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المؤلفون: Jacques Gierak, Gilles Raynaud, Caroline Guiziou, Jean René Coudevylle, Ali Madouri, Lars Bruchhaus, Achim Nadzeyka, Björn Whittman, Ralf Jede, Christophe David, Jean Christophe Girard
المصدر: Journal of Vacuum Science & Technology B. 40:052602
مصطلحات موضوعية: Process Chemistry and Technology, Materials Chemistry, Electrical and Electronic Engineering, Instrumentation, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials
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2
المؤلفون: Iosif Sveklo, Jürgen Fassbender, Kamil Postava, J. Jaworowicz, P. Mazalski, E. Bourhis, Jacques Ferré, Jacques Gierak, Jean Pierre Jamet, Nicolas Vernier, Jarosław Kanak, Andrzej Maziewski, M. Kisielewski, Vitalii Zablotskii, Alexandra Mougin
المساهمون: University of Bialystok, Laboratoire de Physique des Solides (LPS), Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11), Institute of Physics [Prague], Czech Academy of Sciences [Prague] (CAS), Laboratoire de photonique et de nanostructures (LPN), Centre National de la Recherche Scientifique (CNRS), Technical University of Ostrava [Ostrava] (VSB), Helmholtz-Zentrum Dresden-Rossendorf (HZDR), AGH University of Science and Technology [Krakow, PL] (AGH UST)
المصدر: Acta Physica Polonica A
Acta Physica Polonica A, Polish Academy of Sciences. Institute of Physics, 2018, ⟨10.12693/aphyspola.133.1215⟩
Acta Physica Polonica A 133(2018)5, 1215-1226مصطلحات موضوعية: Materials science, Physics::Instrumentation and Detectors, Physics::Medical Physics, General Physics and Astronomy, 02 engineering and technology, 01 natural sciences, Focused ion beam, Fluence, Molecular physics, Ion, Condensed Matter::Materials Science, perpendicular anisotropy, Sputtering, 0103 physical sciences, magneto-optic Kerr effect, Irradiation, [PHYS.COND]Physics [physics]/Condensed Matter [cond-mat], 010306 general physics, [PHYS]Physics [physics], magnetic anisotropy, ion irradiation, 021001 nanoscience & nanotechnology, Magnetic hysteresis, magnetic hysteresis, Magnetic anisotropy, topics: ultrathin films, Magneto-optic Kerr effect, magnetism, 0210 nano-technology
وصف الملف: application/pdf
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::709a9d54167e106cde6d4ceec76d11b8
https://hal.archives-ouvertes.fr/hal-02331893/file/ActaPhysicaPolonica133z5p17.pdf -
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المؤلفون: Jean-Louis Oudar, Noelle Gogneau, Li Fang, Jacques Gierak, E. Bourhis
المصدر: Microelectronic Engineering. 129:12-16
مصطلحات موضوعية: Yield (engineering), Materials science, business.industry, Condensed Matter Physics, Engraving, Focused ion beam, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Characterization (materials science), chemistry.chemical_compound, chemistry, Sputtering, visual_art, visual_art.visual_art_medium, Forensic engineering, Indium phosphide, Surface roughness, Optoelectronics, Electrical and Electronic Engineering, Photonics, business
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المؤلفون: Jacques Gierak, Ralf Jede, Lothar Bischoff, Paul Mazarov, L. Bruchhaus
المصدر: Journal of Vacuum Science & Technology B 36(2018)6, 06J101-1-06J101-6
مصطلحات موضوعية: 010302 applied physics, Liquid Metal Ion Source, Liquid metal, Materials science, Process Chemistry and Technology, Polyatomic ion, nongallium, Nanotechnology, 02 engineering and technology, nanoscience, 021001 nanoscience & nanotechnology, 01 natural sciences, Focused ion beam, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Ion, Nanolithography, Physics::Plasma Physics, 0103 physical sciences, Materials Chemistry, Electrical and Electronic Engineering, 0210 nano-technology, Instrumentation, Metal clusters
وصف الملف: application/pdf
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المؤلفون: D. Lucot, Christian Ulysse, E. Bourhis, Juan Pelta, A. Morin, Ralf Jede, Abdelkarim Ouerghi, Loïc Auvray, Gilles Patriarche, L. Bruchhaus, Ali Madouri, Jacques Gierak
المصدر: Microelectronic Engineering. 97:311-316
مصطلحات موضوعية: Materials science, Carving, Ion beam, Graphene, chemistry.chemical_element, Nanotechnology, Substrate (electronics), Condensed Matter Physics, Engraving, Dna translocation, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Nanopore, chemistry, law, visual_art, visual_art.visual_art_medium, Electrical and Electronic Engineering, Gallium
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المؤلفون: Paulo C. Lozano, P. Jegou, Stéphane Guilet, Carla Perez-Martinez, Jacques Gierak
المصدر: Microelectronic Engineering. 88:1968-1971
مصطلحات موضوعية: Materials science, Silicon, Ion beam, business.industry, Analytical chemistry, chemistry.chemical_element, Condensed Matter Physics, Focused ion beam, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Ion, chemistry.chemical_compound, Ion beam deposition, chemistry, Etching (microfabrication), Ionic liquid, Optoelectronics, Electrical and Electronic Engineering, Reactive-ion etching, business
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المؤلفون: Paulo C. Lozano, Carla Perez-Martinez, Stéphane Guilet, Jacques Gierak
المصدر: Microelectronic Engineering. 88:2088-2091
مصطلحات موضوعية: Ion beam, Ion beam mixing, Analytical chemistry, Condensed Matter Physics, Ion gun, Focused ion beam, Atomic and Molecular Physics, and Optics, Ion source, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Ion, chemistry.chemical_compound, Ion beam deposition, chemistry, Chemical physics, Ionic liquid, Electrical and Electronic Engineering
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المؤلفون: Ali Madouri, Jean-Christophe Harmand, E. Bourhis, D. Lucot, Laurent Travers, Jacques Gierak
المصدر: Microelectronic Engineering. 87:1386-1390
مصطلحات موضوعية: congenital, hereditary, and neonatal diseases and abnormalities, Materials science, Ion beam, business.industry, Nanowire, nutritional and metabolic diseases, Physics::Optics, Nanotechnology, Condensed Matter::Mesoscopic Systems and Quantum Hall Effect, Condensed Matter Physics, Epitaxy, Focused ion beam, Atomic and Molecular Physics, and Optics, Ion source, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Condensed Matter::Materials Science, Semiconductor, Etching (microfabrication), Wafer, Electrical and Electronic Engineering, business
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المؤلفون: Christian Ulysse, Gilles Patriarche, Jacques Gierak, Ali Madouri, Ralf Jede, B. Schiedt, D. Lucot, E. Bourhis, Loïc Auvray, L. Bruchhaus, Xavier Lafosse
المصدر: Microscopy Today. 17:14-17
مصطلحات موضوعية: Materials science, General Computer Science, Nanotechnology, Instrumentation, Nanoscopic scale, Focused ion beam
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a0938c66279e432700ba09eec3e95af7
https://doi.org/10.1017/s1551929509000479 -
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المؤلفون: Jacques Gierak, Anne-Laure Biance, Ali Madouri, S. Bauerdick, Gilles Patriarche, E. Bourhis, B. Schiedt, Giancarlo Faini, Loïc Auvray, Ralf Jede, L. Bruchhaus
المصدر: Ultramicroscopy. 109:457-462
مصطلحات موضوعية: Computer science, Nanotechnology, Instrumentation, Focused ion beam, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials