المؤلفون: Jenkins, K.A.

المصدر: IEEE Solid-State Circuits Letters IEEE Solid-State Circuits Lett. Solid-State Circuits Letters, IEEE. 6:177-180 2023

المؤلفون: Jenkins, K.A., Weger, A.J.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 43(5):686-688 May, 2022

المؤلفون: Jenkins, K.A., Balakrishnan, K., Lee, D., Narayanan, V.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 40(1):13-16 Jan, 2019

المؤلفون: Jenkins, K.A., Cartier, E.A., Yau, J.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 40(2):171-173 Feb, 2019

المؤلفون: Stellari, F., Jenkins, K.A., Weger, A.J., Linder, B.P., Song, P.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 63(5):2016-2022 May, 2016

المؤلفون: Kuang, J.B., Jenkins, K.A., Stawiasz, K., Schaub, J.

المصدر: 2013 Proceedings of the ESSCIRC (ESSCIRC) ESSCIRC (ESSCIRC), 2013 Proceedings of the. :419-422 Sep, 2013

Relation: ESSCIRC 2013 - 39th European Solid State Circuits Conference

المؤلفون: Jose, A.P., Jenkins, K.A., Reynolds, S.K.

المصدر: 23rd IEEE VLSI Test Symposium (VTS'05) VLSI test symposium VLSI Test Symposium, 2005. Proceedings. 23rd IEEE. :131-136 2005

Relation: Proceedings. 23rd IEEE VLSI Test Symposium

المؤلفون: Liobe, J., Jenkins, K.A.

المصدر: 2005 IEEE Radio Frequency integrated Circuits (RFIC) Symposium - Digest of Papers Radio frequency integrated circuits Radio Frequency integrated Circuits (RFIC) Symposium, 2005. Digest of Papers. 2005 IEEE. :657-661 2005

Relation: 2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium

المؤلفون: Jenkins, K.A., Jose, A.P., Heidel, D.F.

المصدر: Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005. Solid-State Circuits Conference Solid-State Circuits Conference, 2005. ESSCIRC 2005. Proceedings of the 31st European. :157-160 2005

Relation: Proceedings of ESSCIRC 2005. 31st European Solid-State Circuits Conference

المؤلفون: Singh, D.V., Sleight, J.W., Hergenrother, J.M., Ren, Z., Jenkins, K.A., Dokumaci, O., Black, L., Chang, J.B., Nakayama, H., Chidambarrao, D., Venigalla, R., Pan, J., Natzle, W., Tessier, B.L., Nomura, A., Ott, J.A., Ieong, M., Haensch, W.

المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :505-508 2005

Relation: International Electron Devices Meeting 2005