chung, J.E., Antoniadis, D.A.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 15(10):418-420 Oct, 1994

المؤلفون: Jacobs, J.B., Unnikrishnan, S., Grider, T., Thakar, G.V., Joyner, K., Eklund, R.H., Houston, T.W.

المصدر: 1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199) SOI conference SOI Conference, 1998. Proceedings., 1998 IEEE International. :111-112 1998

Relation: 1998 IEEE International SOI Conference Proceedings

المؤلفون: Jacobs, J.B., Schiebel, R., Joyner, K., Houston, T.W.

المصدر: 1997 IEEE International SOI Conference Proceedings SOI conference SOI Conference, 1997. Proceedings., 1997 IEEE International. :68-69 1997

Relation: 1997 IEEE International SOI Conference Proceedings

المؤلفون: Su, L.T., Jacobs, J.B., Chung, J.E., Antoniadis, D.A.

المصدر: Proceedings of 1993 IEEE International SOI Conference SOI conference SOI Conference, 1993. Proceedings., 1993 IEEE International. :112-113 1993

Relation: Proceedings of 1993 IEEE International SOI Conference

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