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1دورية أكاديمية
المؤلفون: Kuo-Ching Huang, Yean-Kuen Fang, Dun-Nian Yaung, Chii-Wen Chen, Mong-Song Liang, Jang-Cheng Hsieh, Chi-Wen Su, Kuei-Ying Lee
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 20(1):36-38 Jan, 1999
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2دورية أكاديمية
المؤلفون: Kan-Yuan Lee, Yean-Kuen Fang, Chii-Wen Chen, Mong-Song Liang, Jang-Cheng Hsieh
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 18(5):181-183 May, 1997
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3
المؤلفون: Yi-Ming Sheu, Sheng-Jier Yang, Chung-Yun Cheng, Jang-Cheng Hsieh, Yean-Kuen Fang, H. Hsia
المصدر: IEEE Transactions on Electron Devices. 56:1618-1623
مصطلحات موضوعية: Materials science, Silicon, business.industry, fungi, Electrical engineering, chemistry.chemical_element, Electronic, Optical and Magnetic Materials, Silicon-germanium, Stress (mechanics), chemistry.chemical_compound, Distance measurement, chemistry, Logic gate, MOSFET, Optoelectronics, Semiconductor alloys, Electrical and Electronic Engineering, business, Thin oxide
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4
المؤلفون: Chung-Hui Chen, Jang-Cheng Hsieh, Yean-Kuen Fang, Chih-Wei Yang, Chun-Sheng Lin
المصدر: Solid-State Electronics. 45:199-203
مصطلحات موضوعية: Interconnection, Materials science, business.industry, Copper interconnect, Dielectric, Integrated circuit, Condensed Matter Physics, Cutoff frequency, Electronic, Optical and Magnetic Materials, law.invention, law, Process integration, Hardware_INTEGRATEDCIRCUITS, Materials Chemistry, Electronic engineering, Optoelectronics, Electrical and Electronic Engineering, business, Air gap (plumbing)
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5
المؤلفون: Jang-Cheng Hsieh, Dun-Nian Yaung, Chii-Wen Chen, Yean-Kuen Fang, Mong-Song Liang, Chi-Wen Su, Kuo-Ching Huang, Kuei-Ying Lee
المصدر: IEEE Electron Device Letters. 20:36-38
مصطلحات موضوعية: Materials science, business.industry, Transistor, Electrical engineering, chemistry.chemical_element, Hardware_PERFORMANCEANDRELIABILITY, Sputter deposition, Tungsten, Capacitance, Electronic, Optical and Magnetic Materials, law.invention, chemistry, CMOS, law, MOSFET, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Polycide, Electrical and Electronic Engineering, business, Leakage (electronics)
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6
المؤلفون: Mong-Song Liang, Chii-Wen Chen, Yean-Kuen Fang, Jang-Cheng Hsieh, Kan-Yuan Lee
المصدر: IEEE Electron Device Letters. 18:181-183
مصطلحات موضوعية: Amorphous silicon, Materials science, Silicon, business.industry, Polysilicon depletion effect, Doping, chemistry.chemical_element, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, chemistry, Gate oxide, Electronic engineering, Optoelectronics, Polycide, Electrical and Electronic Engineering, business, Metal gate, Sheet resistance
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7
المؤلفون: Shyue-Shyh Lin, Chung-Yun Cheng, Chin-Shan Hou, Harry Hsia, Wei-Ming Chen, Yi-Ming Sheu, Yean-Kuen Fang, Jang-Cheng Hsieh
المصدر: Japanese Journal of Applied Physics. 48:04C033
مصطلحات موضوعية: Materials science, Physics and Astronomy (miscellaneous), business.industry, Stress induced, Transistor, General Engineering, General Physics and Astronomy, Nanotechnology, Length dependence, law.invention, Metal, Oxide semiconductor, law, visual_art, Trench, visual_art.visual_art_medium, Optoelectronics, Field-effect transistor, business, Technology CAD
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8
المصدر: Japanese Journal of Applied Physics. 38:L1091
مصطلحات موضوعية: Materials science, business.industry, General Engineering, Oxide, General Physics and Astronomy, Dichlorosilane, chemistry.chemical_element, Chemical vapor deposition, Tungsten, chemistry.chemical_compound, chemistry, Thermal, Optoelectronics, Polycide, Rapid thermal annealing, business
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9
المؤلفون: Jang-Cheng Hsieh, Chii-Wen Chen, Kan-Yuan Lee, Yean-Kuen Fang, Mong-Song Liang
المصدر: Japanese Journal of Applied Physics. 35:2590
مصطلحات موضوعية: Materials science, business.industry, Transistor, Gate dielectric, General Engineering, General Physics and Astronomy, law.invention, Secondary ion mass spectrometry, Gate oxide, law, MOSFET, Optoelectronics, Field-effect transistor, Polycide, business, Metal gate
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10دورية أكاديمية
المؤلفون: Chung-Yun Cheng, Yean-Kuen Fang, Jang-Cheng Hsieh, Sheng-Jier Yang, Yi-Ming Sheu, Hsia, Harry
المصدر: IEEE Transactions on Electron Devices; Aug2009, Vol. 56 Issue 8, p1618-1623, 6p, 1 Diagram, 2 Charts, 6 Graphs