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1دورية أكاديمية
المؤلفون: James Brown, Kean Hong Tok, Rui Gao, Zhigang Ji, Weidong Zhang, John S. Marsland, Thomas Chiarella, Jacopo Franco, Ben Kaczer, Dimitri Linten, Jian Fu Zhang
المصدر: IEEE Access, Vol 11, Pp 127725-127736 (2023)
مصطلحات موضوعية: Hot carriers, BTI, aging, degradation, lifetime, instability, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
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2
المؤلفون: Ruben Asanovski, Alexander Grill, Jacopo Franco, Pierpaolo Palestri, Arnout Beckers, Ben Kaczer, Luca Selmi
المصدر: IEEE Transactions on Electron Devices. 70:2135-2141
مصطلحات موضوعية: 1/f noise, cryo-CMOS, Cryogenics, Logic gates, MOSFET, Noise measurement, quantum computing, Qubit, Temperature, traps, Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering
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3
المؤلفون: Michiel Vandemaele, Ben Kaczer, Erik Bury, Jacopo Franco, Adrian Chasin, Alexander Makarov, Hans Mertens, Geert Hellings, Guido Groeseneken
المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6e9e103b75b87d8398d643fd14ea1061
https://doi.org/10.1109/irps48203.2023.10118211 -
4
المؤلفون: Zhicheng Wu, Jacopo Franco, Anne Vandooren, Hiroaki Arimura, Lars-Ake Ragnarsson, Philippe Roussel, Ben Kaczer, Dimitri Linten, Nadine Collaert, Guido Groeseneken
المصدر: IEEE Transactions on Electron Devices. 69:915-921
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5
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6
المؤلفون: Dimitri Linten, Philippe Roussel, Z. Wu, Ben Kaczer, Brecht Truijen, Jacopo Franco, Guido Groeseneken
المصدر: IEEE Transactions on Electron Devices. 68:3246-3253
مصطلحات موضوعية: Physics, Electron mobility, Range (particle radiation), Scattering, Oxide, Function (mathematics), State (functional analysis), Electronic, Optical and Magnetic Materials, Stress (mechanics), chemistry.chemical_compound, Charge pumping, chemistry, Electrical and Electronic Engineering, Atomic physics
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7
المؤلفون: E. Dupuy, Geert Mannaert, Ben Kaczer, Jacopo Franco, Vincent De Heyn, Narendra Parihar, Anne Vandooren, Gaspard Hiblot, Sylvain Baudot, Abdelkarim Mercha
المصدر: IEEE Transactions on Device and Materials Reliability. 21:192-198
مصطلحات موضوعية: Materials science, business.industry, Transistor, Plasma, Aspect ratio (image), Electronic, Optical and Magnetic Materials, law.invention, law, Logic gate, Optoelectronics, Degradation (geology), Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Metal gate, NMOS logic, Leakage (electronics)
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8
المصدر: IEEE Transactions on Electron Devices. 68:1454-1460
مصطلحات موضوعية: Technology, Materials science, Passivation, Applied physics, Annealing (metallurgy), Gaussian, 01 natural sciences, Temperature measurement, Molecular physics, Dissociation (chemistry), Physics, Applied, Stress (mechanics), recovery, symbols.namesake, Engineering, 0103 physical sciences, Bulk CMOS technology, Electrical and Electronic Engineering, 010302 applied physics, hot-carrier (HC) degradation, Science & Technology, Hydrogen bond, Physics, Engineering, Electrical & Electronic, poly-Si heater, Si-H bond, Electronic, Optical and Magnetic Materials, Physical Sciences, symbols, high temperature anneal
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9
المؤلفون: Z. Wu, Jacopo Franco, Anne Vandooren, Philippe Roussel, Ben Kaczer, Guido Groeseneken, Nadine Collaert, Dimitri Linten
المصدر: IEEE Transactions on Electron Devices. 68:464-470
مصطلحات موضوعية: 010302 applied physics, Physics, Electron mobility, Condensed matter physics, Transistor, Field (mathematics), 01 natural sciences, Electronic, Optical and Magnetic Materials, law.invention, Temperature instability, law, Constant stress, 0103 physical sciences, Electrical and Electronic Engineering
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10
المؤلفون: Kookjin Lee, Ben Kaczer, Anastasiia Kruv, Mario Gonzalez, Geert Eneman, Oguzhan Orkut Okudur, Alexander Grill, Jacopo Franco, Andrea Vici, Robin Degraeve, Ingrid De Wolf
المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4c47e64e429050ba82146fcc4c5423e0
https://doi.org/10.1109/irps48227.2022.9764540