المؤلفون: Jeong, Tae-Young, Lee, Miji, Jo, Yunkyung, Kim, Jinwoo, Kim, Min, Yeo, Myungsoo, Kim, Jinseok, Choi, Hyunjun, Kim, Joosung, Jo, Yoojin, Ji, Yongsung, Uemura, Taiki, Jiang, Hai, Kwon, Dongkyun, Rhee, HwaSung, Pae, Sangwoo, Lee, Brandon

المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-4 Apr, 2020

Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Uemura, Taiki, Chung, Byungjin, Jo, Jeongmin, Jiang, Hai, Ji, Yongsung, Jeong, Tae-Young, Ranjan, Rakesh, Lee, Seungbae, Rhee, Hwasung, Pae, Sangwoo, Lee, Euncheol, Choi, Jaehee, Ohnishi, Shota, Machida, Ken

المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-4 Apr, 2020

Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Uemura, Taiki, Chung, Byungjin, Jo, Jeongmin, Jiang, Hai, Ji, Yongsung, Jeong, Tae-Young, Ranjan, Rakesh, Park, Youngin, Hong, Kiil, Lee, Seungbae, Rhee, Hwasung, Pae, Sangwoo, Lee, Euncheol, Choi, Jaehee, Ohnishi, Shota, Machida, Ken

المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-5 Apr, 2020

Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Jang, Minsu, Shin, Jonghoon, Kim, You Hwan, Jeong, Tae-Young, Jo, Soojin, Kim, Sung-Jo, Devaraj, Vasanthan, Kang, Joonhee, Choi, Eun-Jung, Lee, Ji Eun, Oh, Jin-Woo

المصدر: In Biosensors and Bioelectronics 15 January 2024 244

المؤلفون: Jeong, Tae-Young, Bae, Soungmin, Lee, Seong-Yeon, Jung, Suyong, Kim, Yong-Hoon, Yee, Ki-Ju

المصدر: Nanoscale 12 (44), 22487-22494 (2020)

مصطلحات موضوعية: Condensed Matter - Mesoscale and Nanoscale Physics

URL الوصول: http://arxiv.org/abs/2010.11758

المؤلفون: Chang, Jaewon, Choi, Hyunjun, Kim, Jinseok, Park, Sangkwon, Jo, Yoonkyeong, Jeong, Tae-Young, Soo Yeo, Myung, Kang, Hanbyul, Park, Junekyun, Shin, Sangchul, Pae, Sangwoo

المصدر: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2018 IEEE International Symposium on the. :1-4 Jul, 2018

Relation: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Jeong, Tae Young, Kim, Hakseong, Choi, Sang-Jun, Watanabe, Kenji, Taniguchi, Takashi, Yee, Ki Ju, Kim, Yong-Sung, Jung, Suyong

المصدر: Nat. Commun. 10, 3825 (2019)

مصطلحات موضوعية: Condensed Matter - Materials Science, Condensed Matter - Mesoscale and Nanoscale Physics

URL الوصول: http://arxiv.org/abs/1910.14206

المؤلفون: Lee, Kang Mi, Han, Sang Moon, Lee, Hyeon-Jeong, Kang, Minsik, Jeong, Tae Young, Son, Junghyun, Min, Hophil, Cha, Sangwon, Oh, Han Bin, Oh, Won Keun, Lee, Jaeick

المصدر: In Environmental Research 15 March 2023 221

المؤلفون: Jeong, Tae-Young, Kim, Jinseok, Yeo, Myungsoo, Park, Jonghyuk, Lee, Miji, Windu, Sari, Choi, Hyunjun, Choi, Yuri, Jo, Yunkyung, Lee, Mi-ji, Pae, Sangwoo

المصدر: 2017 IEEE International Interconnect Technology Conference (IITC) Interconnect Technology Conference (IITC), 2017 IEEE International. :1-3 May, 2017

Relation: 2017 IEEE International Interconnect Technology Conference (IITC)

المؤلفون: Jeong, Tae-Young, Kim, Jinseok, Jo, Yunhee, Tak, Kyuho, Lee, Miji, Windu, Sari, Choi, Hyunjun, Choi, Yuri, Jo, Yunkyung, Pae, Sangwoo, Park, Jongwoo

المصدر: 2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM) Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM), 2015 IEEE International. :299-302 May, 2015

Relation: 2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM)