المؤلفون: Chien-Hsien Tseng, Shou-Gwo Wuu, Ho-Ching Chien, Dun-Nian Yaung, Tze-Hsuan Hsu, Jeng-Shyan Lin, Hung-Jen Hsu, Chung-Yi Yu, Chin-Hsin Lo, Wang, C.S.

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :997-1000 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: Ho-Ching Chien, Shou-Gwo Wuu, Dun-Nian Yaung, Chien-Hsien Tseng, Jeng-Shyan Lin, Wang, C.S., Chin-Kung Chang, Yu-Kung Hsiao

المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :813-816 2002

Relation: IEEE International Electron Devices Meeting

المؤلفون: Dun-Nian Yaung, Shou-Gwo Wuu, Ho-Ching Chien, Tzu-Hsuan Hsu, Chien-Hsien Tseng, Jeng-Shyan Lin, Jieh-Jang Chen, Chin-Hsin Lo, Chung-Yi Yu, Chia-Shiung Tsai, Wang, C.S.

المصدر: IEEE International Electron Devices Meeting 2003 Electron devices IEDM'03 Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International. :16.5.1-16.5.4 2003

Relation: IEEE International Electron Devices Meeting 2003

المؤلفون: W.P. Mo, S. Takahashi, R.J. Lin, Kuo-Ching Huang, Gene. Hung, C.C. Chuang, Jhy-Jyi Sze, S.Y. Chen, F.J. Shiu, R.L. Lee, Jeng-Shyan Lin, Chung Wang, S. G. Wuu, W.I. Hsu, Chia-Shiung Tsai, Yeur-Luen Tu, D.N. Yaung, H.Y. Cheng, S.J. Tsai, T.H. Hsu, W.H. Wu, Y.P. Chao, S.T. Tsai, Wen-De Wang, Jen-Cheng Liu, Ta-Wei Wang, Chi-Chuan Wang

المصدر: 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers.

مصطلحات موضوعية: CMOS sensor, Pixel, Computer science, business.industry, Page layout, Process (computing), computer.software_genre, Application-specific integrated circuit, Sensor array, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Wafer, Image sensor, business, computer

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c5143c8683d3a586b5263ebe5180e7cd
https://doi.org/10.1109/vlsit.2014.6894429

المؤلفون: Shou-Gwo Wuu, Dun-Nian Yaung, Tse-Heng Chou, T.H. Hsu, Jeng-Shyan Lin, Yean-Kuen Fang, S.F. Chen, Chih-Wei Lin, Ho-Ching Chien, C.S. Wang, Chien-Hsien Tseng, Cheng-I Lin

المصدر: IEEE Electron Device Letters. 26:547-549

مصطلحات موضوعية: Materials science, business.industry, Dielectric, Electronic, Optical and Magnetic Materials, Photodiode, law.invention, chemistry.chemical_compound, chemistry, CMOS, law, Shallow trench isolation, Silicide, Electronic engineering, Optoelectronics, Quantum efficiency, Electrical and Electronic Engineering, Image sensor, business, Sensitivity (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::45c74ad940d82df3391576ace20e5204
https://doi.org/10.1109/led.2005.852536

المؤلفون: T.H. Hsu, Dun-Nian Yaung, Chien-Hsien Tseng, Jeng-Shyan Lin, C.S. Lin, S.F. Chen, Y.K. Fang, Shou-Gwo Wuu, C.Y. Lin, C.S. Wang, Ho-Ching Chien

المصدر: IEEE Electron Device Letters. 26:301-303

مصطلحات موضوعية: Materials science, Pixel, business.industry, Peak shift, Spectral response, Electronic, Optical and Magnetic Materials, Optics, CMOS, Guard ring, Color mixing, Electrical and Electronic Engineering, Image sensor, Air gap (plumbing), business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8c312deafe9639130ac141491b8e34a9
https://doi.org/10.1109/led.2005.846574

المؤلفون: Shou-Gwo Wuu, S.F. Chen, T.H. Hsu, Jeng-Shyan Lin, Y.K. Fang, Dun-Nian Yaung, Chien-Hsien Tseng, Cheng-I Lin, Chih-Wei Lin, Ho-Ching Chien, C.S. Wang

المصدر: IEEE Electron Device Letters. 25:427-429

مصطلحات موضوعية: CMOS sensor, Materials science, Pixel, business.industry, Transistor, equipment and supplies, Signal, Electronic, Optical and Magnetic Materials, Photodiode, law.invention, body regions, Impact ionization, law, Optoelectronics, sense organs, Electrical and Electronic Engineering, Image sensor, business, Degradation (telecommunications)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6b085a07cb0636d675f5cfcadb430376
https://doi.org/10.1109/led.2004.829000

المؤلفون: T.H. Hsu, Y.K. Fang, Shou-Gwo Wuu, Chih-Wei Lin, Cheng-I Lin, Ho-Ching Chien, C.S. Wang, S.F. Chen, Jeng-Shyan Lin, Dun-Nian Yaung, Chien-Hsien Tseng

المصدر: IEEE Electron Device Letters. 25:375-377

مصطلحات موضوعية: Total internal reflection, Materials science, Pixel, business.industry, Dielectric, Ray, Electronic, Optical and Magnetic Materials, Optics, CMOS, Optoelectronics, Electrical and Electronic Engineering, Image sensor, Air gap (plumbing), business, Refractive index

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::127052148fabc7e71b6d8f8e7441f56b
https://doi.org/10.1109/led.2004.828995

المؤلفون: T.H. Hsu, Shou-Gwo Wuu, Ho-Ching Chien, Chien-Hsien Tseng, C.S. Wang, S.F. Chen, Chih-Wei Lin, Y.K. Fang, Cheng-I Lin, Dun-Nian Yaung, Jeng-Shyan Lin

المصدر: IEEE Electron Device Letters. 25:22-24

مصطلحات موضوعية: Physics, Total internal reflection, Pixel, business.industry, Light guide, Dielectric, Ray, Electronic, Optical and Magnetic Materials, Crosstalk, Optics, Optoelectronics, Electrical and Electronic Engineering, Image sensor, business, Refractive index

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::21193f18010e284f1dfdc31fbcd02215
https://doi.org/10.1109/led.2003.821597

المؤلفون: Dun-Nian Yaung, Hung-Jen Hsu, Tze-Hsuan Hsu, Shou-Gwo Wuu, Jeng-Shyan Lin, Chin-Hsin Lo, C.S. Wang, C.H. Yu, Tseng Chien-Hsien, Ho-Ching Chien

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..

مصطلحات موضوعية: Crosstalk, Physics, Pixel, business.industry, Guard ring, Electrical engineering, Optoelectronics, Wafer, Image sensor, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d862400c312ece10a3b23e2bb3e276a4
https://doi.org/10.1109/iedm.2004.1419356