المؤلفون: Jayakumar, G. Durga^{Aff1, IDs41939024005718_cor1}, Srinivasan, R.

المصدر: Multiscale and Multidisciplinary Modeling, Experiments and Design. :1-9

المؤلفون: Barci, M., Leonelli, D., Zhou, X., Wang, X., Garbin, D., Jayakumar, G., Witters, T., Vergel, N.F., Kundu, S., Palayam, S.V., Jiao, H., Wu, H., Kar, G.S.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(11):6106-6112 Nov, 2022

المؤلفون: Cai, K., Talmelli, G., Fan, K., Van Beek, S., Kateel, V., Gupta, M., Monteiro, M.G., Chroud, M. Ben, Jayakumar, G., Trovato, A., Rao, S., Kar, G.S., Couet, S.

المصدر: 2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :36.2.1-36.2.4 Dec, 2022

Relation: 2022 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Cai, K., Van Beek, S., Rao, S., Fan, K., Gupta, M., Nguyen, V.D., Jayakumar, G., Talmelli, G., Couet, S., Kar, G.S.

المصدر: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2022 IEEE Symposium on. :375-376 Jun, 2022

Relation: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Doevenspeck, J., Garello, K., Rao, S., Yasin, F., Couet, S., Jayakumar, G., Mallik, A., Cosemans, S., Debacker, P., Verkest, D., Lauwereins, R., Dehaene, W., Kar, G.S.

المصدر: 2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021

Relation: 2021 Symposium on VLSI Technology

المؤلفون: Couet, S., Rao, S., Van Beek, S., Nguyen, V.D., Garello, K., Kateel, V., Jayakumar, G., Costa, J.D., Cai, K., Yasin, F., Crotti, D., Kar, G.S.

المصدر: 2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021

Relation: 2021 Symposium on VLSI Technology

المؤلفون: Venna, Rama Krishna Reddy^{Aff1, IDs11227022047409_cor1}, Jayakumar, G. Durga

المصدر: The Journal of Supercomputing: An International Journal of High-Performance Computer Design, Analysis, and Use. 79(2):1908-1925

المؤلفون: Wu, Y. C., Kim, W., Garello, K., Yasin, F., Jayakumar, G., Couet, S., Carpenter, R., Kundu, S., Rao, S., Crotti, D., Van Houdt, J., Groeseneken, G., Kar, G. S.

المصدر: 2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020

Relation: 2020 IEEE Symposium on VLSI Technology

المؤلفون: Doevenspeck, J., Garello, K., Verhoef, B., Degraeve, R., Van Beek, S., Crotti, D., Yasin, F., Couet, S., Jayakumar, G., Papistas, I. A, Debacker, P., Lauwereins, R., Dehaene, W., Kar, G. S., Cosemans, S., Mallik, A., Verkest, D.

المصدر: 2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020

Relation: 2020 IEEE Symposium on VLSI Technology

المؤلفون: Kanagaraj, Balamurali, Anand, N., Alengaram, U Johnson, Raj R, Samuvel, Jayakumar, G.

المصدر: In Journal of Building Engineering 1 June 2023 68