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1دورية أكاديمية
المؤلفون: Lars A. Lingnau, Johannes Heermant, Johannes L. Otto, Kai Donnerbauer, Lukas M. Sauer, Lukas Lücker, Marina Macias Barrientos, Frank Walther
المصدر: Materials, Vol 17, Iss 12, p 3023 (2024)
مصطلحات موضوعية: damage mechanism, fatigue, focused ion beam scanning electron microscopy, pores, resistance measurements, axial–torsional fatigue, Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Engineering (General). Civil engineering (General), TA1-2040, Microscopy, QH201-278.5, Descriptive and experimental mechanics, QC120-168.85
وصف الملف: electronic resource