المؤلفون: Byunghak Lee, Sangcheol Kim, Dongchan Kim, Taewoo Kim, Jungyeol Park, Youngho Choe, Youngtag Woo, Euikyu Ryou, Jongoh Kim, Jaechul Om

المصدر: ICVC '99. 6th International Conference on VLSI and CAD (Cat. No.99EX361) VLSI and CAD VLSI and CAD, 1999. ICVC '99. 6th International Conference on. :241-244 1999

Relation: ICVC'99. 6th International Conference on VLSI and CAD

المؤلفون: Jaechul Om, Eunseok Choi, Sejun Kim, Heegee Lee, Yongwook Kim, Heehyun Chang, Sungji Park, Gihyun Bae

المصدر: 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. Reliability physics Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International. :257-259 2005

Relation: 2005 IEEE International Reliability Physics Symposium. Proceedings 43rd Annual

المؤلفون: Youngseok Kwon, Jin-hyock Kim, Sujin Chae, Youngho Lee, Soo Gil Jachun, Jachun Ku, Yongsun Sohn, Sungki Park, Deuk-Sung Choi, Jaechul Om

المصدر: Journal of the Korean Physical Society. 59:466-469

مصطلحات موضوعية: Random access memory, Materials science, business.industry, Doping, Alloy, General Physics and Astronomy, Chemical vapor deposition, engineering.material, Amorphous phase, law.invention, Phase change, law, engineering, Optoelectronics, Crystallization, Data retention, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::000077f48f3aa2c741d33a666e4a3f2b
https://doi.org/10.3938/jkps.59.466

المؤلفون: Byunghak Lee, Sangcheol Kim, Jaechul Om, Jongoh Kim

المصدر: Solid-State Electronics. 44:189-192

مصطلحات موضوعية: Materials science, Oxide, Analytical chemistry, chemistry.chemical_element, Tungsten, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Charge to breakdown, Post annealing, chemistry.chemical_compound, chemistry, Materials Chemistry, Fluorine, Polycide, Electrical and Electronic Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c0140a21b562ddfe38f91c5ec9b7cb26
https://doi.org/10.1016/s0038-1101(99)00216-6

المؤلفون: Youngho Choe, Jongoh Kim, Sangcheol Kim, Jungyeol Park, Euikyu Ryou, Byunghak Lee, Dong-Chan Kim, Jaechul Om, Youngtag Woo, Taewoo Kim

المصدر: ICVC '99. 6th International Conference on VLSI and CAD (Cat. No.99EX361).

مصطلحات موضوعية: Tungsten Compounds, Materials science, Annealing (metallurgy), Thermal resistance, Doping, Analytical chemistry, Oxide, chemistry.chemical_element, Tungsten, chemistry.chemical_compound, chemistry, MOSFET, Electronic engineering, Polycide

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3be605f7e624f283902ec12fd4a0a114
https://doi.org/10.1109/icvc.1999.820892

المؤلفون: Jong-Hun Kim, Hyunho Noh, Khim, Z. G., Kwang Sun Jeon, Young June Park, Hyunseung Yoo, Eunseok Choi, Jaechul Om

المصدر: Applied Physics Letters; 3/31/2008, Vol. 92 Issue 13, p132901, 3p, 1 Black and White Photograph, 1 Diagram, 2 Graphs

مصطلحات موضوعية: NITRIDES, ATOMIC force microscopy, ELECTRONS, MICROSCOPY, PHYSICS research