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1مؤتمر
المؤلفون: Chien-Hsien Tseng, Shou-Gwo Wuu, Ho-Ching Chien, Dun-Nian Yaung, Tze-Hsuan Hsu, Jeng-Shyan Lin, Hung-Jen Hsu, Chung-Yi Yu, Chin-Hsin Lo, Wang, C.S.
المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :997-1000 2004
Relation: 2004 International Electron Devices Meeting
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2مؤتمر
المؤلفون: Ho-Ching Chien, Shou-Gwo Wuu, Dun-Nian Yaung, Chien-Hsien Tseng, Jeng-Shyan Lin, Wang, C.S., Chin-Kung Chang, Yu-Kung Hsiao
المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :813-816 2002
Relation: IEEE International Electron Devices Meeting
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3مؤتمر
المؤلفون: Dun-Nian Yaung, Shou-Gwo Wuu, Ho-Ching Chien, Tzu-Hsuan Hsu, Chien-Hsien Tseng, Jeng-Shyan Lin, Jieh-Jang Chen, Chin-Hsin Lo, Chung-Yi Yu, Chia-Shiung Tsai, Wang, C.S.
المصدر: IEEE International Electron Devices Meeting 2003 Electron devices IEDM'03 Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International. :16.5.1-16.5.4 2003
Relation: IEEE International Electron Devices Meeting 2003
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4
المؤلفون: W.P. Mo, S. Takahashi, R.J. Lin, Kuo-Ching Huang, Gene. Hung, C.C. Chuang, Jhy-Jyi Sze, S.Y. Chen, F.J. Shiu, R.L. Lee, Jeng-Shyan Lin, Chung Wang, S. G. Wuu, W.I. Hsu, Chia-Shiung Tsai, Yeur-Luen Tu, D.N. Yaung, H.Y. Cheng, S.J. Tsai, T.H. Hsu, W.H. Wu, Y.P. Chao, S.T. Tsai, Wen-De Wang, Jen-Cheng Liu, Ta-Wei Wang, Chi-Chuan Wang
المصدر: 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers.
مصطلحات موضوعية: CMOS sensor, Pixel, Computer science, business.industry, Page layout, Process (computing), computer.software_genre, Application-specific integrated circuit, Sensor array, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Wafer, Image sensor, business, computer
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c5143c8683d3a586b5263ebe5180e7cd
https://doi.org/10.1109/vlsit.2014.6894429 -
5
المؤلفون: Shou-Gwo Wuu, Dun-Nian Yaung, Tse-Heng Chou, T.H. Hsu, Jeng-Shyan Lin, Yean-Kuen Fang, S.F. Chen, Chih-Wei Lin, Ho-Ching Chien, C.S. Wang, Chien-Hsien Tseng, Cheng-I Lin
المصدر: IEEE Electron Device Letters. 26:547-549
مصطلحات موضوعية: Materials science, business.industry, Dielectric, Electronic, Optical and Magnetic Materials, Photodiode, law.invention, chemistry.chemical_compound, chemistry, CMOS, law, Shallow trench isolation, Silicide, Electronic engineering, Optoelectronics, Quantum efficiency, Electrical and Electronic Engineering, Image sensor, business, Sensitivity (electronics)
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6
المؤلفون: T.H. Hsu, Dun-Nian Yaung, Chien-Hsien Tseng, Jeng-Shyan Lin, C.S. Lin, S.F. Chen, Y.K. Fang, Shou-Gwo Wuu, C.Y. Lin, C.S. Wang, Ho-Ching Chien
المصدر: IEEE Electron Device Letters. 26:301-303
مصطلحات موضوعية: Materials science, Pixel, business.industry, Peak shift, Spectral response, Electronic, Optical and Magnetic Materials, Optics, CMOS, Guard ring, Color mixing, Electrical and Electronic Engineering, Image sensor, Air gap (plumbing), business
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7
المؤلفون: Shou-Gwo Wuu, S.F. Chen, T.H. Hsu, Jeng-Shyan Lin, Y.K. Fang, Dun-Nian Yaung, Chien-Hsien Tseng, Cheng-I Lin, Chih-Wei Lin, Ho-Ching Chien, C.S. Wang
المصدر: IEEE Electron Device Letters. 25:427-429
مصطلحات موضوعية: CMOS sensor, Materials science, Pixel, business.industry, Transistor, equipment and supplies, Signal, Electronic, Optical and Magnetic Materials, Photodiode, law.invention, body regions, Impact ionization, law, Optoelectronics, sense organs, Electrical and Electronic Engineering, Image sensor, business, Degradation (telecommunications)
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8
المؤلفون: T.H. Hsu, Y.K. Fang, Shou-Gwo Wuu, Chih-Wei Lin, Cheng-I Lin, Ho-Ching Chien, C.S. Wang, S.F. Chen, Jeng-Shyan Lin, Dun-Nian Yaung, Chien-Hsien Tseng
المصدر: IEEE Electron Device Letters. 25:375-377
مصطلحات موضوعية: Total internal reflection, Materials science, Pixel, business.industry, Dielectric, Ray, Electronic, Optical and Magnetic Materials, Optics, CMOS, Optoelectronics, Electrical and Electronic Engineering, Image sensor, Air gap (plumbing), business, Refractive index
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9
المؤلفون: T.H. Hsu, Shou-Gwo Wuu, Ho-Ching Chien, Chien-Hsien Tseng, C.S. Wang, S.F. Chen, Chih-Wei Lin, Y.K. Fang, Cheng-I Lin, Dun-Nian Yaung, Jeng-Shyan Lin
المصدر: IEEE Electron Device Letters. 25:22-24
مصطلحات موضوعية: Physics, Total internal reflection, Pixel, business.industry, Light guide, Dielectric, Ray, Electronic, Optical and Magnetic Materials, Crosstalk, Optics, Optoelectronics, Electrical and Electronic Engineering, Image sensor, business, Refractive index
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10
المؤلفون: Dun-Nian Yaung, Hung-Jen Hsu, Tze-Hsuan Hsu, Shou-Gwo Wuu, Jeng-Shyan Lin, Chin-Hsin Lo, C.S. Wang, C.H. Yu, Tseng Chien-Hsien, Ho-Ching Chien
المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
مصطلحات موضوعية: Crosstalk, Physics, Pixel, business.industry, Guard ring, Electrical engineering, Optoelectronics, Wafer, Image sensor, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d862400c312ece10a3b23e2bb3e276a4
https://doi.org/10.1109/iedm.2004.1419356