المؤلفون: Jacques Gierak, Gilles Raynaud, Caroline Guiziou, Jean René Coudevylle, Ali Madouri, Lars Bruchhaus, Achim Nadzeyka, Björn Whittman, Ralf Jede, Christophe David, Jean Christophe Girard

المصدر: Journal of Vacuum Science & Technology B. 40:052602

مصطلحات موضوعية: Process Chemistry and Technology, Materials Chemistry, Electrical and Electronic Engineering, Instrumentation, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e07a5bfda54cd5408d892bfca7d4e7c7
https://doi.org/10.1116/6.0002104

المؤلفون: Iosif Sveklo, Jürgen Fassbender, Kamil Postava, J. Jaworowicz, P. Mazalski, E. Bourhis, Jacques Ferré, Jacques Gierak, Jean Pierre Jamet, Nicolas Vernier, Jarosław Kanak, Andrzej Maziewski, M. Kisielewski, Vitalii Zablotskii, Alexandra Mougin

المساهمون: University of Bialystok, Laboratoire de Physique des Solides (LPS), Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11), Institute of Physics [Prague], Czech Academy of Sciences [Prague] (CAS), Laboratoire de photonique et de nanostructures (LPN), Centre National de la Recherche Scientifique (CNRS), Technical University of Ostrava [Ostrava] (VSB), Helmholtz-Zentrum Dresden-Rossendorf (HZDR), AGH University of Science and Technology [Krakow, PL] (AGH UST)

المصدر: Acta Physica Polonica A
Acta Physica Polonica A, Polish Academy of Sciences. Institute of Physics, 2018, ⟨10.12693/aphyspola.133.1215⟩
Acta Physica Polonica A 133(2018)5, 1215-1226

مصطلحات موضوعية: Materials science, Physics::Instrumentation and Detectors, Physics::Medical Physics, General Physics and Astronomy, 02 engineering and technology, 01 natural sciences, Focused ion beam, Fluence, Molecular physics, Ion, Condensed Matter::Materials Science, perpendicular anisotropy, Sputtering, 0103 physical sciences, magneto-optic Kerr effect, Irradiation, [PHYS.COND]Physics [physics]/Condensed Matter [cond-mat], 010306 general physics, [PHYS]Physics [physics], magnetic anisotropy, ion irradiation, 021001 nanoscience & nanotechnology, Magnetic hysteresis, magnetic hysteresis, Magnetic anisotropy, topics: ultrathin films, Magneto-optic Kerr effect, magnetism, 0210 nano-technology

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::709a9d54167e106cde6d4ceec76d11b8
https://hal.archives-ouvertes.fr/hal-02331893/file/ActaPhysicaPolonica133z5p17.pdf

المؤلفون: Jean-Louis Oudar, Noelle Gogneau, Li Fang, Jacques Gierak, E. Bourhis

المصدر: Microelectronic Engineering. 129:12-16

مصطلحات موضوعية: Yield (engineering), Materials science, business.industry, Condensed Matter Physics, Engraving, Focused ion beam, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Characterization (materials science), chemistry.chemical_compound, chemistry, Sputtering, visual_art, visual_art.visual_art_medium, Forensic engineering, Indium phosphide, Surface roughness, Optoelectronics, Electrical and Electronic Engineering, Photonics, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7cb3a1296a7d6393974df5c0a5fb3ac7
https://doi.org/10.1016/j.mee.2014.06.011

المؤلفون: Jacques Gierak, Ralf Jede, Lothar Bischoff, Paul Mazarov, L. Bruchhaus

المصدر: Journal of Vacuum Science & Technology B 36(2018)6, 06J101-1-06J101-6

مصطلحات موضوعية: 010302 applied physics, Liquid Metal Ion Source, Liquid metal, Materials science, Process Chemistry and Technology, Polyatomic ion, nongallium, Nanotechnology, 02 engineering and technology, nanoscience, 021001 nanoscience & nanotechnology, 01 natural sciences, Focused ion beam, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Ion, Nanolithography, Physics::Plasma Physics, 0103 physical sciences, Materials Chemistry, Electrical and Electronic Engineering, 0210 nano-technology, Instrumentation, Metal clusters

