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1دورية أكاديمية
المؤلفون: Leurquin, C., Vandendaele, W., Jaud, M., Lavieville, R., Mohamad, B., Masante, C., Despesse, G., Nowak, E.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(5):3123-3129 May, 2024
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2مؤتمر
المؤلفون: Piotrowic, C., Mohamad, B., Rocha, P. Fernandes Paes Pinto, Malbert, N., Ruel, S., Pimenta-Barros, P., Jaud, M.-A., Vauche, L., Royer, C. Le
المصدر: 2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2023 35th International Symposium on. :382-385 May, 2023
Relation: 2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
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3مؤتمر
المؤلفون: Vandendaele, W., Jaud, M.-A., Viey, A. G., Mohamad, B., Royer, C. Le, Vauche, L., Constant, A., Modica, R., Iucolano, F., Gwoziecki, R.
المصدر: 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2022 IEEE 34th International Symposium on. :345-348 May, 2022
Relation: 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
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4مؤتمر
المؤلفون: Le Royer, C., Mohamad, B., Biscarrat, J., Vauche, L., Escoffier, R., Buckley, J., Becu, S., Riat, R., Gillot, C., Charles, M., Ruel, S., Pimenta-Barros, P., Posseme, N., Besson, P., Boudaa, F., Vannuffel, C., Vandendaele, W., Viey, A.G., Krakovinsky, A., Jaud, M.-A., Modica, R., Iucolano, F., Tiec, R. Le, Levi, S., Orsatelli, M., Gwoziecki, R., Sousa, V.
المصدر: 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2022 IEEE 34th International Symposium on. :49-52 May, 2022
Relation: 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
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5مؤتمر
المؤلفون: Rrustemi, B., Viey, A. G., Jaud, M.-A., Triozon, F., Vandendaele, W., Leroux, C., Cluzel, J., Martin, S., Le Royer, C., Gwoziecki, R., Modica, R., Iucolano, F., Gaillard, F., Poiroux, T., Ghibaudo, G.
المصدر: ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2021 - IEEE 51st European. :295-298 Sep, 2021
Relation: ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC)
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6دورية أكاديمية
المؤلفون: Jaud, M.-., Vandendaele, W., Rrustemi, B., Viey, A.G., Martin, S., Le Royer, C., Vauche, L., Martinie, S., Gwoziecki, R., Modica, R., Iucolano, F., Poiroux, T.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(2):669-674 Feb, 2022
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7مؤتمر
المؤلفون: Jaud, M. -A., Vandendaele, W., Rrustemi, B., Viey, A. G., Martin, S., Le Royer, C., Vauche, L., Martinie, S., Morvan, E., Gwoziecki, R., Modica, R., Iucolano, F., Plissonnier, M., Poiroux, T.
المصدر: 2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2021 33rd International Symposium on. :319-322 May, 2021
Relation: 2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD)
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8مؤتمر
المؤلفون: Viey, A.G., Vandendaele, W., Jaud, M.-A., Coignus, J., Cluzel, J., Krakovinsky, A., Martin, S., Biscarrat, J., Gwoziecki, R., Sousa, V., Gaillard, F., Modica, R., Iucolano, F., Meneghini, M., Meneghesso, G., Ghibaudo, G.
المصدر: 2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-8 Mar, 2021
Relation: 2021 IEEE International Reliability Physics Symposium (IRPS)
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9دورية أكاديمية
المؤلفون: Viey, A.G., Vandendaele, W., Jaud, M., Gerrer, L., Garros, X., Cluzel, J., Martin, S., Krakovinsky, A., Biscarrat, J., Gwoziecki, R., Plissonnier, M., Gaillard, F., Modica, R., Iucolano, F., Meneghini, M., Meneghesso, G., Ghibaudo, G.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(4):2017-2024 Apr, 2021
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10مؤتمر
المؤلفون: Jaud, M.-A., Baines, Y., Charles, M., Morvan, E., Scheiblin, P., Torres, A., Plissonnier, M., Barbe, J.-C.
المصدر: 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2017 International Conference on. :113-116 Sep, 2017
Relation: 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)