المؤلفون: JaeSeok Jang, HyungIn Park

المصدر: 한국심리학회지: 산업 및 조직; 호. 31 번호. 1 (2018): 한국심리학회지: 산업 및 조직; 59-80
Korean Journal of Industrial and Organizational Psychology; Vol. 31 No. 1 (2018): Korean Journal of Industrial and Organizational Psychology; 59-80

مصطلحات موضوعية: ComputingMilieux_THECOMPUTINGPROFESSION

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b2e4504012da912c787672074c8a1684
https://journal.ksiop.or.kr/index.php/KJIOP/article/view/5

المؤلفون: Wook Jae Yoo, Joo Hyun Moon, Jae Seok Kim, Bongsoo Lee, Kyoung Won Jang, Sang Hun Shin, Jaeseok Jang, Seung-Hyun Cho, Hyeok In Sim

المصدر: The Transactions of The Korean Institute of Electrical Engineers. 63:1239-1244

مصطلحات موضوعية: Optical fiber, Materials science, Temperature sensing, business.industry, Atmospheric temperature range, Optical time-domain reflectometer, law.invention, Water level, Absorbance, Optics, law, Fiber optic sensor, Reflection (physics), Optoelectronics, Electrical and Electronic Engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::637436c7ee53003f9b38299db3bfbc87
https://doi.org/10.5370/kiee.2014.63.9.1239

المؤلفون: Guwon Kwon, Hyesu Jeon, Seunghan Hong, Seon Geun Kim, Jae Seok Kim, Kyoung Won Jang, Jaeseok Jang, Bongsoo Lee, Sang Hun Shin, Hyeok In Sim, Wook Jae Yoo

المصدر: The Transactions of The Korean Institute of Electrical Engineers. 63:284-290

مصطلحات موضوعية: Physics, Optics, Dual detector, business.industry, Beta (plasma physics), Beta particle, Measure (physics), Gamma ray, Electrical and Electronic Engineering, A fibers, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::36cf061006616ac47d570c4b5be2f25e
https://doi.org/10.5370/kiee.2014.63.2.284

المؤلفون: Jinwoo Jang, Seonsik Kim, Yusuf Cinar, G. H. Jang, Jaeseok Jang

المصدر: Microelectronics Reliability. 53:2043-2051

مصطلحات موضوعية: Engineering, Physics::Instrumentation and Detectors, business.industry, Modal testing, Structural engineering, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Displacement (vector), Finite element method, Computer Science::Other, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Vibration, Memory module, Ball grid array, Soldering, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Computer memory

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::02fbf8fe719f44787b72737550898982
https://doi.org/10.1016/j.microrel.2013.06.018

المؤلفون: Yonghyun Jun, Jinwoo Jang, Seonsik Kim, Jin-Kyu Chang, Yusuf Cinar, Jaeseok Jang, G. H. Jang

المصدر: Microelectronics Reliability. 52:735-743

مصطلحات موضوعية: Materials science, Physics::Instrumentation and Detectors, business.industry, Modal testing, Structural engineering, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Finite element method, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Vibration, Memory module, Soldering, Ball grid array, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Joint (geology), Stress concentration

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fa86d8beb98f1085240dc4813a2061b8
https://doi.org/10.1016/j.microrel.2011.11.015

المؤلفون: Jaeseok Jang, Ohchoon Kwon, Jun-woo Cho

المصدر: Heart, Lung and Circulation. 27:S509

مصطلحات موضوعية: Pulmonary and Respiratory Medicine, business.industry, Mesenchymal stem cell, Rat model, 02 engineering and technology, 010402 general chemistry, 021001 nanoscience & nanotechnology, 01 natural sciences, 0104 chemical sciences, Cell biology, HUMAN THYMUS, Medicine, 0210 nano-technology, Cardiology and Cardiovascular Medicine, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a5b64760a8c744410341373cbec1e15a
https://doi.org/10.1016/j.hlc.2018.04.024

المؤلفون: B.J. Kwon, Yongjo Kim, E.K. Kwon, J.S. Jeon, Han-Gu Kim, W.H. Bong, Il-Hun Son, Jaeseok Jang

المصدر: Microelectronics Reliability. 46:1634-1637

مصطلحات موضوعية: Engineering, Electrostatic discharge, business.industry, Transistor, Electrical engineering, High voltage, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, law, Robustness (computer science), Electronic engineering, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, NMOS logic

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::654830cca26cb678d392ee18b0f36531
https://doi.org/10.1016/j.microrel.2006.07.033

المؤلفون: Oh, Seon Ho, Jaeseok Jang, Kyungho Jang, Jung, Soon Ki

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ea892cbfcf470a45edf28353baad805b