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1
المؤلفون: Ukjin Jung, Young Gon Lee, James Walter Blatchford, Brian K. Kirkpatrick, Hiroaki Niimi, Younggy Kim, Seung-Chul Song, Jin Ju Kim, Byoung Hun Lee
المصدر: Microelectronic Engineering. 142:1-6
مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Materials science, business.industry, Polysilicon depletion effect, Gate dielectric, Time-dependent gate oxide breakdown, Equivalent oxide thickness, Hardware_PERFORMANCEANDRELIABILITY, Condensed Matter Physics, Capacitance, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Hardware_GENERAL, Gate oxide, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Electrical and Electronic Engineering, business, Metal gate, Hardware_LOGICDESIGN, Leakage (electronics)
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2
المؤلفون: Christopher L. Hinkle, K. van Benthem, James Walter Blatchford, Eric M. Vogel, Timothy J. Pennycook, Weidong Luo, J. B. Shaw, Amitabh Jain, Andrew M. Thron, Deborah J. Riley, Jack Chan
المصدر: Acta materialia
مصطلحات موضوعية: Materials science, Polymers and Plastics, Physics, Diffusion, Schottky barrier, Metals and Alloys, Substrate (electronics), Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, Crystallography, chemistry, Chemical physics, Metastability, Silicide, Scanning transmission electron microscopy, Ceramics and Composites, Engineering sciences. Technology, Layer (electronics), Stoichiometry
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3
المؤلفون: Seung-Chul Song, James Walter Blatchford
المصدر: Electronic Materials Letters. 7:277-285
مصطلحات موضوعية: Reduction (complexity), Electron mobility, Materials science, CMOS, Schottky barrier, Parasitic element, Nanotechnology, Node (circuits), Engineering physics, Capacitance, Electronic, Optical and Magnetic Materials, Communication channel
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4
المؤلفون: Scott Jessen, James Walter Blatchford, Steven L. Prins, Ki-Ho Baik, Linyong Pang, Bob Gleason, Thuc Dam
المصدر: ECS Transactions. 27:449-454
مصطلحات موضوعية: Set (abstract data type), Scheme (programming language), Computer science, Hardware_INTEGRATEDCIRCUITS, Wafer, Node (circuits), Function (mathematics), Topology, computer, Scaling, computer.programming_language
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5
المؤلفون: Byoung Hun Lee, Hiroaki Niimi, Brian K. Kirkpatrick, Kwan-Yong Lim, Chang Goo Kang, Yonghun Kim, James Walter Blatchford, Young Gon Lee, Jin Ju Kim, Ukjin Jung, Seung Chul Song, Minwoo Kim
المصدر: IEEE Electron Device Letters. 33:1303-1305
مصطلحات موضوعية: Materials science, business.industry, Voltage coefficient, Analytical chemistry, Dielectric, Capacitance, Electronic, Optical and Magnetic Materials, law.invention, Impedance analyzer, Capacitor, law, Optoelectronics, Time domain, Electrical and Electronic Engineering, business, Reflectometry, Electrical impedance
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6
المؤلفون: R. A. Chapman, Kwan-Yong Lim, Amitabh Jain, Christopher L. Hinkle, J. B. Shaw, Javier Mendez, Deborah J. Riley, Eric M. Vogel, Jack Chan, James Walter Blatchford, Seung-Chul Song
المصدر: 2012 12th International Workshop on Junction Technology.
مصطلحات موضوعية: Materials science, Equivalent series resistance, CMOS, Annealing (metallurgy), business.industry, Contact resistance, Metallurgy, Optoelectronics, Schottky diode, New materials, Thermal stability, Work function, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::97cba6f9044b1ebc0402778354cc239c
https://doi.org/10.1109/iwjt.2012.6212840 -
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المؤلفون: Linyong Pang, Scott Jessen, Bob Gleason, Thuc Dam, Guangming Xiao, Steve Prins, Simon Chang, James Walter Blatchford
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Resolution enhancement technologies, Pixel, Computer science, Numerical aperture, Visualization, Metal, Logic gate, visual_art, visual_art.visual_art_medium, Process window, Algorithm, Lithography, Random logic, Simulation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ebbc0de05d94d65f1cea3a050d548c8f
https://doi.org/10.1117/12.814197 -
8
المؤلفون: Qi-Zhong Hong, Oluwamuyiwa Oluwagbemiga Olubuyide, James Walter Blatchford, Li Lin, Ricardo Borges, Steven L. Prins, T. S. Kim, Deborah J. Riley, Simon Chang
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Standard cell, Resolution enhancement technologies, Computer science, business.industry, Transistor, Process (computing), Context (language use), law.invention, Variable (computer science), Optics, Strain engineering, law, Logic gate, Electronic engineering, Cmos process, business, Lithography, Scaling
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cb495412ea5ac987bfae30e49a5e1d31
https://doi.org/10.1117/12.814947 -
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المؤلفون: Shaofeng Yu, Brian K. Kirkpatrick, O'brien Corey Rollin, Larry Liu, Rajesh Khamankar, Oluwamuyiwa Oluwagbemiga Olubuyide, Deborah J. Riley, Anand T. Krishnan, I. Fujii, C. Machala, Clinton L. Montgomery, Brian Hornung, H. Bu, Yiming Gu, Steven L. Prins, T. Lowry, K. Kirmse, James Walter Blatchford, Tad Grider, C. Bowen, G. Shinn, D. Corum, C. Lin, Tony Tae-Hyoung Kim
المصدر: 2008 Symposium on VLSI Technology.
مصطلحات موضوعية: Surface-mount technology, Materials science, business.industry, Silicon-germanium, PMOS logic, chemistry.chemical_compound, chemistry, Logic gate, Electronic engineering, Optoelectronics, System on a chip, Process optimization, Static random-access memory, business, NMOS logic
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e24ec331746ae0843044248c5da8aaa5
https://doi.org/10.1109/vlsit.2008.4588608 -
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المؤلفون: Yiming Gu, Scott Jessen, Chris Sallee, James Walter Blatchford, Steve Prins, Simon Chang, Dale Legband, Mark D. Smith
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Scanning electron microscope, Computer science, Process (computing), Electronic packaging, Photoresist, law.invention, Design for manufacturability, Computer engineering, Optical proximity correction, Resist, law, Hardware_INTEGRATEDCIRCUITS, Node (circuits), Wafer, Process window, Photolithography, Lithography, Simulation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9c536ff7db7fef3b3f338c5ccdc0edb8
https://doi.org/10.1117/12.772685