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1دورية أكاديمية
المؤلفون: Ingo Ortlepp, Eberhard Manske, Jens-Peter Zöllner, Ivo W. Rangelow
المصدر: Micromachines, Vol 12, Iss 4, p 357 (2021)
مصطلحات موضوعية: standing wave, interferometer, photo sensor, phase modulation, Mechanical engineering and machinery, TJ1-1570
وصف الملف: electronic resource
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2دورية أكاديمية
المؤلفون: Ingo Ortlepp, Eberhard Manske, Jens-Peter Zöllner, Ivo W. Rangelow
المصدر: Proceedings, Vol 56, Iss 1, p 12 (2020)
مصطلحات موضوعية: standing wave, interferometer, photo sensor, phase modulation, General Works
وصف الملف: electronic resource
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3دورية أكاديمية
المؤلفون: Jaqueline Stauffenberg, Ingo Ortlepp, Christoph Reuter, Mathias Holz, Denis Dontsov, Christoph Schäffel, Steffen Strehle, Jens-Peter Zöllner, Ivo W. Rangelow, Eberhard Manske
المصدر: Proceedings, Vol 56, Iss 1, p 34 (2020)
مصطلحات موضوعية: nanopositioning, nanometrology, AFM, self-sensing microcantilevers, General Works
وصف الملف: electronic resource
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4دورية أكاديمية
المؤلفون: Jens-Peter Zöllner, Steve Durstewitz, Jaqueline Stauffenberg, Tzvetan Ivanov, Mathias Holz, Waleed Ehrhardt, W.-Ulrich Riegel, Ivo W. Rangelow
المصدر: Proceedings, Vol 2, Iss 13, p 846 (2018)
مصطلحات موضوعية: gas-flow sensor, cantilever, piezo-resistive sensing, PLL, resonance mode, General Works
وصف الملف: electronic resource
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5
المؤلفون: Oliver Dannberg, Andreas Meister, Stephan Gorges, Tino Hausotte, Xinrui Cao, Taras Sasiuk, Ivo W. Rangelow, Johannes Kirchner, Johann Reger, Laura Mohr-Weidenfeller, Christoph Reuter, Stefan Sinzinger, Lena Zentner, Steffen Strehle, Roland Füßl, Eberhard Manske, Jaqueline Stauffenberg, Martin Hofmann, David Fischer, Ralf Schienbein, René Theska, Carsten Reinhardt, Shraddha Supreeti, Florian Fern, Thomas Fröhlich, Christoph Weise, Christoph Dr. Schäffel, Jens-Peter Zöllner, Ingo Ortlepp
المصدر: Nanomanufacturing and Metrology. 4:132-148
مصطلحات موضوعية: Process (engineering), business.industry, Computer science, Mechanical Engineering, Materials Science (miscellaneous), Scale (chemistry), Industrial and Manufacturing Engineering, Field (computer science), law.invention, Technical progress, law, Paradigm shift, Systems engineering, Photolithography, Photonics, business, Lithography
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6
المؤلفون: Eberhard Manske, Ivo W. Rangelow, Jens-Peter Zöllner, Ingo Ortlepp
المصدر: Nanomanufacturing and Metrology. 4:190-199
مصطلحات موضوعية: Physics, Heterodyne, business.industry, Mechanical Engineering, Materials Science (miscellaneous), Phase (waves), 02 engineering and technology, 021001 nanoscience & nanotechnology, Laser, 01 natural sciences, Industrial and Manufacturing Engineering, law.invention, 010309 optics, Standing wave, Optical axis, Length measurement, Interferometry, Wavelength, Optics, law, 0103 physical sciences, 0210 nano-technology, business
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7
المؤلفون: Ingo Ortlepp, Jaqueline Stauffenberg, Anja Krötschl, Denis Dontsov, Jens-Peter Zöllner, Steffen Hesse, Christoph Reuter, Steffen Strehle, Thomas Fröhlich, Ivo W. Rangelow, Eberhard Manske
المصدر: Novel Patterning Technologies 2022.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9d8f4cae4f75a7817dbb0a89f0687e19
https://doi.org/10.1117/12.2615118 -
8
المؤلفون: Ivo W. Rangelow, Christoph Schäffel, Denis Dontsov, Jens-Peter Zöllner, Christoph Reuter, Ingo Ortlepp, Jaqueline Stauffenberg, Steffen Strehle, Mathias Holz, Eberhard Manske
المصدر: Novel Patterning Technologies 2021.
مصطلحات موضوعية: Range (particle radiation), Fabrication, Nanolithography, Nanostructure, Materials science, business.industry, Atomic force microscopy, Nano fabrication, Optoelectronics, Nanometre, business, Working range
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d4e71f6e86352e5372513ba1092bc56b
https://doi.org/10.1117/12.2583703 -
9
المؤلفون: Ivo W. Rangelow, Denis Dontsov, Christoph Reuter, Steffen Strehle, Christoph Dr. Schäffel, Eberhard Manske, Mathias Holz, Jaqueline Stauffenberg, Ingo Ortlepp, Jens-Peter Zöllner
المصدر: Proceedings, Vol 56, Iss 34, p 34 (2020)
مصطلحات موضوعية: Reproducibility, Range (particle radiation), Materials science, business.industry, Atomic force microscopy, self-sensing microcantilevers, lcsh:A, nanometrology, Nanometrology, Nanolithography, Nano fabrication, Optoelectronics, AFM, lcsh:General Works, Focus (optics), business, Scanning probe lithography, nanopositioning
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6ffe62a816285bd4ffb3860198540a1a
https://doi.org/10.3390/proceedings2020056034 -
10
المؤلفون: Ivo W. Rangelow, Jens-Peter Zöllner, Ingo Ortlepp, Eberhard Manske
المصدر: Proceedings, Vol 56, Iss 12, p 12 (2020)
Micromachines
Volume 12
Issue 4
Micromachines, Vol 12, Iss 357, p 357 (2021)مصطلحات موضوعية: lcsh:Mechanical engineering and machinery, Acoustics, interferometer, photo sensor, lcsh:A, 01 natural sciences, Article, 010309 optics, Standing wave, Length measurement, 0103 physical sciences, Astronomical interferometer, Demodulation, lcsh:TJ1-1570, Electrical and Electronic Engineering, phase modulation, Physics, Mechanical Engineering, 010401 analytical chemistry, Photoelectric sensor, 0104 chemical sciences, Interferometry, Control and Systems Engineering, Harmonics, standing wave, lcsh:General Works, Phase modulation
وصف الملف: application/pdf
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3a061de1d4cec4c4121a3fd08f2dcac0
https://www.mdpi.com/2504-3900/56/1/12