المؤلفون: Shen De Wang, Tzu Yun Chang, Chao Hsin Chien, Wei Hsiang Lo, Jen Yi Sang, Jam Wen Lee, Tan Fu Lei

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 26(7):467-469 Jul, 2005

المؤلفون: Shao-Ming Yu, Jam-Wen Lee, Yiming Li

المصدر: Microelectronic Engineering. 84:213-217

مصطلحات موضوعية: Very-large-scale integration, Electrostatic discharge, Materials science, business.industry, Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, chemistry.chemical_compound, Electrostatic discharge protection, CMOS, chemistry, Nanoelectronics, law, Silicide, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, System on a chip, Electrical and Electronic Engineering, business, Hardware_LOGICDESIGN

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1da395ade44ecf5b86bc74cb510a9bb5
https://doi.org/10.1016/j.mee.2006.02.006

المؤلفون: Jam Wen Lee, Chao Hsin Chien, Jen Yi Sang, Wei Hsiang Lo, Shen De Wang, Tzu Yun Chang, Tan Fu Lei

المصدر: IEEE Electron Device Letters. 26:467-469

مصطلحات موضوعية: Materials science, business.industry, Transistor, chemistry.chemical_element, Buffer (optical fiber), Electronic, Optical and Magnetic Materials, law.invention, Reliability (semiconductor), chemistry, law, Thin-film transistor, Fluorine, Electronic engineering, Optoelectronics, Electrical and Electronic Engineering, business, Layer (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a5b441cf09bc9e7a6380767f80a7f090
https://doi.org/10.1109/led.2005.851242

المؤلفون: Wei-Cheng Chen, Tan Fu Lei, Kuan-Lin Yeh, Jam-Wen Lee, Ming-Shan Shieh, Chih-Yang Chen, Hsiao-yi Li, Shen-De Wang

المصدر: 2006 IEEE International Reliability Physics Symposium Proceedings.

مصطلحات موضوعية: Plasma etching, Materials science, Silicon, business.industry, Electrical engineering, chemistry.chemical_element, Plasma, Stress (mechanics), Reliability (semiconductor), chemistry, Thin-film transistor, Optoelectronics, Degradation (geology), Antenna (radio), business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::11c3926c1b67a4b833354f10e6640a91
https://doi.org/10.1109/relphy.2006.251338

المؤلفون: Chih-Yang Chen, Shen-De Wang, Ming-Shan Shieh, Wei-Cheng Chen, Hsiao-Yi Lin, Kuan-Lin Yeh, Jam-Wen Lee, Tan-Fu Lei

المصدر: 2006 IEEE International Reliability Physics Symposium Proceedings; 2006, p713-714, 2p