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المؤلفون: David Reynolds, Alan Lyon, Giovanni Pareschi, Benjamin Stripe, Sharon Chen, Janos Kirz, Wenbing Yun, Vladimir Semenov, Ali M. Khounsary, Richard Ian Spink
المصدر: Advances in Laboratory-based X-Ray Sources, Optics, and Applications VI.
مصطلحات موضوعية: Brightness, Interferometry, Liquid metal, Materials science, Thermal conductivity, Optics, business.industry, Phase-contrast imaging, Substrate (printing), Microbeam, business, Anode
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c1a16d97ba2938254895328a6676c6af
https://doi.org/10.1117/12.2273042 -
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المؤلفون: Sharon Chen, Sylvia Jy Lewis, Ian Spink, Vladimir Semenov, Janos Kirz, S. H. Lau, Benjamin Stripe, Wenbing Yun, David Reynolds, Alan Lyon
المصدر: International Symposium for Testing and Failure Analysis.
مصطلحات موضوعية: Trace (semiology), Metallurgy, Micron scale, Environmental science, Wafer, Contamination
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::60834e7ca65760ed92d731718ccea7f3
https://doi.org/10.31399/asm.cp.istfa2016p0485 -
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المؤلفون: Mannudeep K. Kalra, Ge Wang, James S. Michaelson, Bert Müller, Sylvia Jia Yun Lewis, Qingsong Yang, Stuart R. Stock, Janos Kirz, Wenxiang Cong, Wenbing Yun
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Medical diagnostic, medicine.medical_specialty, Materials science, medicine.diagnostic_test, business.industry, media_common.quotation_subject, X-ray, High resolution, Histology, Computed tomography, Margin (machine learning), medicine, Contrast (vision), Medical physics, Nuclear medicine, business, Ct reconstruction, media_common
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bd1e62cbeef0d82379881c365c150fd8
https://doi.org/10.1117/12.2238147 -
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المؤلفون: Sylvia Jia Yun Lewis, S. H. Lau, Jeff Gelb, Janos Kirz, Wenbing Yun, Srivatsan Seshadri
المصدر: Microscopy and Microanalysis. 24:1008-1009
مصطلحات موضوعية: Chemical state, X-ray absorption spectroscopy, Materials science, Extended X-ray absorption fine structure, Spectrometer, X-ray, Analytical chemistry, Absorption (electromagnetic radiation), Instrumentation, Throughput (business), XANES
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المؤلفون: Wenbing Yun, Sylvia Jia Yun Lewis, S. H. Lau, Janos Kirz, Jeff Gelb
المصدر: Microscopy and Microanalysis. 24:358-359
مصطلحات موضوعية: 0301 basic medicine, 030103 biophysics, 03 medical and health sciences, Materials science, Nuclear magnetic resonance, Correlative microscopy, X ray analysis, Instrumentation
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المؤلفون: Sylvia Jia Yun Lewis, Janos Kirz, Wenbing Yun, Benjamin Stripe, Mark Cordier
المصدر: Microscopy and Microanalysis. 24:304-305
مصطلحات موضوعية: Optics, Materials science, business.industry, Generation x, High resolution, business, Instrumentation, Ray
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المؤلفون: Janos Kirz, David Robin, Matthew A. Marcus, M. P. Hertlein, G. Portmann, Changchun Sun
المصدر: Synchrotron Radiation News. 26:9-13
مصطلحات موضوعية: Physics, Nuclear and High Energy Physics, Brightness, business.industry, Electron, Nanosecond, Laser, Atomic and Molecular Physics, and Optics, Synchrotron, law.invention, Pulse (physics), Optics, Bunches, law, Electron bunches, Physics::Accelerator Physics, business
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المؤلفون: Sylvia Jy Lewis, Janos Kirz, Ian Spink, Benjamin Stripe, Wenbing Yun, Alan Lyon, Dave Reynolds, Sharon Chen
المصدر: High-Brightness Sources and Light-Driven Interactions.
مصطلحات موضوعية: Physics, business.industry, Scattering, X-ray, Diamond, engineering.material, Microstructure, Anode, Linear array, Optics, Thermal, engineering, Current (fluid), business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fc3bdc9247dce595481f8eb24b16a7fe
https://doi.org/10.1364/euvxray.2016.em4a.2 -
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المؤلفون: Malcolm R. Howells, Michael Feser, J. Rudati, Wenbing Yun, Janos Kirz
المصدر: Journal of Synchrotron Radiation. 19:751-758
مصطلحات موضوعية: Nuclear and High Energy Physics, Radiation, Materials science, Microscope, business.industry, Sample (graphics), Wide field, Synchrotron, Bending magnets, law.invention, Optics, Beamline, law, Tomography, business, Instrumentation, X-ray microscope
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8182cae836f9e6cc57c32bc3e03ae7fb
https://doi.org/10.1107/s0909049512023813 -
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المؤلفون: David Reynolds, Sylvia Jy Lewis, Richard Ian Spink, S. H. Lau, Janos Kirz, Alan Lyon, Benjamin Stripe, Wenbing Yun
المصدر: Microscopy and Microanalysis. 23:44-45
مصطلحات موضوعية: Materials science, Scale (ratio), La icp ms, Analytical chemistry, X-ray, Spectroscopy, Instrumentation, Sensitivity (electronics)