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7a5b85edb7942761532c0b3dc581c527
https://doi.org/10.1116/1.5047150

المؤلفون: D. Lucot, Christian Ulysse, E. Bourhis, Juan Pelta, A. Morin, Ralf Jede, Abdelkarim Ouerghi, Loïc Auvray, Gilles Patriarche, L. Bruchhaus, Ali Madouri, Jacques Gierak

المصدر: Microelectronic Engineering. 97:311-316

مصطلحات موضوعية: Materials science, Carving, Ion beam, Graphene, chemistry.chemical_element, Nanotechnology, Substrate (electronics), Condensed Matter Physics, Engraving, Dna translocation, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Nanopore, chemistry, law, visual_art, visual_art.visual_art_medium, Electrical and Electronic Engineering, Gallium

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::468eebbadbd7ceffc3e50a2a3a82328f
https://doi.org/10.1016/j.mee.2012.02.029

المؤلفون: Paulo C. Lozano, P. Jegou, Stéphane Guilet, Carla Perez-Martinez, Jacques Gierak

المصدر: Microelectronic Engineering. 88:1968-1971

مصطلحات موضوعية: Materials science, Silicon, Ion beam, business.industry, Analytical chemistry, chemistry.chemical_element, Condensed Matter Physics, Focused ion beam, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Ion, chemistry.chemical_compound, Ion beam deposition, chemistry, Etching (microfabrication), Ionic liquid, Optoelectronics, Electrical and Electronic Engineering, Reactive-ion etching, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7a4082bdbffb45d448b2f1d59506d20f
https://doi.org/10.1016/j.mee.2010.12.037

المؤلفون: Paulo C. Lozano, Carla Perez-Martinez, Stéphane Guilet, Jacques Gierak

المصدر: Microelectronic Engineering. 88:2088-2091

مصطلحات موضوعية: Ion beam, Ion beam mixing, Analytical chemistry, Condensed Matter Physics, Ion gun, Focused ion beam, Atomic and Molecular Physics, and Optics, Ion source, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Ion, chemistry.chemical_compound, Ion beam deposition, chemistry, Chemical physics, Ionic liquid, Electrical and Electronic Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3caa40280b9f10188f413cab518c5bf3
https://doi.org/10.1016/j.mee.2010.11.042

المؤلفون: Ali Madouri, Jean-Christophe Harmand, E. Bourhis, D. Lucot, Laurent Travers, Jacques Gierak

المصدر: Microelectronic Engineering. 87:1386-1390

مصطلحات موضوعية: congenital, hereditary, and neonatal diseases and abnormalities, Materials science, Ion beam, business.industry, Nanowire, nutritional and metabolic diseases, Physics::Optics, Nanotechnology, Condensed Matter::Mesoscopic Systems and Quantum Hall Effect, Condensed Matter Physics, Epitaxy, Focused ion beam, Atomic and Molecular Physics, and Optics, Ion source, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Condensed Matter::Materials Science, Semiconductor, Etching (microfabrication), Wafer, Electrical and Electronic Engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::af593aae1bcfedefed42bdae5042ef5b
https://doi.org/10.1016/j.mee.2009.11.164

المؤلفون: Christian Ulysse, Gilles Patriarche, Jacques Gierak, Ali Madouri, Ralf Jede, B. Schiedt, D. Lucot, E. Bourhis, Loïc Auvray, L. Bruchhaus, Xavier Lafosse

المصدر: Microscopy Today. 17:14-17

مصطلحات موضوعية: Materials science, General Computer Science, Nanotechnology, Instrumentation, Nanoscopic scale, Focused ion beam

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a0938c66279e432700ba09eec3e95af7
https://doi.org/10.1017/s1551929509000479

المؤلفون: Jacques Gierak, Anne-Laure Biance, Ali Madouri, S. Bauerdick, Gilles Patriarche, E. Bourhis, B. Schiedt, Giancarlo Faini, Loïc Auvray, Ralf Jede, L. Bruchhaus

المصدر: Ultramicroscopy. 109:457-462

مصطلحات موضوعية: Computer science, Nanotechnology, Instrumentation, Focused ion beam, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c10471a55d71e713bb09821a5be4577a
https://doi.org/10.1016/j.ultramic.2008.09.007