المؤلفون: Vasilev, A., Jech, M., Grill, A., Rzepa, G., Schleich, C., Tyaginov, S., Makarov, A., Pobegen, G., Grasser, T., Waltl, M.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(6):3290-3295 Jun, 2022

المؤلفون: Cvitkovich, L., Jech, M., Waldhor, D., El-Sayed, A.-M., Wilhelmer, C., Grasser, T.

المصدر: ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2021 - IEEE 51st European. :235-238 Sep, 2021

Relation: ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC)

المؤلفون: Jech, M., Grasser, T., Waltl, M.

المصدر: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2022 6th IEEE. :265-267 Mar, 2022

Relation: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

المؤلفون: Dewitte, H., Goiffon, V., Le Roch, A., Rizzolo, S., Jay, A., Jech, M., Hemeryck, A., Paillet, P.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 42(11):1650-1653 Nov, 2021

المؤلفون: Tyaginov, S., Makarov, A., Chasin, A., Bury, E., Vandemaele, M., Jech, M., Grill, A., De Keersgieter, A., Linten, D., Kaczer, B.

المصدر: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2020 IEEE International Symposium on the. :1-7 Jul, 2020

Relation: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Ruch, B., Jech, M., Pobegen, G., Grasser, T.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(4):2092-2097 Apr, 2021

المؤلفون: Jech, M., Rott, G., Reisinger, H., Tyaginov, S., Rzepa, G., Grill, A., Jabs, D., Jungemann, C., Waltl, M., Grasser, T.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(8):3315-3322 Aug, 2020

المؤلفون: Tyaginov, S.E., Jech, M., Rzepa, G., Grill, A., El-Sayed, A.-M., Pobegen, G., Makarov, A., Grasser, T.

المصدر: 2018 International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2018 International. :1-5 Oct, 2018

Relation: 2018 International Integrated Reliability Workshop (IIRW)

المؤلفون: Makarov, A., Kaczer, B., Chasin, A., Vandemaele, M., Bury, E., Jech, M., Grill, A., Hellings, G., El-Sayed, A., Grasser, T., Linten, D., Tyaginov, S.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 40(10):1579-1582 Oct, 2019

المؤلفون: Ullmann, B., Jech, M., Puschkarsky, K., Rott, G.A., Waltl, M., Illarionov, Y., Reisinger, H., Grasser, T.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 66(1):232-240 Jan, 2019