المؤلفون: Mierla, M., Zhukov, A. N., Berghmans, D., Parenti, S., Auchere, F., Heinzel, P., Seaton, D. B., Palmerio, E., Jejcic, S., Janssens, J., Kraaikamp, E., Nicula, B., Long, D. M., Hayes, L. A., Jebaraj, I. C., Talpeanu, D. -C., D'Huys, E., Dolla, L., Gissot, S., Magdalenic, J., Rodriguez, L., Shestov, S., Stegen, K., Verbeeck, C., Sasso, C., Romoli, M., Andretta, V.

المصدر: A&A 662, L5 (2022)

مصطلحات موضوعية: Astrophysics - Solar and Stellar Astrophysics

URL الوصول: http://arxiv.org/abs/2205.15214

المؤلفون: Daniels, L. J.^{Aff1, Aff4}, Macindoe, C., Koutsifeli, P., Annandale, M., James, S. L., Watson, L. E., Coffey, S., Raaijmakers, A. J. A., Weeks, K. L.^{Aff2, Aff5}, Bell, J. R.^{Aff2, Aff6}, Janssens, J. V., Curl, C. L., Delbridge, L. M. D., Mellor, Kimberley M.^{Aff1, Aff2, Aff3, IDs41598023394993_cor14}

المصدر: Scientific Reports. 13(1)

المؤلفون: Riemersma, I. (ORCID 0000-0001-6267-5466), Van Santvoort, F. (ORCID 0000-0002-7600-5081), Van Doesum, K. T. M., Hosman, C. M. H., Janssens, J. M. A. M., Weeland, M., Otten, R.

المصدر: Journal of Intellectual Disabilities. Dec 2022 26(4):811-823.

Peer Reviewed: Y

Page Count: 13

Descriptors: Parents, Mental Disorders, Mild Intellectual Disability, At Risk Persons, Behavior Problems, Child Behavior, Questionnaires, Screening Tests, Interpersonal Competence, Emotional Problems, Foreign Countries

مصطلحات جغرافية: Netherlands

Assessment and Survey Identifiers: Strengths and Difficulties Questionnaire

المؤلفون: Riemersma, Ivon (ORCID 0000-0001-6267-5466), Van Santvoort, F., Van Doesum, K. T. M., Hosman, C. M. H., Janssens, J. M. A. M., Van der Zanden, R. A. P., Otten, R.

المصدر: Journal of Intellectual Disabilities. Mar 2022 26(1):70-89.

Peer Reviewed: Y

Page Count: 20

Descriptors: Mild Intellectual Disability, Emotional Problems, Behavior Problems, Parents, Mental Disorders, At Risk Persons, Risk Management, Program Effectiveness, Intervention, Behavior Modification, Emotional Response, Adolescents, Young Adults, Foreign Countries, Preadolescents

مصطلحات جغرافية: Netherlands

Assessment and Survey Identifiers: Strengths and Difficulties Questionnaire, Self Perception Profile for Adolescents

المؤلفون: Kruglanski, M., De Donder, E., Glover, A., Borries, C., Janssens, J.

المصدر: 2015 International Association of Institutes of Navigation World Congress (IAIN) Navigation World Congress (IAIN), 2015 International Association of Institutes of. :1-5 Oct, 2015

Relation: 2015 International Association of Institutes of Navigation World Congress (IAIN)

المؤلفون: Van Poecke, S, Negri, A, Janssens, J, Solaroli, N, Karlsson, A, Gago, F, Balzarini, J, Van Calenbergh, S

المصدر: Organic & biomolecular chemistry. 9(3):892-901

مصطلحات موضوعية: Medicin och hälsovetenskap

URL الوصول: http://kipublications.ki.se/Default.aspx?queryparsed=id:121848120

المؤلفون: Jacobs, P., Janssens, J., Geurts, T., Crols, J.

المصدر: ESSCIRC 2004 - 29th European Solid-State Circuits Conference (IEEE Cat. No.03EX705) Solid-state circuits Solid-State Circuits Conference, 2003. ESSCIRC '03. Proceedings of the 29th European. :425-428 2003

Relation: ESSCIRC 2004 - 29th European Solid-State Circuits Conference

المؤلفون: Mercy, M., Grassion, L., Pontier, S., Patout, M., Luque, R., Delafosse, C., Raherison-Semjen, C., Maître, B., Duthoit, L., Mendoza, A., Jacquin, L., Borel, J.C., Cervantes, P., Janssens, J.-P., Chabot, J.-F., Morelot-Panzini, C., Jaffuel, D., Rabec, C., Gonzalez-Bermejo, J.

المصدر: In Respiratory Medicine and Research November 2020 78

المؤلفون: Janssens, J., Steyaert, M., Ohguro, T.

المصدر: Proceedings of the 24th European Solid-State Circuits Conference Solid-State Circuits Conference, 1998. ESSCIRC '98. Proceedings of the 24th European. :56-59 1998

Relation: 24th European Solid-State Circuits Conference

المؤلفون: Janssens, J., Crols, J., Steyaert, M.

المصدر: Proceedings of the IEEE 1998 Custom Integrated Circuits Conference (Cat. No.98CH36143) Custom integrated circuits Custom Integrated Circuits Conference, 1998. Proceedings of the IEEE 1998. :75-78 1998

Relation: Proceedings of the IEEE 1998 Custom Integrated Circuits Conference