يعرض 1 - 10 نتائج من 471 نتيجة بحث عن '"Jang, S.M"', وقت الاستعلام: 0.90s تنقيح النتائج
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    دورية أكاديمية

    المؤلفون: Han, H., Cho, H.C., Jang, S.M., Choi, C.

    المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 43(3):430-433 Mar, 2022

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    مؤتمر

    المصدر: 2011 IEEE Custom Integrated Circuits Conference (CICC) Custom Integrated Circuits Conference (CICC), 2011 IEEE. :1-5 Sep, 2011

    Relation: 2011 IEEE Custom Integrated Circuits Conference - CICC 2011

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    مؤتمر

    المصدر: 2006 IEEE Radio and Wireless Symposium Radio and Wireless Symposium Radio and Wireless Symposium, 2006 IEEE. :171-174 2006

    Relation: 2006 IEEE Radio and Wireless Symposium

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    مؤتمر

    المؤلفون: Jang, S.M., Choi, J.Y., You, D.J., Yang, H.S.

    المصدر: IEEE International Conference on Electric Machines and Drives, 2005. Electric Machines and Drives Electric Machines and Drives, 2005 IEEE International Conference on. :1204-1211 2005

    Relation: International Electric Machines and Drives Conference

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    مؤتمر

    المؤلفون: Jang, S.M., Choi, J.Y., Cho, H.W., Lee, S.H.

    المصدر: IEEE International Conference on Electric Machines and Drives, 2005. Electric Machines and Drives Electric Machines and Drives, 2005 IEEE International Conference on. :1225-1232 2005

    Relation: International Electric Machines and Drives Conference

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    مؤتمر

    المؤلفون: Jang, S.M., You, D.J., Jang, W.B., Han, S.C.

    المصدر: Fourtieth IAS Annual Meeting. Conference Record of the 2005 Industry Applications Conference, 2005. Industry Applications Conference Industry Applications Conference, 2005. Fourtieth IAS Annual Meeting. Conference Record of the 2005. 3:2125-2131 Vol. 3 2005

    Relation: Conference Record of the 2005 IEEE Industry Applications Conference Fortieth IAS Annual Meeting

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    مؤتمر

    المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :31-34 2005

    Relation: International Electron Devices Meeting 2005