المؤلفون: Jiang, Hai, Jeong, Taeyoung, Sagong, Hyunchul, Choi, Kihyun, Jin, Minjung, Yeo, Myungsoo, Rhee, Hwasung, Lee, Euncheol

المصدر: 2020 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2020 IEEE International. :1-5 Oct, 2020

Relation: 2020 IEEE International Integrated Reliability Workshop (IIRW)

المؤلفون: Kim, Jin Ju, Jin, Minjung, Sagong, Hyunchul, Pae, Sangwoo

المصدر: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2018 IEEE International Symposium on the. :1-6 Jul, 2018

Relation: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Choi, Kihyun, Sagong, Hyun Chul, Jin, Minjung, Hai, Jiang, Lee, Miji, Jeong, Taeyoung, Yeo, Myung Soo, Shim, Hyewon, Ahn, Da, Kim, Wooyeon, Kim, Yongjeung, Park, JuneKyun, Rhee, Hwasung, Lee, Euncheol

المصدر: 2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :9.3.1-9.3.4 Dec, 2020

Relation: 2020 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Jung, Chanmin, Kang, Jonggu, Jin, Minjung

المصدر: 2015 15th International Conference on Control, Automation and Systems (ICCAS) Control, Automation and Systems (ICCAS), 2015 15th International Conference on. :2053-2057 Oct, 2015

Relation: 2015 15th International Conference on Control, Automation and Systems (ICCAS)

المؤلفون: Jung, Chanmin, Kang, Jonggu, Jin, Minjung

المصدر: 2014 14th International Conference on Control, Automation and Systems (ICCAS 2014) Control, Automation and Systems (ICCAS), 2014 14th International Conference on. :963-966 Oct, 2014

Relation: 2014 14th International Conference on Control, Automation and Systems (ICCAS)

المؤلفون: Kang, Jonggu, Jin, Minjung, Park, Jeehoon, Park, Dongho

المصدر: ICCAS 2010 Control Automation and Systems (ICCAS), 2010 International Conference on. :1741-1744 Oct, 2010

Relation: 2010 International Conference on Control, Automation and Systems (ICCAS)

المؤلفون: Kim, Hyunjin, Jin, Minjung, Sagong, Hyunchul, Kim, Jinju, Jung, Ukjin, Choi, Minhyuck, Park, Junekyun, Shin, Sangchul, Pae, Sangwoo

المصدر: 2018 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2018 IEEE International. :4A.4-1-4A.4-4 Mar, 2018

Relation: 2018 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Kim, Yoohwan, Shim, Hyewon, Jin, Minjung, Bae, Jongsun, Liu, Changze, Pae, Sangwoo

المصدر: 2017 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS),2017 IEEE International. :4C-2.1-4C-2.4 Apr, 2017

Relation: 2017 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Liu, Changze, Jin, Minjung, Uemura, Taiki, Kim, Jinju, Kim, Jungin, Jung, Ukjin, Sagong, Hyun Chul, Kim, Gunrae, Park, Junekyun, Shin, Sangchul, Pae, Sangwoo

المصدر: 2017 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS),2017 IEEE International. :XT-2.1-XT-2.4 Apr, 2017

Relation: 2017 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Jin, Minjung, Liu, Changze, Kim, Jinju, Kim, Jungin, Shim, Hyewon, Kim, Kangjung, Kim, Gunrae, Lee, Soonyoung, Uemura, Taiki, Chang, Man, An, Taehyun, Park, Junekyun, Pae, Sangwoo

المصدر: 2016 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2016 IEEE International. :15.1.1-15.1.4 Dec, 2016

Relation: 2016 IEEE International Electron Devices Meeting (IEDM)