المؤلفون: Jarwala, N., Rutkowski, P.W., Shianling Wu, Chi Yau

المصدر: Proceedings of the Fifth Asian Test Symposium (ATS'96) Asian test symposium Test Symposium, 1996., Proceedings of the Fifth Asian. :251-256 1996

Relation: Proceedings of the Fifth Asian Test Symposium (ATS'96)

المؤلفون: Wuudiann Ke, Duy Le, Jarwala, N.

المصدر: Proceedings of 1995 IEEE International Test Conference (ITC) International test conference Test Conference, 1995. Proceedings., International. :789-796 1995

Relation: Proceedings of 1995 IEEE International Test Conference (ITC)

المؤلفون: Jarwala, N.

المصدر: Proceedings., International Test Conference International test conference 1994 Test Conference, 1994. Proceedings., International. :446-455 1994

Relation: Proceedings of International Test Conference

المؤلفون: Yau, C.W., Jarwala, N.

المصدر: Proceedings. International Test Conference 1990 Test Conference, 1990. Proceedings., International. :311-315 1990

Relation: 1990 International Test Conference

المؤلفون: Konemann, B., Bennetts, B., Jarwala, N., Nadeau-Dostie, B.

المصدر: Computer. 29(11):39-45 Nov, 1996

المؤلفون: Jarwala, N., Chi W. Yau, Stiling, P., Tammaru, E.

المصدر: Proceedings International Test Conference 1992 Test Conference, 1992. Proceedings., International. :993 1992

Relation: Proceedings International Test Conference 1992

المؤلفون: Jarwala, N., Chi W. Yau

المصدر: 1991, Proceedings. International Test Conference Test Conference, 1991, Proceedings., International. :649 1991

Relation: 1991, Proceedings. International Test Conference

المؤلفون: Jarwala, N., Yau, C.W.

المصدر: Proceedings. 'Meeting the Tests of Time'., International Test Conference Test Conference, 1989. Proceedings. Meeting the Tests of Time., International. :63-70 1989

Relation: 1989 International Test Conference

المؤلفون: Yau, C.W., Jarwala, N.

المصدر: Proceedings. 'Meeting the Tests of Time'., International Test Conference Test Conference, 1989. Proceedings. Meeting the Tests of Time., International. :71-77 1989

Relation: 1989 International Test Conference

المؤلفون: Zorian, Y., Jarwala, N.

المصدر: Proceedings 1989 IEEE International Conference on Computer Design: VLSI in Computers and Processors Computer Design: VLSI in Computers and Processors, 1989. ICCD '89. Proceedings., 1989 IEEE International Conference on. :580-584 1989

Relation: Proceedings 1989 IEEE International Conference on Computer Design: VLSI in Computers and Processors