يعرض 1 - 10 نتائج من 71 نتيجة بحث عن '"Jeng-Ya Yeh"', وقت الاستعلام: 0.85s تنقيح النتائج
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    مؤتمر

    المؤلفون: Jeng-Ya Yeh, Tansu, N., Mawst, L.J.

    المصدر: International Conference onIndium Phosphide and Related Materials, 2003. Indium phosphide and related materials Indium Phosphide and Related Materials, 2003. International Conference on. :269-272 2003

    Relation: International Conference on Indium Phosphide and Related Materials

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    مؤتمر

    المصدر: (CLEO). Conference on Lasers and Electro-Optics, 2005. Lasers and Electro-Optics Lasers and Electro-Optics, 2005. (CLEO). Conference on. 3:2134-2136 Vol. 3 2005

    Relation: 2005 Conference on Lasers and Electro-Optics (CLEO)

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    دورية أكاديمية

    المصدر: IEEE Journal of Selected Topics in Quantum Electronics IEEE J. Select. Topics Quantum Electron. Selected Topics in Quantum Electronics, IEEE Journal of. 11(5):1063-1068 Jan, 2005

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    دورية أكاديمية

    المصدر: IEEE Journal of Selected Topics in Quantum Electronics IEEE J. Select. Topics Quantum Electron. Selected Topics in Quantum Electronics, IEEE Journal of. 11(5):1079-1088 Jan, 2005

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    دورية أكاديمية

    المؤلفون: Tansu, N., Jeng-Ya Yeh, Mawst, L.J.

    المصدر: IEEE Journal of Selected Topics in Quantum Electronics IEEE J. Select. Topics Quantum Electron. Selected Topics in Quantum Electronics, IEEE Journal of. 9(5):1220-1227 Jan, 2003

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    مؤتمر

    المصدر: LEOS 2006 - 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society Lasers and Electro-Optics Society, 2006. LEOS 2006. 19th Annual Meeting of the IEEE. :58-59 Oct, 2006

    Relation: LEOS 2006 - 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society

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    دورية أكاديمية

    المؤلفون: Jeng-Ya Yeh, Mawst, L.J., Tansu, N.

    المصدر: IEEE Photonics Technology Letters IEEE Photon. Technol. Lett. Photonics Technology Letters, IEEE. 17(9):1779-1781 Sep, 2005

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    دورية أكاديمية

    المؤلفون: Jeng-Ya Yeh, Tansu, N., Mawst, L.J.

    المصدر: IEEE Photonics Technology Letters IEEE Photon. Technol. Lett. Photonics Technology Letters, IEEE. 16(3):741-743 Mar, 2004