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1دورية أكاديمية
المصدر: IEEE Transactions on Consumer Electronics IEEE Trans. Consumer Electron. Consumer Electronics, IEEE Transactions on. 70(1):3131-3140 Feb, 2024
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2دورية أكاديمية
المصدر: IEEE Access Access, IEEE. 12:65166-65177 2024
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3دورية أكاديمية
المصدر: IEEE Access Access, IEEE. 12:22394-22402 2024
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4دورية أكاديمية
المصدر: IEEE Access Access, IEEE. 12:14260-14274 2024
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5دورية أكاديمية
المصدر: IEEE Transactions on Information Forensics and Security IEEE Trans.Inform.Forensic Secur. Information Forensics and Security, IEEE Transactions on. 19:2487-2500 2024
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6دورية أكاديمية
المصدر: IEEE Transactions on Industrial Electronics IEEE Trans. Ind. Electron. Industrial Electronics, IEEE Transactions on. 71(1):338-347 Jan, 2024
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7دورية أكاديمية
المصدر: IEEE Transactions on Circuits and Systems II: Express Briefs IEEE Trans. Circuits Syst. II Circuits and Systems II: Express Briefs, IEEE Transactions on. 70(10):3907-3911 Oct, 2023
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8مؤتمر
المؤلفون: Ahn, A. Jae-Beom, Seung-Jae Jeong, B., Ryoo, C. Hong-Je
المصدر: 2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia) Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia), 2023 11th International Conference on. :3275-3280 May, 2023
Relation: 2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia)
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9دورية أكاديمية
المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 23(8):8613-8629 Apr, 2023
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10مؤتمر
المؤلفون: Vidya, V., Zamdmer, N., Mechler, T., Onishi, K., Chidambarrao, D., Jeong, B. W., Ko, Y. G., Lee, C. H., Sim, J., Angyal, M., Crabbe, E.
المصدر: 2023 35th International Conference on Microelectronic Test Structure (ICMTS) Microelectronic Test Structure (ICMTS), 2023 35th International Conference on. :1-3 Mar, 2023
Relation: 2023 35th International Conference on Microelectronic Test Structure (ICMTS)