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المؤلفون: Biswanath Senapati, Jeongho Do, Albert Young, Daniel J. Dechene, Seunghyun Song, Yonghee Park, JeongSoon Kong, Nick A. Lanzillo, Chen Zhang, Susan S. Fan, Sanghoon Baek, Sagarika Mukesh, Hemanth Jagannathan, Brent Anderson, Teresa Wu, Dechao Guo, Kang-ill Seo, Huiming Bu
المصدر: DTCO and Computational Patterning II.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b627c7f6e9feb85bf6fe9ee479a5698e
https://doi.org/10.1117/12.2658187 -
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المؤلفون: Changnam Park, Jae-Seung Choi, Woojin Rim, Yongho Kim, Sunghyun Park, Hyun-Taek Jung, Bongjae Kwon, Jong-Hoon Jung, Jeongho Do, Sungwee Cho, Hyun-su Choi, Jong Shik Yoon, Taejoong Song, Hoonki Kim
المصدر: ISSCC
مصطلحات موضوعية: 010302 applied physics, Standard cell, Materials science, business.industry, Extreme ultraviolet lithography, 020208 electrical & electronic engineering, 02 engineering and technology, 01 natural sciences, Process variation, Parasitic capacitance, Extreme ultraviolet, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Static random-access memory, business, Lithography, Low voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0b353f20952db8bf5c5ec23baf6eb0c6
https://doi.org/10.1109/isscc.2018.8310252 -
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المؤلفون: Woojin Rim, Sunghyun Park, Jong-Hoon Jung, Sungwee Cho, Lee Seung-Young, Dae-Won Ha, Hyung-Soon Jang, Bongjae Kwon, Chul-Hong Park, Jeongho Do, Hoonki Kim, Giyong Yang, Jae-Seung Choi, Taejung Lee, Minsun Hong, Yongjae Choo, Yongho Kim, Lim Jin-Young, Sanghoon Baek, Changnam Park, Hyun-Taek Jung, Kim In-Gyum, Taejoong Song
المصدر: ISSCC
مصطلحات موضوعية: Engineering, Offset (computer science), business.industry, Extreme ultraviolet lithography, Multiple patterning, Electronic engineering, Redundancy (engineering), Static random-access memory, Photomask, Macro, business, Maintenance engineering, Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1ea8f7cb504c90b3f97119c24dc7956e
https://doi.org/10.1109/isscc.2017.7870334