-
1
المؤلفون: Simon A. J. Kimber, Thomas Buslaps, Jérôme Kieffer, Gavin Vaughan, Denis Duran, Keith Martel, Sébastien Petitdemange, Pierrick Got, Emanuel Papillon, Jean Phillipe Vieux, Francois Fihman, Raymond Barret, Stefano Checchia, Denis Mottin, R. Baker, Julien Bonnefoy, Marco Di Michiel, Christian Morawe, Antonios Vamvakeros
المصدر: Journal of Synchrotron Radiation
'Journal of Synchrotron Radiation ', vol: 27, pages: 515-528 (2020)مصطلحات موضوعية: Diffraction, Nuclear and High Energy Physics, High energy, Materials science, total scattering, Computed tomography, 02 engineering and technology, time-resolved diffraction, Diffraction tomography, 03 medical and health sciences, Optics, operando diffraction, medicine, Instrumentation, 030304 developmental biology, 0303 health sciences, Radiation, medicine.diagnostic_test, Scattering, business.industry, Detector, X-ray diffraction computed tomography, Beamlines, 021001 nanoscience & nanotechnology, Beamline, X-ray crystallography, 0210 nano-technology, business
وصف الملف: application/pdf
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c5bd5a67609ac8bce5a370474ad14246
https://pubmed.ncbi.nlm.nih.gov/32153293