المؤلفون: Min-Gun Kim, Jae-Kyoung Mun, Jong-Won Lim, Chung-Hwan Kim, Chang-Seok Lee, Jaejin Lee

المصدر: 1999 IEEE MTT-S International Microwave Symposium Digest (Cat. No.99CH36282) Microwave symposium Microwave Symposium Digest, 1999 IEEE MTT-S International. 2:845-848 vol.2 1999

Relation: 1999 IEEE MTT-S International Microwave Symposium Digest

المؤلفون: Jae Kyoung Mun, Haecheon Kim, Chung-Hwan Kim, Min-Gun Kim, Jae Jin Lee, Kwang-Eui Pyun

المصدر: Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and failure analysis of integrated circuits Physical & Failure Analysis of Integrated Circuits, 1997., Proceedings of the 1997 6th International Symposium on. :260-263 1997

Relation: Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits

المؤلفون: Young-Su Kim, Goo-Young Jeong, Chang-Joo Kim, Dong-du Lee, Jae-Kyoung Mun, Han-Kyu Park, Sang-Sam Choi

المصدر: Proceedings of PIMRC '96 - 7th International Symposium on Personal, Indoor, and Mobile Communications Personal, indoor and mobile radio communications Personal, Indoor and Mobile Radio Communications, 1996. PIMRC'96., Seventh IEEE International Symposium on. 1:49-52 vol.1 1996

Relation: Proceedings of PIMRC '96 - 7th International Symposium on Personal, Indoor, and Mobile Communications

المؤلفون: Jong-Lam Lee, Jae Kyoung Mun, Haecheon Kim, Jae Jin Lee, Hyung-Moo Park, Sin-Chong Park

المصدر: Proceedings of 1994 IEEE GaAs IC Symposium GaAs IC symposium Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1994. Technical Digest 1994., 16th Annual. :133-136 1994

Relation: Proceedings of 1994 IEEE GaAs IC Symposium

المؤلفون: Jong-Lam Lee, Jae Kyoung Mun, Haecheon Kim, Jai-Jin Lee, Hyung-Moo Park

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 43(4):519-526 Apr, 1996

المؤلفون: Jong-Lam Lee, Haecheon Kim, Jae Kyoung Mun, Sung-Jae Maeng

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 19(7):250-252 Jul, 1998

المؤلفون: Jong-Lam Lee, Haecheon Kim, Jae Kyoung Mun, Hae-Gwon Lee, Hyung-Moo Park

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 15(9):324-326 Sep, 1994

المؤلفون: Jae Kyoung Mun, Heejoong Ryou, Kyu Jun Cho, Woojin Chang, Hun Ki Lee

المصدر: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::682d41734da2c3a681e5741cf55ad8f7
https://doi.org/10.1109/edtm53872.2022.9798384

المؤلفون: Jae Kyoung Mun, Woo-Jin Chang, Jae-Won Do, Hyun-Wook Jung, Kyu-Jun Cho

المصدر: ECS Journal of Solid State Science and Technology. 8:Q3079-Q3082

مصطلحات موضوعية: Materials science, Field (physics), business.industry, Breakdown voltage, Optoelectronics, business, Electronic, Optical and Magnetic Materials

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ac0b05cd774f60a768495378231c29fc
https://doi.org/10.1149/2.0151907jss

المؤلفون: Da Jung Lee, Jung Wook Lim, Jae Kyoung Mun, Sun Jin Yun

المصدر: Materials Research Bulletin. 83:597-602

مصطلحات موضوعية: 010302 applied physics, Materials science, Field (physics), business.industry, Mechanical Engineering, Gate dielectric, Analytical chemistry, chemistry.chemical_element, Low leakage, 02 engineering and technology, Dielectric, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Nitrogen, Atomic layer deposition, chemistry, Mechanics of Materials, 0103 physical sciences, Nitrogen gas, Optoelectronics, General Materials Science, Thermal stability, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1eab0f37db1d74a46fc5fe4901c6b251
https://doi.org/10.1016/j.materresbull.2016.07.008